Lithiation of multilayer Ni/NiO electrodes: criticality of nickel layer thicknesses on conversion reaction kinetics
Abstract
X-ray reflectivity and transmission electron microscopy (TEM) were used to characterize the morphological changes in thin film electrodes with alternating Ni and NiO layers during lithiation as a function of the Ni buffer layer thickness.
- Authors:
-
- Department of Materials Science and Engineering; Northwestern University; Evanston; USA
- Chemical Sciences and Engineering Division; Argonne National Laboratory; Lemont; USA
- EPIC; NUANCE Center; Northwestern University; Evanston; USA
- Department of Materials Science and Engineering; Northwestern University; Evanston; USA; EPIC
- Department of Materials Science and Engineering; Northwestern University; Evanston; USA; Department of Physics and Astronomy
- Publication Date:
- Research Org.:
- Energy Frontier Research Centers (EFRC) (United States). Center for Electrical Energy Storage (CEES)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
- OSTI Identifier:
- 1389019
- DOE Contract Number:
- AC02-06CH11357
- Resource Type:
- Journal Article
- Journal Name:
- Physical Chemistry Chemical Physics. PCCP (Print)
- Additional Journal Information:
- Journal Volume: 19; Journal Issue: 30; Related Information: CEES partners with Argonne National Laboratory (lead); University of Illinois, Urbana-Champaign; Northwest University; Journal ID: ISSN 1463-9076
- Publisher:
- Royal Society of Chemistry
- Country of Publication:
- United States
- Language:
- English
- Subject:
- energy storage (including batteries and capacitors), charge transport, materials and chemistry by design, synthesis (novel materials)
Citation Formats
Evmenenko, Guennadi, Fister, Timothy T., Buchholz, D. Bruce, Castro, Fernando C., Li, Qianqian, Wu, Jinsong, Dravid, Vinayak P., Fenter, Paul, and Bedzyk, Michael J. Lithiation of multilayer Ni/NiO electrodes: criticality of nickel layer thicknesses on conversion reaction kinetics. United States: N. p., 2017.
Web. doi:10.1039/C7CP02448G.
Evmenenko, Guennadi, Fister, Timothy T., Buchholz, D. Bruce, Castro, Fernando C., Li, Qianqian, Wu, Jinsong, Dravid, Vinayak P., Fenter, Paul, & Bedzyk, Michael J. Lithiation of multilayer Ni/NiO electrodes: criticality of nickel layer thicknesses on conversion reaction kinetics. United States. doi:10.1039/C7CP02448G.
Evmenenko, Guennadi, Fister, Timothy T., Buchholz, D. Bruce, Castro, Fernando C., Li, Qianqian, Wu, Jinsong, Dravid, Vinayak P., Fenter, Paul, and Bedzyk, Michael J. Sun .
"Lithiation of multilayer Ni/NiO electrodes: criticality of nickel layer thicknesses on conversion reaction kinetics". United States. doi:10.1039/C7CP02448G.
@article{osti_1389019,
title = {Lithiation of multilayer Ni/NiO electrodes: criticality of nickel layer thicknesses on conversion reaction kinetics},
author = {Evmenenko, Guennadi and Fister, Timothy T. and Buchholz, D. Bruce and Castro, Fernando C. and Li, Qianqian and Wu, Jinsong and Dravid, Vinayak P. and Fenter, Paul and Bedzyk, Michael J.},
abstractNote = {X-ray reflectivity and transmission electron microscopy (TEM) were used to characterize the morphological changes in thin film electrodes with alternating Ni and NiO layers during lithiation as a function of the Ni buffer layer thickness.},
doi = {10.1039/C7CP02448G},
journal = {Physical Chemistry Chemical Physics. PCCP (Print)},
issn = {1463-9076},
number = 30,
volume = 19,
place = {United States},
year = {2017},
month = {1}
}
DOI: 10.1039/C7CP02448G
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