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Title: Nickel oxide interlayer films from nickel formate–ethylenediamine precursor: influence of annealing on thin film properties and photovoltaic device performance

Abstract

Decomposition/oxidation correlated to nanoscale c-AFM helps separate selectivity and conductivity.

Authors:
 [1];  [2];  [3];  [4];  [4];  [4];  [5];  [6];  [4];  [5];  [4];  [4];  [2];  [4]
  1. Department of Chemistry and Biochemistry; University of Arizona; Tucson; USA; National Renewable Energy Laboratory
  2. Department of Chemistry and Biochemistry; University of Arizona; Tucson; USA
  3. Department of Physics and Astronomy; University of Denver; Denver; USA; National Renewable Energy Laboratory
  4. National Renewable Energy Laboratory; Golden; USA
  5. Applied Physics Department; Colorado School of Mines; Golden; USA
  6. Department of Materials Science and Engineering; University of Arizona; Tucson; USA
Publication Date:
Research Org.:
Energy Frontier Research Centers (EFRC) (United States). Center for Interface Science: Solar Electric Materials (CISSEM)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1385188
DOE Contract Number:
SC0001084
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Materials Chemistry. A; Journal Volume: 3; Journal Issue: 20; Related Information: CISSEM partners with the University of Arizona (lead); Georgia Institute of Technology; National Renewable Energy Laboratory; Princeton University; University of Washington
Country of Publication:
United States
Language:
English
Subject:
solar (photovoltaic), electrodes - solar, charge transport, synthesis (novel materials), synthesis (self-assembly), synthesis (scalable processing)

Citation Formats

Steirer, K. X., Richards, R. E., Sigdel, A. K., Garcia, A., Ndione, P. F., Hammond, S., Baker, D., Ratcliff, E. L., Curtis, C., Furtak, T., Ginley, D. S., Olson, D. C., Armstrong, N. R., and Berry, J. J. Nickel oxide interlayer films from nickel formate–ethylenediamine precursor: influence of annealing on thin film properties and photovoltaic device performance. United States: N. p., 2015. Web. doi:10.1039/C5TA01379H.
Steirer, K. X., Richards, R. E., Sigdel, A. K., Garcia, A., Ndione, P. F., Hammond, S., Baker, D., Ratcliff, E. L., Curtis, C., Furtak, T., Ginley, D. S., Olson, D. C., Armstrong, N. R., & Berry, J. J. Nickel oxide interlayer films from nickel formate–ethylenediamine precursor: influence of annealing on thin film properties and photovoltaic device performance. United States. doi:10.1039/C5TA01379H.
Steirer, K. X., Richards, R. E., Sigdel, A. K., Garcia, A., Ndione, P. F., Hammond, S., Baker, D., Ratcliff, E. L., Curtis, C., Furtak, T., Ginley, D. S., Olson, D. C., Armstrong, N. R., and Berry, J. J. Thu . "Nickel oxide interlayer films from nickel formate–ethylenediamine precursor: influence of annealing on thin film properties and photovoltaic device performance". United States. doi:10.1039/C5TA01379H.
@article{osti_1385188,
title = {Nickel oxide interlayer films from nickel formate–ethylenediamine precursor: influence of annealing on thin film properties and photovoltaic device performance},
author = {Steirer, K. X. and Richards, R. E. and Sigdel, A. K. and Garcia, A. and Ndione, P. F. and Hammond, S. and Baker, D. and Ratcliff, E. L. and Curtis, C. and Furtak, T. and Ginley, D. S. and Olson, D. C. and Armstrong, N. R. and Berry, J. J.},
abstractNote = {Decomposition/oxidation correlated to nanoscale c-AFM helps separate selectivity and conductivity.},
doi = {10.1039/C5TA01379H},
journal = {Journal of Materials Chemistry. A},
number = 20,
volume = 3,
place = {United States},
year = {Thu Jan 01 00:00:00 EST 2015},
month = {Thu Jan 01 00:00:00 EST 2015}
}