Far-Field High-Energy Diffraction Microscopy: A Non-Destructive Tool for Characterizing the Microstructure and Micromechanical State of Polycrystalline Materials
Abstract
A suite of non-destructive, three-dimensional X-ray microscopy techniques have recently been developed and used to characterize the microstructures of polycrystalline materials. These techniques utilize high-energy synchrotron radiation and include near-field and far-field diffraction microscopy (NF- and FF-HEDM, respectively) and absorption tomography. Several compatible sample environments have also been developed, enabling a wide range of 3D studies of material evolution. In this article, the FF-HEDM technique is described in detail, including its implementation at the 1-ID beamline of the Advanced Photon Source. Examples of how the information obtained from FF-HEDM can be used to deepen our understanding of structure-property-processing relationships in selected materials are presented.
- Authors:
-
- Argonne National Lab. (ANL), Argonne, IL (United States). X-ray Science Division
- Argonne National Lab. (ANL), Argonne, IL (United States). Nuclear Engineering Division
- Max Planck Inst. for Iron Research, Dusseldorf (Germany)
- Publication Date:
- Research Org.:
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES); USDOE Office of Nuclear Energy (NE)
- OSTI Identifier:
- 1390810
- Grant/Contract Number:
- AC02-06CH11357; FG02-10ER46758
- Resource Type:
- Journal Article: Accepted Manuscript
- Journal Name:
- Microscopy Today
- Additional Journal Information:
- Journal Volume: 25; Journal Issue: 05; Journal ID: ISSN 1551-9295
- Publisher:
- Cambridge University Press
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE
Citation Formats
Park, Jun-Sang, Zhang, Xuan, Kenesei, Peter, Wong, Su Leen, Li, Meimei, and Almer, Jonathan. Far-Field High-Energy Diffraction Microscopy: A Non-Destructive Tool for Characterizing the Microstructure and Micromechanical State of Polycrystalline Materials. United States: N. p., 2017.
Web. doi:10.1017/S1551929517000827.
Park, Jun-Sang, Zhang, Xuan, Kenesei, Peter, Wong, Su Leen, Li, Meimei, & Almer, Jonathan. Far-Field High-Energy Diffraction Microscopy: A Non-Destructive Tool for Characterizing the Microstructure and Micromechanical State of Polycrystalline Materials. United States. https://doi.org/10.1017/S1551929517000827
Park, Jun-Sang, Zhang, Xuan, Kenesei, Peter, Wong, Su Leen, Li, Meimei, and Almer, Jonathan. 2017.
"Far-Field High-Energy Diffraction Microscopy: A Non-Destructive Tool for Characterizing the Microstructure and Micromechanical State of Polycrystalline Materials". United States. https://doi.org/10.1017/S1551929517000827. https://www.osti.gov/servlets/purl/1390810.
@article{osti_1390810,
title = {Far-Field High-Energy Diffraction Microscopy: A Non-Destructive Tool for Characterizing the Microstructure and Micromechanical State of Polycrystalline Materials},
author = {Park, Jun-Sang and Zhang, Xuan and Kenesei, Peter and Wong, Su Leen and Li, Meimei and Almer, Jonathan},
abstractNote = {A suite of non-destructive, three-dimensional X-ray microscopy techniques have recently been developed and used to characterize the microstructures of polycrystalline materials. These techniques utilize high-energy synchrotron radiation and include near-field and far-field diffraction microscopy (NF- and FF-HEDM, respectively) and absorption tomography. Several compatible sample environments have also been developed, enabling a wide range of 3D studies of material evolution. In this article, the FF-HEDM technique is described in detail, including its implementation at the 1-ID beamline of the Advanced Photon Source. Examples of how the information obtained from FF-HEDM can be used to deepen our understanding of structure-property-processing relationships in selected materials are presented.},
doi = {10.1017/S1551929517000827},
url = {https://www.osti.gov/biblio/1390810},
journal = {Microscopy Today},
issn = {1551-9295},
number = 05,
volume = 25,
place = {United States},
year = {Thu Aug 31 00:00:00 EDT 2017},
month = {Thu Aug 31 00:00:00 EDT 2017}
}
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