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Title: Exotic X-ray back-diffraction: a path toward a soft inelastic X-ray scattering spectrometer

Abstract

In this work, soft X-ray back-diffraction (XBD; X-ray diffraction at angles near and exactly equal to 90°) is explored. The experiment was conducted at the SXS beamline at Laboratorio Nacional de Luz Sincrotron, Brazil, at ~3.2 keV. A high-resolution Si(220) multi-bounce back-diffraction monochromator was designed and constructed for this experiment. An ultra-thin Si(220) crystal (5 µm thick) was used as the sample. This ultra-thin crystal was characterized by profilometry, rocking-curve measurements and X-ray topography prior to the XBD measurements. It is shown that the measured forward-diffracted beam (o-beam) profiles, taken at different temperatures, are in close agreement with profiles predicted by the extended dynamical theory of X-ray diffraction, with the absence of multiple-beam diffraction (MBD). This is an important result for future studies on the basic properties of back-diffracted X-ray beams at energies slightly above the exact XBD condition (extreme condition where XBD is almost extinguished). Also, the results presented here indicate that stressed crystals behave like ideal strain-free crystals when used for low-energy XBD. This is mainly due to the large widths of XBD profiles, which lead to a low strain sensitivity in the detection of defects. This result opens up new possibilities for mounting spherical analyzers without degradingmore » the energy resolution, at least for low energies. This is a path that may be used to construct a soft inelastic X-ray scattering spectrometer where different applications such as element-specific magnetic imaging tools could be explored.« less

Authors:
; ; ; ; ; ; ;
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1391661
DOE Contract Number:  
AC02-06CH11357
Resource Type:
Journal Article
Journal Name:
Journal of Applied Crystallography (Online)
Additional Journal Information:
Journal Volume: 47; Journal Issue: 5; Journal ID: ISSN 1600-5767
Publisher:
International Union of Crystallography
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY

Citation Formats

Hönnicke, Marcelo Goncalves, Conley, Raymond, Cusatis, Cesar, Kakuno, Edson Massayuki, Zhou, Juan, Bouet, Nathalie, Marques, Joao Basso, and Vicentin, Flavio Cesar. Exotic X-ray back-diffraction: a path toward a soft inelastic X-ray scattering spectrometer. United States: N. p., 2014. Web. doi:10.1107/S1600576714018147.
Hönnicke, Marcelo Goncalves, Conley, Raymond, Cusatis, Cesar, Kakuno, Edson Massayuki, Zhou, Juan, Bouet, Nathalie, Marques, Joao Basso, & Vicentin, Flavio Cesar. Exotic X-ray back-diffraction: a path toward a soft inelastic X-ray scattering spectrometer. United States. doi:10.1107/S1600576714018147.
Hönnicke, Marcelo Goncalves, Conley, Raymond, Cusatis, Cesar, Kakuno, Edson Massayuki, Zhou, Juan, Bouet, Nathalie, Marques, Joao Basso, and Vicentin, Flavio Cesar. Sat . "Exotic X-ray back-diffraction: a path toward a soft inelastic X-ray scattering spectrometer". United States. doi:10.1107/S1600576714018147.
@article{osti_1391661,
title = {Exotic X-ray back-diffraction: a path toward a soft inelastic X-ray scattering spectrometer},
author = {Hönnicke, Marcelo Goncalves and Conley, Raymond and Cusatis, Cesar and Kakuno, Edson Massayuki and Zhou, Juan and Bouet, Nathalie and Marques, Joao Basso and Vicentin, Flavio Cesar},
abstractNote = {In this work, soft X-ray back-diffraction (XBD; X-ray diffraction at angles near and exactly equal to 90°) is explored. The experiment was conducted at the SXS beamline at Laboratorio Nacional de Luz Sincrotron, Brazil, at ~3.2 keV. A high-resolution Si(220) multi-bounce back-diffraction monochromator was designed and constructed for this experiment. An ultra-thin Si(220) crystal (5 µm thick) was used as the sample. This ultra-thin crystal was characterized by profilometry, rocking-curve measurements and X-ray topography prior to the XBD measurements. It is shown that the measured forward-diffracted beam (o-beam) profiles, taken at different temperatures, are in close agreement with profiles predicted by the extended dynamical theory of X-ray diffraction, with the absence of multiple-beam diffraction (MBD). This is an important result for future studies on the basic properties of back-diffracted X-ray beams at energies slightly above the exact XBD condition (extreme condition where XBD is almost extinguished). Also, the results presented here indicate that stressed crystals behave like ideal strain-free crystals when used for low-energy XBD. This is mainly due to the large widths of XBD profiles, which lead to a low strain sensitivity in the detection of defects. This result opens up new possibilities for mounting spherical analyzers without degrading the energy resolution, at least for low energies. This is a path that may be used to construct a soft inelastic X-ray scattering spectrometer where different applications such as element-specific magnetic imaging tools could be explored.},
doi = {10.1107/S1600576714018147},
journal = {Journal of Applied Crystallography (Online)},
issn = {1600-5767},
number = 5,
volume = 47,
place = {United States},
year = {2014},
month = {9}
}

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