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Title: Lithiation of multilayer Ni/NiO electrodes: criticality of nickel layer thicknesses on conversion reaction kinetics

Abstract

X-ray reflectivity and transmission electron microscopy (TEM) were used to characterize the morphological changes in thin film electrodes with alternating Ni and NiO layers during lithiation as a function of the Ni buffer layer thickness.

Authors:
 [1];  [2];  [1];  [3];  [3];  [4]; ORCiD logo [1]; ORCiD logo [2]; ORCiD logo [5]
  1. Department of Materials Science and Engineering; Northwestern University; Evanston; USA
  2. Chemical Sciences and Engineering Division; Argonne National Laboratory; Lemont; USA
  3. EPIC; NUANCE Center; Northwestern University; Evanston; USA
  4. Department of Materials Science and Engineering; Northwestern University; Evanston; USA; EPIC
  5. Department of Materials Science and Engineering; Northwestern University; Evanston; USA; Department of Physics and Astronomy
Publication Date:
Research Org.:
Energy Frontier Research Centers (EFRC) (United States). Center for Electrical Energy Storage (CEES)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
OSTI Identifier:
1389019
DOE Contract Number:  
AC02-06CH11357
Resource Type:
Journal Article
Journal Name:
Physical Chemistry Chemical Physics. PCCP (Print)
Additional Journal Information:
Journal Volume: 19; Journal Issue: 30; Related Information: CEES partners with Argonne National Laboratory (lead); University of Illinois, Urbana-Champaign; Northwest University; Journal ID: ISSN 1463-9076
Publisher:
Royal Society of Chemistry
Country of Publication:
United States
Language:
English
Subject:
energy storage (including batteries and capacitors), charge transport, materials and chemistry by design, synthesis (novel materials)

Citation Formats

Evmenenko, Guennadi, Fister, Timothy T., Buchholz, D. Bruce, Castro, Fernando C., Li, Qianqian, Wu, Jinsong, Dravid, Vinayak P., Fenter, Paul, and Bedzyk, Michael J. Lithiation of multilayer Ni/NiO electrodes: criticality of nickel layer thicknesses on conversion reaction kinetics. United States: N. p., 2017. Web. doi:10.1039/C7CP02448G.
Evmenenko, Guennadi, Fister, Timothy T., Buchholz, D. Bruce, Castro, Fernando C., Li, Qianqian, Wu, Jinsong, Dravid, Vinayak P., Fenter, Paul, & Bedzyk, Michael J. Lithiation of multilayer Ni/NiO electrodes: criticality of nickel layer thicknesses on conversion reaction kinetics. United States. https://doi.org/10.1039/C7CP02448G
Evmenenko, Guennadi, Fister, Timothy T., Buchholz, D. Bruce, Castro, Fernando C., Li, Qianqian, Wu, Jinsong, Dravid, Vinayak P., Fenter, Paul, and Bedzyk, Michael J. Sun . "Lithiation of multilayer Ni/NiO electrodes: criticality of nickel layer thicknesses on conversion reaction kinetics". United States. https://doi.org/10.1039/C7CP02448G.
@article{osti_1389019,
title = {Lithiation of multilayer Ni/NiO electrodes: criticality of nickel layer thicknesses on conversion reaction kinetics},
author = {Evmenenko, Guennadi and Fister, Timothy T. and Buchholz, D. Bruce and Castro, Fernando C. and Li, Qianqian and Wu, Jinsong and Dravid, Vinayak P. and Fenter, Paul and Bedzyk, Michael J.},
abstractNote = {X-ray reflectivity and transmission electron microscopy (TEM) were used to characterize the morphological changes in thin film electrodes with alternating Ni and NiO layers during lithiation as a function of the Ni buffer layer thickness.},
doi = {10.1039/C7CP02448G},
url = {https://www.osti.gov/biblio/1389019}, journal = {Physical Chemistry Chemical Physics. PCCP (Print)},
issn = {1463-9076},
number = 30,
volume = 19,
place = {United States},
year = {2017},
month = {1}
}

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    Works referencing / citing this record:

    Thin Film RuO 2 Lithiation: Fast Lithium-Ion Diffusion along the Interface
    journal, November 2018


    Structural analysis of the initial lithiation of NiO thin film electrodes
    journal, January 2019