The contribution of 180° domain wall motion to dielectric properties quantified from in situ X-ray diffraction

Journal Article · Wed Mar 01 00:00:00 EST 2017 · Acta Materialia

DOI:https://doi.org/10.1016/j.actamat.2016.12.037· OSTI ID:1392177

Fancher, C. M.; Brewer, S.; Chung, C. C.; Röhrig, S.; Rojac, T.; Esteves, G.; Deluca, M.; Bassiri-Gharb, N.; Jones, J. L.

Here, the contribution of 180° domain wall motion to polarization and dielectric properties of ferroelectric materials has yet to be determined experimentally. In this paper, an approach for estimating the extent of (180°) domain reversal during application of electric fields is presented. We demonstrate this method by determining the contribution of domain reversal to polarization in soft lead zirconate titanate during application of strong electric fields. At the maximum applied field, domain reversal was determined to account for >80% of the measured macroscopic polarization. We also apply the method to quantify the contribution of domain reversal to the weak-field dielectric permittivity of BaTiO₃. The results of this analysis determined that domain reversal accounts for up to ~70% of the macroscopic dielectric permittivity in BaTiO₃. These results demonstrate the predominance of domain reversal to high and low-field dielectric response in ferroelectric polycrystalline materials.

• Research Organization: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
• Sponsoring Organization: USDOE Office of Science (SC)
• Grant/Contract Number: AC02-06CH11357; AC05-00OR22725
• OSTI ID: 1392177
• Alternate ID(s): OSTI ID: 1342700
• Journal Information: Acta Materialia, Journal Name: Acta Materialia Vol. 126 Journal Issue: C; ISSN 1359-6454
• Publisher: Elsevier
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
In situ X-ray diffraction
180° domain reversal
domain wall motion
non-linear piezoelectric
non-linear dielectric