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Title: Near-edge X-ray refraction fine structure microscopy

Authors:
 [1]; ORCiD logo [1];  [1];  [1];  [1];  [1];  [1];  [1];  [2];  [2];  [3]; ORCiD logo [4];  [5];  [6]; ORCiD logo [6];  [7]; ORCiD logo [1]
  1. Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA
  2. Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA; Department of Physics, University of Oregon, Eugene, Oregon 97401, USA
  3. Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA; Department of Chemistry, University of Illinois at Chicago, Chicago, Illinois 60607, USA
  4. Department of Chemistry, University of Illinois at Chicago, Chicago, Illinois 60607, USA
  5. Engineering Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA
  6. Computational Research Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA
  7. Laboratory of Molecular Biophysics, Uppsala University, SE-751 24 Uppsala, Sweden
Publication Date:
Research Org.:
Energy Frontier Research Centers (EFRC) (United States). Northeastern Center for Chemical Energy Storage (NECCES)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1388565
DOE Contract Number:  
SC0001294
Resource Type:
Journal Article
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 110; Journal Issue: 6; Related Information: NECCES partners with Stony Brook University (lead); Argonne National Laboratory; Binghamton University; Brookhaven National University; University of California, San Diego; University of Cambridge, UK; Lawrence Berkeley National Laboratory; Massachusetts Institute of Technology; University of Michigan; Rutgers University; Journal ID: ISSN 0003-6951
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
energy storage (including batteries and capacitors), defects, charge transport, materials and chemistry by design, synthesis (novel materials)

Citation Formats

Farmand, Maryam, Celestre, Richard, Denes, Peter, Kilcoyne, A. L. David, Marchesini, Stefano, Padmore, Howard, Tyliszczak, Tolek, Warwick, Tony, Shi, Xiaowen, Lee, James, Yu, Young-Sang, Cabana, Jordi, Joseph, John, Krishnan, Harinarayan, Perciano, Talita, Maia, Filipe R. N. C., and Shapiro, David A. Near-edge X-ray refraction fine structure microscopy. United States: N. p., 2017. Web. doi:10.1063/1.4975377.
Farmand, Maryam, Celestre, Richard, Denes, Peter, Kilcoyne, A. L. David, Marchesini, Stefano, Padmore, Howard, Tyliszczak, Tolek, Warwick, Tony, Shi, Xiaowen, Lee, James, Yu, Young-Sang, Cabana, Jordi, Joseph, John, Krishnan, Harinarayan, Perciano, Talita, Maia, Filipe R. N. C., & Shapiro, David A. Near-edge X-ray refraction fine structure microscopy. United States. doi:10.1063/1.4975377.
Farmand, Maryam, Celestre, Richard, Denes, Peter, Kilcoyne, A. L. David, Marchesini, Stefano, Padmore, Howard, Tyliszczak, Tolek, Warwick, Tony, Shi, Xiaowen, Lee, James, Yu, Young-Sang, Cabana, Jordi, Joseph, John, Krishnan, Harinarayan, Perciano, Talita, Maia, Filipe R. N. C., and Shapiro, David A. Mon . "Near-edge X-ray refraction fine structure microscopy". United States. doi:10.1063/1.4975377.
@article{osti_1388565,
title = {Near-edge X-ray refraction fine structure microscopy},
author = {Farmand, Maryam and Celestre, Richard and Denes, Peter and Kilcoyne, A. L. David and Marchesini, Stefano and Padmore, Howard and Tyliszczak, Tolek and Warwick, Tony and Shi, Xiaowen and Lee, James and Yu, Young-Sang and Cabana, Jordi and Joseph, John and Krishnan, Harinarayan and Perciano, Talita and Maia, Filipe R. N. C. and Shapiro, David A.},
abstractNote = {},
doi = {10.1063/1.4975377},
journal = {Applied Physics Letters},
issn = {0003-6951},
number = 6,
volume = 110,
place = {United States},
year = {2017},
month = {2}
}

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