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Title: X-ray and Extreme Ultraviolet Spectroscopy on DIII-D

Authors:
; ; ;
Publication Date:
Research Org.:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1390017
Report Number(s):
LLNL-PROC-733679
Journal ID: ISSN 1748--0221
DOE Contract Number:
AC52-07NA27344
Resource Type:
Conference
Resource Relation:
Journal Volume: 12; Journal Issue: 06; Conference: Presented at: European Conference on Plasma Diagnostics, Bordeaux, France, Apr 18 - Apr 21, 2017
Country of Publication:
United States
Language:
English
Subject:
70 PLASMA PHYSICS AND FUSION

Citation Formats

Victor, B S, Allen, S L, Beiersdorfer, P, and Magee, E W. X-ray and Extreme Ultraviolet Spectroscopy on DIII-D. United States: N. p., 2017. Web. doi:10.1088/1748-0221/12/06/C06011.
Victor, B S, Allen, S L, Beiersdorfer, P, & Magee, E W. X-ray and Extreme Ultraviolet Spectroscopy on DIII-D. United States. doi:10.1088/1748-0221/12/06/C06011.
Victor, B S, Allen, S L, Beiersdorfer, P, and Magee, E W. 2017. "X-ray and Extreme Ultraviolet Spectroscopy on DIII-D". United States. doi:10.1088/1748-0221/12/06/C06011. https://www.osti.gov/servlets/purl/1390017.
@article{osti_1390017,
title = {X-ray and Extreme Ultraviolet Spectroscopy on DIII-D},
author = {Victor, B S and Allen, S L and Beiersdorfer, P and Magee, E W},
abstractNote = {},
doi = {10.1088/1748-0221/12/06/C06011},
journal = {},
number = 06,
volume = 12,
place = {United States},
year = 2017,
month = 5
}

Conference:
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  • We have performed an absolute intensity calibration of a SPRED multichannel EUV spectrograph using synchrotron radiation from the NBS SURF-II electron storage ring. The calibration procedure and results for both a survey grating (450 g/mm) and a high-resolution (2100 g/mm) grating are presented. The spectrograph is currently in use on the DIII-D tokamak with a tangential line-of-sight at the plasma midplane. Data is first acquired and processed by a microcomputer; the absolute line intensities are then sent to the DIII-D database for comparison with data from other diagnostics. Representative data from DIII-D plasma operations will be presented. 6 refs., 3more » figs., 1 tab.« less
  • Two spectrometers were installed to measure tungsten emission in the core of DIII-D plasmas during a metal rings experimental campaign. The spectral range of the high-resolution (1340 spectral channels), variable-ruled grating X-ray and Extreme Ultraviolet Spectrometer (XEUS) extends from10–71more » $$\dot{A}$$ . The spectral range of the second spectrometer, the Long-Wavelength Extreme Ultraviolet Spectrometer (LoWEUS), measures between 31–174$$\dot{A}$$ . Three groups of tungsten lines were identified with XEUS: W 38+-W 45+ from 47–63$$\dot{A}$$ , W 27+-W 35+ from 45–55$$\dot{A}$$ , and W 28+-W 33+ from 16–30$$\dot{A}$$ . Emission lines from tungsten charge states W 28+, W 43+, W 44+, and W 45+ are identified and the line amplitude is presented versus time. Peak emission of W 43+-W 45+ occurs between core Te=2.5-3 keV, and peak emission of W28+ occurs at core Te 1:3 keV. One group of tungsten lines, W 40+-W 45+, between 120–140$$\dot{A}$$ , was identified with LoWEUS. W 43+- W 45+ lines measured with LoWEUS track the sawtooth cycle. Furthermore, sensitivity to the sawtooth cycle and the correlation of the peak emission with core electron temperature show that these spectrometers track the on-axis tungsten emission of DIII-D plasmas.« less
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  • The Seyfert 1 galaxy Mrk 478, observed during the EUVE all-sky survey, is the brightest EUV source among its class. The SW spectrum of this object shows evidence of discrete emission, although this interpretation is tentative, since the source spectrum must be extracted against a bright background. If the EUV flux is, in fact, composed partly of line emission, the authors attribute the discrete structure to emission from a collision-driven plasma at temperatures {approx_gt} 10{sup 6} K. In this context, they discuss some of the constraints imposed on the emission-line region by this observation.
  • Three independent methods (XUV spectroscopy, imaging at 68 eV and 256 eV) have been used to measure planar target rear surface plasma temperature due to heating by hot electrons. The hot electrons are produced by ultra-intense laser plasma interactions using the 150 J, 0.5 ps Titan laser. Soft x-ray spectroscopy in the 50-400 eV region and imaging at the 68 eV and 256 eV photon energies were used to determine the rear surface temperature of planar CD targets. Temperatures were found to be in the 60-150 eV range, with good agreement between the three diagnostics.