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Title: Spherical quartz crystals investigated with synchrotron radiation

Abstract

To attain optimum performance in applications such as x-ray imaging and spectroscopy, a spherically bent crystal must diffract well across its entire surface. X-ray topography of sample crystals shows isolated regions where diffraction is problematic, even for a crystal where inspection with visible light does not suggest problems. Covering problem spots may improve the crystal’s focus and decrease the background. We explore the special properties of synchrotron radiation to examine typical spherical crystals from alpha-quartz, in a perpendicular geometry that is especially convenient to examine sagittal focusing.

Authors:
ORCiD logo; ; ; ; ;
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1391775
DOE Contract Number:  
AC02-06CH11357
Resource Type:
Journal Article
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 86; Journal Issue: 10; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
crystal; imaging; plasma diagnostic; spherical; x-ray

Citation Formats

Pereira, N. R., Macrander, A. T., Hill, K. W., Baronova, E. O., George, K. M., and Kotick, J. Spherical quartz crystals investigated with synchrotron radiation. United States: N. p., 2015. Web. doi:10.1063/1.4934197.
Pereira, N. R., Macrander, A. T., Hill, K. W., Baronova, E. O., George, K. M., & Kotick, J. Spherical quartz crystals investigated with synchrotron radiation. United States. doi:10.1063/1.4934197.
Pereira, N. R., Macrander, A. T., Hill, K. W., Baronova, E. O., George, K. M., and Kotick, J. Thu . "Spherical quartz crystals investigated with synchrotron radiation". United States. doi:10.1063/1.4934197.
@article{osti_1391775,
title = {Spherical quartz crystals investigated with synchrotron radiation},
author = {Pereira, N. R. and Macrander, A. T. and Hill, K. W. and Baronova, E. O. and George, K. M. and Kotick, J.},
abstractNote = {To attain optimum performance in applications such as x-ray imaging and spectroscopy, a spherically bent crystal must diffract well across its entire surface. X-ray topography of sample crystals shows isolated regions where diffraction is problematic, even for a crystal where inspection with visible light does not suggest problems. Covering problem spots may improve the crystal’s focus and decrease the background. We explore the special properties of synchrotron radiation to examine typical spherical crystals from alpha-quartz, in a perpendicular geometry that is especially convenient to examine sagittal focusing.},
doi = {10.1063/1.4934197},
journal = {Review of Scientific Instruments},
issn = {0034-6748},
number = 10,
volume = 86,
place = {United States},
year = {2015},
month = {10}
}

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