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Title: Secondary ion mass spectrometry: The application in the analysis of atmospheric particulate matter

Abstract

Currently, considerable attention has been paid to atmospheric particulate matter (PM) investigation due to its importance in human health and global climate change. Surface characterization of PM is important since the chemical heterogeneity between the surface and bulk may vary its impact on the environment and human being. Secondary ion mass spectrometry (SIMS) is a surface technique with high surface sensitivity, capable of high spatial chemical imaging and depth profiling. Recent research shows that SIMS holds great potential in analyzing both surface and bulk chemical information of PM. In this review, we presented the working principal of SIMS in PM characterization, summarized recent applications in PM analysis from different sources, discussed its advantages and limitations, and proposed the future development of this technique with a perspective in environmental sciences.

Authors:
; ; ; ; ;
Publication Date:
Research Org.:
Pacific Northwest National Lab. (PNNL), Richland, WA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1393739
Report Number(s):
PNNL-SA-119653
Journal ID: ISSN 0003-2670
DOE Contract Number:
AC05-76RL01830
Resource Type:
Journal Article
Resource Relation:
Journal Name: Analytica Chimica Acta; Journal Volume: 989; Journal Issue: C
Country of Publication:
United States
Language:
English
Subject:
SIMS; aerosol; Particulate matter; an

Citation Formats

Huang, Di, Hua, Xin, Xiu, Guang-Li, Zheng, Yong-Jie, Yu, Xiao-Ying, and Long, Yi-Tao. Secondary ion mass spectrometry: The application in the analysis of atmospheric particulate matter. United States: N. p., 2017. Web. doi:10.1016/j.aca.2017.07.042.
Huang, Di, Hua, Xin, Xiu, Guang-Li, Zheng, Yong-Jie, Yu, Xiao-Ying, & Long, Yi-Tao. Secondary ion mass spectrometry: The application in the analysis of atmospheric particulate matter. United States. doi:10.1016/j.aca.2017.07.042.
Huang, Di, Hua, Xin, Xiu, Guang-Li, Zheng, Yong-Jie, Yu, Xiao-Ying, and Long, Yi-Tao. Sun . "Secondary ion mass spectrometry: The application in the analysis of atmospheric particulate matter". United States. doi:10.1016/j.aca.2017.07.042.
@article{osti_1393739,
title = {Secondary ion mass spectrometry: The application in the analysis of atmospheric particulate matter},
author = {Huang, Di and Hua, Xin and Xiu, Guang-Li and Zheng, Yong-Jie and Yu, Xiao-Ying and Long, Yi-Tao},
abstractNote = {Currently, considerable attention has been paid to atmospheric particulate matter (PM) investigation due to its importance in human health and global climate change. Surface characterization of PM is important since the chemical heterogeneity between the surface and bulk may vary its impact on the environment and human being. Secondary ion mass spectrometry (SIMS) is a surface technique with high surface sensitivity, capable of high spatial chemical imaging and depth profiling. Recent research shows that SIMS holds great potential in analyzing both surface and bulk chemical information of PM. In this review, we presented the working principal of SIMS in PM characterization, summarized recent applications in PM analysis from different sources, discussed its advantages and limitations, and proposed the future development of this technique with a perspective in environmental sciences.},
doi = {10.1016/j.aca.2017.07.042},
journal = {Analytica Chimica Acta},
number = C,
volume = 989,
place = {United States},
year = {Sun Oct 01 00:00:00 EDT 2017},
month = {Sun Oct 01 00:00:00 EDT 2017}
}