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Title: High-efficiency in situ resonant inelastic x-ray scattering (iRIXS) endstation at the Advanced Light Source

Authors:
 [1];  [2];  [3];  [4];  [5];  [6];  [7]; ORCiD logo [7];  [1]; ORCiD logo [1];  [8];  [8];  [8];  [8];  [1];  [9]; ORCiD logo [9];  [10]; ORCiD logo [11];  [1] more »; ORCiD logo [1];  [1];  [1]; ORCiD logo [1] « less
  1. Advanced Light Source, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, California 94720, USA
  2. Advanced Light Source, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, California 94720, USA; School of Physics, National Key Laboratory of Crystal Materials, Shandong University, Jinan 250100, People’s Republic of China
  3. Advanced Light Source, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, California 94720, USA; School of Advanced Materials, Peking University Shenzhen Graduate School, Shenzhen 518055, People’s Republic of China
  4. Advanced Light Source, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, California 94720, USA; Department of Materials Science and Engineering, Binghamton University, Binghamton, New York 13902, USA
  5. Universität Würzburg, Experimentelle Physik 7, 97074 Würzburg, Germany
  6. Department of Chemistry and Biochemistry, University of Nevada, Las Vegas (UNLV), Las Vegas, Nevada 89154-4003, USA
  7. Department of Chemistry and Biochemistry, University of Nevada, Las Vegas (UNLV), Las Vegas, Nevada 89154-4003, USA; Institute for Photon Science and Synchrotron Radiation (IPS), Karlsruhe Institute of Technology (KIT), 76344 Eggenstein-Leopoldshafen, Germany; Institute for Chemical Technology and Polymer Chemistry (ITCP), Karlsruhe Institute of Technology (KIT), 76128 Karlsruhe, Germany
  8. Engineering Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA
  9. School of Physics, National Key Laboratory of Crystal Materials, Shandong University, Jinan 250100, People’s Republic of China
  10. School of Advanced Materials, Peking University Shenzhen Graduate School, Shenzhen 518055, People’s Republic of China
  11. Department of Materials Science and Engineering, Binghamton University, Binghamton, New York 13902, USA
Publication Date:
Research Org.:
Energy Frontier Research Centers (EFRC) (United States). Northeastern Center for Chemical Energy Storage (NECCES)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1388466
DOE Contract Number:
SC0001294
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 88; Journal Issue: 3; Related Information: NECCES partners with Stony Brook University (lead); Argonne National Laboratory; Binghamton University; Brookhaven National University; University of California, San Diego; University of Cambridge, UK; Lawrence Berkeley National Laboratory; Massachusetts Institute of Technology; University of Michigan; Rutgers University
Country of Publication:
United States
Language:
English
Subject:
energy storage (including batteries and capacitors), defects, charge transport, materials and chemistry by design, synthesis (novel materials)

