skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Nanoscale Three-Dimensional Microstructural Characterization of an Sn-Rich Solder Alloy Using High-Resolution Transmission X-Ray Microscopy (TXM)

Abstract

Abstract Three-dimensional (3D) nondestructive microstructural characterization was performed using full-field transmission X-ray microscopy on an Sn-rich alloy, at a spatial resolution of 60 nm. This study highlights the use of synchrotron radiation along with Fresnel zone plate optics to perform absorption contrast tomography for analyzing nanoscale features of fine second phase particles distributed in the tin matrix, which are representative of the bulk microstructure. The 3D reconstruction was also used to quantify microstructural details of the analyzed volume.

Authors:
; ; ; ;
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22); U.S. Army Research Laboratory - U.S. Army Research Office (ARO); USDOE Office of Science - Office of Basic Energy Sciences - Scientific User Facilities Division
OSTI Identifier:
1392092
DOE Contract Number:  
AC02-06CH11357
Resource Type:
Journal Article
Journal Name:
Microscopy and Microanalysis
Additional Journal Information:
Journal Volume: 22; Journal Issue: 04; Journal ID: ISSN 1431-9276
Publisher:
Microscopy Society of America (MSA)
Country of Publication:
United States
Language:
English
Subject:
Lead-free solder; Synchrotron radiation; Three-dimensional tomography; 3D reconstruction; Transmission X-ray Microscopy

Citation Formats

Kaira, Chandrashekara S., Mayer, Carl R., De Andrade, V., De Carlo, Francesco, and Chawla, Nikhilesh. Nanoscale Three-Dimensional Microstructural Characterization of an Sn-Rich Solder Alloy Using High-Resolution Transmission X-Ray Microscopy (TXM). United States: N. p., 2016. Web. doi:10.1017/S1431927616011429.
Kaira, Chandrashekara S., Mayer, Carl R., De Andrade, V., De Carlo, Francesco, & Chawla, Nikhilesh. Nanoscale Three-Dimensional Microstructural Characterization of an Sn-Rich Solder Alloy Using High-Resolution Transmission X-Ray Microscopy (TXM). United States. doi:10.1017/S1431927616011429.
Kaira, Chandrashekara S., Mayer, Carl R., De Andrade, V., De Carlo, Francesco, and Chawla, Nikhilesh. Mon . "Nanoscale Three-Dimensional Microstructural Characterization of an Sn-Rich Solder Alloy Using High-Resolution Transmission X-Ray Microscopy (TXM)". United States. doi:10.1017/S1431927616011429.
@article{osti_1392092,
title = {Nanoscale Three-Dimensional Microstructural Characterization of an Sn-Rich Solder Alloy Using High-Resolution Transmission X-Ray Microscopy (TXM)},
author = {Kaira, Chandrashekara S. and Mayer, Carl R. and De Andrade, V. and De Carlo, Francesco and Chawla, Nikhilesh},
abstractNote = {Abstract Three-dimensional (3D) nondestructive microstructural characterization was performed using full-field transmission X-ray microscopy on an Sn-rich alloy, at a spatial resolution of 60 nm. This study highlights the use of synchrotron radiation along with Fresnel zone plate optics to perform absorption contrast tomography for analyzing nanoscale features of fine second phase particles distributed in the tin matrix, which are representative of the bulk microstructure. The 3D reconstruction was also used to quantify microstructural details of the analyzed volume.},
doi = {10.1017/S1431927616011429},
journal = {Microscopy and Microanalysis},
issn = {1431-9276},
number = 04,
volume = 22,
place = {United States},
year = {2016},
month = {7}
}

Works referenced in this record:

Crystallographic texture evolution in 1008 steel sheet during multi-axial tensile strain paths
journal, January 2014

  • Creuziger, Adam; Hu, Lin; Gnäupel-Herold, Thomas
  • Integrating Materials and Manufacturing Innovation, Vol. 3, Issue 1
  • DOI: 10.1186/2193-9772-3-1

TomoPy: a framework for the analysis of synchrotron tomographic data
journal, August 2014

  • Gürsoy, Dogˇa; De Carlo, Francesco; Xiao, Xianghui
  • Journal of Synchrotron Radiation, Vol. 21, Issue 5
  • DOI: 10.1107/S1600577514013939

Soft X-ray microscopy at a spatial resolution better than 15 nm
journal, June 2005

  • Chao, Weilun; Harteneck, Bruce D.; Liddle, J. Alexander
  • Nature, Vol. 435, Issue 7046
  • DOI: 10.1038/nature03719

High-efficiency Fresnel zone plates for hard X-rays by 100 keV e-beam lithography and electroplating
journal, March 2011

  • Gorelick, Sergey; Vila-Comamala, Joan; Guzenko, Vitaliy A.
  • Journal of Synchrotron Radiation, Vol. 18, Issue 3
  • DOI: 10.1107/S0909049511002366

Electron tomography and holography in materials science
journal, April 2009

  • Midgley, Paul A.; Dunin-Borkowski, Rafal E.
  • Nature Materials, Vol. 8, Issue 4
  • DOI: 10.1038/nmat2406

Nondestructive Nanoscale 3D Elemental Mapping and Analysis of a Solid Oxide Fuel Cell Anode
journal, January 2010

  • Grew, Kyle N.; Chu, Yong S.; Yi, Jaemock
  • Journal of The Electrochemical Society, Vol. 157, Issue 6
  • DOI: 10.1149/1.3355957

Single-bounce monocapillaries for focusing synchrotron radiation: modeling, measurements and theoretical limits
journal, December 2005


Fatigue crack growth in SiC particle reinforced Al alloy matrix composites at high and low R-ratios by in situ X-ray synchrotron tomography
journal, November 2014