skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Intensity-Modulated Scanning Kelvin Probe Microscopy for Probing Recombination in Organic Photovoltaics

Journal Article · · ACS Nano
DOI:https://doi.org/10.1021/nn5045867· OSTI ID:1384695
 [1];  [1];  [2];  [3];  [1]
  1. Department of Chemistry, University of Washington, Seattle, Washington 98195-1700, United States
  2. Department of Chemistry, University of Washington, Seattle, Washington 98195-1700, United States; School of Physical Science and Technology, Lanzhou University, Lanzhou, Gansu 730000, People’s Republic of China
  3. Department of Chemistry, University of Washington, Seattle, Washington 98195-1700, United States; National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei, Anhui 230029, People’s Republic of China

Research Organization:
Energy Frontier Research Centers (EFRC) (United States). Center for Interface Science: Solar Electric Materials (CISSEM)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
DOE Contract Number:
SC0001084
OSTI ID:
1384695
Journal Information:
ACS Nano, Vol. 8, Issue 10; Related Information: CISSEM partners with the University of Arizona (lead); Georgia Institute of Technology; National Renewable Energy Laboratory; Princeton University; University of Washington; ISSN 1936-0851
Publisher:
American Chemical Society (ACS)
Country of Publication:
United States
Language:
English