skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Intensity-Modulated Scanning Kelvin Probe Microscopy for Probing Recombination in Organic Photovoltaics

Authors:
 [1];  [1];  [2];  [3];  [1]
  1. Department of Chemistry, University of Washington, Seattle, Washington 98195-1700, United States
  2. Department of Chemistry, University of Washington, Seattle, Washington 98195-1700, United States; School of Physical Science and Technology, Lanzhou University, Lanzhou, Gansu 730000, People’s Republic of China
  3. Department of Chemistry, University of Washington, Seattle, Washington 98195-1700, United States; National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei, Anhui 230029, People’s Republic of China
Publication Date:
Research Org.:
Energy Frontier Research Centers (EFRC) (United States). Center for Interface Science: Solar Electric Materials (CISSEM)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1384695
DOE Contract Number:  
SC0001084
Resource Type:
Journal Article
Journal Name:
ACS Nano
Additional Journal Information:
Journal Volume: 8; Journal Issue: 10; Related Information: CISSEM partners with the University of Arizona (lead); Georgia Institute of Technology; National Renewable Energy Laboratory; Princeton University; University of Washington; Journal ID: ISSN 1936-0851
Publisher:
American Chemical Society (ACS)
Country of Publication:
United States
Language:
English
Subject:
solar (photovoltaic), electrodes - solar, charge transport, synthesis (novel materials), synthesis (self-assembly), synthesis (scalable processing)

Citation Formats

Shao, Guozheng, Glaz, Micah S., Ma, Fei, Ju, Huanxin, and Ginger, David S. Intensity-Modulated Scanning Kelvin Probe Microscopy for Probing Recombination in Organic Photovoltaics. United States: N. p., 2014. Web. doi:10.1021/nn5045867.
Shao, Guozheng, Glaz, Micah S., Ma, Fei, Ju, Huanxin, & Ginger, David S. Intensity-Modulated Scanning Kelvin Probe Microscopy for Probing Recombination in Organic Photovoltaics. United States. doi:10.1021/nn5045867.
Shao, Guozheng, Glaz, Micah S., Ma, Fei, Ju, Huanxin, and Ginger, David S. Mon . "Intensity-Modulated Scanning Kelvin Probe Microscopy for Probing Recombination in Organic Photovoltaics". United States. doi:10.1021/nn5045867.
@article{osti_1384695,
title = {Intensity-Modulated Scanning Kelvin Probe Microscopy for Probing Recombination in Organic Photovoltaics},
author = {Shao, Guozheng and Glaz, Micah S. and Ma, Fei and Ju, Huanxin and Ginger, David S.},
abstractNote = {},
doi = {10.1021/nn5045867},
journal = {ACS Nano},
issn = {1936-0851},
number = 10,
volume = 8,
place = {United States},
year = {2014},
month = {9}
}