skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Continuous motion scan ptychography: characterization for increased speed in coherent x-ray imaging

Abstract

Ptychography is a coherent diffraction imaging (CDI) method for extended objects in which diffraction patterns are acquired sequentially from overlapping coherent illumination spots. The object’s complex transmission function can be reconstructed from those diffraction patterns at a spatial resolution limited only by the scattering strength of the object and the detector geometry. Most experiments to date have positioned the illumination spots on the sample using a move-settle-measure sequence in which the move and settle steps can take longer to complete than the measure step. We describe here the use of a continuous “fly-scan” mode for ptychographic data collection in which the sample is moved continuously, so that the experiment resembles one of integrating the diffraction patterns from multiple probe positions. This allows one to use multiple probe mode reconstruction methods to obtain an image of the object and also of the illumination function. We show in simulations, and in x-ray imaging experiments, some of the characteristics of fly-scan ptychography, including a factor of 25 reduction in the data acquisition time. This approach will become increasingly important as brighter x-ray sources are developed, such as diffraction limited storage rings.

Authors:
; ; ; ; ; ; ; ;
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22); National Institutes of Health (NIH) - National Institute of General Medical Sciences
OSTI Identifier:
1392072
DOE Contract Number:  
AC02-06CH11357
Resource Type:
Journal Article
Resource Relation:
Journal Name: Optics Express; Journal Volume: 23; Journal Issue: 5
Country of Publication:
United States
Language:
English
Subject:
Image reconstruction techniques; Phase retrieval; Scanning microscopy; X-ray microscopy

Citation Formats

Deng, Junjing, Nashed, Youssef S. G., Chen, Si, Phillips, Nicholas W., Peterka, Tom, Ross, Rob, Vogt, Stefan, Jacobsen, Chris, and Vine, David J. Continuous motion scan ptychography: characterization for increased speed in coherent x-ray imaging. United States: N. p., 2015. Web. doi:10.1364/OE.23.005438.
Deng, Junjing, Nashed, Youssef S. G., Chen, Si, Phillips, Nicholas W., Peterka, Tom, Ross, Rob, Vogt, Stefan, Jacobsen, Chris, & Vine, David J. Continuous motion scan ptychography: characterization for increased speed in coherent x-ray imaging. United States. doi:10.1364/OE.23.005438.
Deng, Junjing, Nashed, Youssef S. G., Chen, Si, Phillips, Nicholas W., Peterka, Tom, Ross, Rob, Vogt, Stefan, Jacobsen, Chris, and Vine, David J. Thu . "Continuous motion scan ptychography: characterization for increased speed in coherent x-ray imaging". United States. doi:10.1364/OE.23.005438.
@article{osti_1392072,
title = {Continuous motion scan ptychography: characterization for increased speed in coherent x-ray imaging},
author = {Deng, Junjing and Nashed, Youssef S. G. and Chen, Si and Phillips, Nicholas W. and Peterka, Tom and Ross, Rob and Vogt, Stefan and Jacobsen, Chris and Vine, David J.},
abstractNote = {Ptychography is a coherent diffraction imaging (CDI) method for extended objects in which diffraction patterns are acquired sequentially from overlapping coherent illumination spots. The object’s complex transmission function can be reconstructed from those diffraction patterns at a spatial resolution limited only by the scattering strength of the object and the detector geometry. Most experiments to date have positioned the illumination spots on the sample using a move-settle-measure sequence in which the move and settle steps can take longer to complete than the measure step. We describe here the use of a continuous “fly-scan” mode for ptychographic data collection in which the sample is moved continuously, so that the experiment resembles one of integrating the diffraction patterns from multiple probe positions. This allows one to use multiple probe mode reconstruction methods to obtain an image of the object and also of the illumination function. We show in simulations, and in x-ray imaging experiments, some of the characteristics of fly-scan ptychography, including a factor of 25 reduction in the data acquisition time. This approach will become increasingly important as brighter x-ray sources are developed, such as diffraction limited storage rings.},
doi = {10.1364/OE.23.005438},
journal = {Optics Express},
number = 5,
volume = 23,
place = {United States},
year = {Thu Jan 01 00:00:00 EST 2015},
month = {Thu Jan 01 00:00:00 EST 2015}
}