Citation Formats

Qiao, Ruimin, Li, Qinghao, Zhuo, Zengqing, Sallis, Shawn, Fuchs, Oliver, Blum, Monika, Weinhardt, Lothar, Heske, Clemens, Pepper, John, Jones, Michael, Brown, Adam, Spucces, Adrian, Chow, Ken, Smith, Brian, Glans, Per-Anders, Chen, Yanxue, Yan, Shishen, Pan, Feng, Piper, Louis F. J., Denlinger, Jonathan, Guo, Jinghua, Hussain, Zahid, Chuang, Yi-De, and Yang, Wanli. High-efficiency in situ resonant inelastic x-ray scattering (iRIXS) endstation at the Advanced Light Source. United States: N. p., 2017. Web. doi:10.1063/1.4977592.
Qiao, Ruimin, Li, Qinghao, Zhuo, Zengqing, Sallis, Shawn, Fuchs, Oliver, Blum, Monika, Weinhardt, Lothar, Heske, Clemens, Pepper, John, Jones, Michael, Brown, Adam, Spucces, Adrian, Chow, Ken, Smith, Brian, Glans, Per-Anders, Chen, Yanxue, Yan, Shishen, Pan, Feng, Piper, Louis F. J., Denlinger, Jonathan, Guo, Jinghua, Hussain, Zahid, Chuang, Yi-De, & Yang, Wanli. High-efficiency in situ resonant inelastic x-ray scattering (iRIXS) endstation at the Advanced Light Source. United States. doi:10.1063/1.4977592.
Qiao, Ruimin, Li, Qinghao, Zhuo, Zengqing, Sallis, Shawn, Fuchs, Oliver, Blum, Monika, Weinhardt, Lothar, Heske, Clemens, Pepper, John, Jones, Michael, Brown, Adam, Spucces, Adrian, Chow, Ken, Smith, Brian, Glans, Per-Anders, Chen, Yanxue, Yan, Shishen, Pan, Feng, Piper, Louis F. J., Denlinger, Jonathan, Guo, Jinghua, Hussain, Zahid, Chuang, Yi-De, and Yang, Wanli. Wed . "High-efficiency in situ resonant inelastic x-ray scattering (iRIXS) endstation at the Advanced Light Source". United States. doi:10.1063/1.4977592.
@article{osti_1388466,
title = {High-efficiency in situ resonant inelastic x-ray scattering (iRIXS) endstation at the Advanced Light Source},
author = {Qiao, Ruimin and Li, Qinghao and Zhuo, Zengqing and Sallis, Shawn and Fuchs, Oliver and Blum, Monika and Weinhardt, Lothar and Heske, Clemens and Pepper, John and Jones, Michael and Brown, Adam and Spucces, Adrian and Chow, Ken and Smith, Brian and Glans, Per-Anders and Chen, Yanxue and Yan, Shishen and Pan, Feng and Piper, Louis F. J. and Denlinger, Jonathan and Guo, Jinghua and Hussain, Zahid and Chuang, Yi-De and Yang, Wanli},
abstractNote = {},
doi = {10.1063/1.4977592},
journal = {Review of Scientific Instruments},
number = 3,
volume = 88,
place = {United States},
year = {Wed Mar 01 00:00:00 EST 2017},
month = {Wed Mar 01 00:00:00 EST 2017}
}
  • Cited by 10
  • In this paper, an endstation with two high-efficiency soft x-ray spectrographs was developed at Beamline 8.0.1 of the Advanced Light Source, Lawrence Berkeley National Laboratory. The endstation is capable of performing soft x-ray absorption spectroscopy, emission spectroscopy, and, in particular, resonant inelastic soft x-ray scattering (RIXS). Two slit-less variable line-spacing grating spectrographs are installed at different detection geometries. The endstation covers the photon energy range from 80 to 1500 eV. For studying transition-metal oxides, the large detection energy window allows a simultaneous collection of x-ray emission spectra with energies ranging from the O K-edge to the Ni L-edge without movingmore » any mechanical components. The record-high efficiency enables the recording of comprehensive two-dimensional RIXS maps with good statistics within a short acquisition time. By virtue of the large energy window and high throughput of the spectrographs, partial fluorescence yield and inverse partial fluorescence yield signals could be obtained for all transition metal L-edges including Mn. Finally and moreover, the different geometries of these two spectrographs (parallel and perpendicular to the horizontal polarization of the beamline) provide contrasts in RIXS features with two different momentum transfers.« less
  • The study of electronic excitations by inelastic X-ray scattering (IXS) has a rich history. Very early IXS work, for example, provided seminal demonstrations of the validity of relativistic kinematics and the quantum hypothesis and of Fermi-Dirac statistics. While there have been many important results in the interim, it has been the development of the third generation light sources together with continuing innovations in the manufacture and implementation of dispersive X-ray optics that has led to the rapid growth of IXS studies of electronic excitations.
  • A new liquid microjet endstation designed for ultraviolet (UPS) and X-ray (XPS) photoelectron, and partial electron yield X-ray absorption (XAS) spectroscopies at the Swiss Light Source is presented. The new endstation, which is based on a Scienta HiPP-2 R4000 electron spectrometer, is the first liquid microjet endstation capable of operating in vacuum and in ambient pressures up to the equilibrium vapor pressure of liquid water at room temperature. In addition, the Scienta HiPP-2 R4000 energy analyzer of this new endstation allows for XPS measurements up to 7000 eV electron kinetic energy that will enable electronic structure measurements of bulk solutionsmore » and buried interfaces from liquid microjet samples. The endstation is designed to operate at the soft X-ray SIM beamline and at the tender X-ray Phoenix beamline. The endstation can also be operated using a Scienta 5 K ultraviolet helium lamp for dedicated UPS measurements at the vapor-liquid interface using either He I or He II α lines. The design concept, first results from UPS, soft X-ray XPS, and partial electron yield XAS measurements, and an outlook to the potential of this endstation are presented.« less