Transport imaging for contact-free measurements of minority carrier diffusion in GaN, GaN/AlGaN, and GaN/InGaN core-shell nanowires

Baird, Lee; Ong, C. P.; Cole, R. Adam; Haegel, N. M.; Talin, A. Alec; Li, Qiming; Wang, George T.

doi:10.1063/1.3573832

Title: Transport imaging for contact-free measurements of minority carrier diffusion in GaN, GaN/AlGaN, and GaN/InGaN core-shell nanowires

Journal Article · Mon Mar 28 00:00:00 EDT 2011 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.3573832· OSTI ID:1383691

Baird, Lee; Ong, C. P.; Cole, R. Adam; Haegel, N. M.; Talin, A. Alec; Li, Qiming; Wang, George T.

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Research Organization:: Energy Frontier Research Centers (EFRC) (United States). EFRC for Solid State Lighting Science (SSLS)

Sponsoring Organization:: USDOE National Nuclear Security Administration (NNSA)

DOE Contract Number:: AC04-94AL85000

OSTI ID:: 1383691

Journal Information:: Applied Physics Letters, Vol. 98, Issue 13; Related Information: SSLS partners with Sandia National Laboratories (lead); California Institute of Technology; University of California, Irvine, Merced, and Santa Barbara; Los Alamos National Laboratory; University of New Mexico; Northwestern University; Philips Lumileds Lighting; ISSN 0003-6951

Publisher:: American Institute of Physics (AIP)

Country of Publication:: United States

Language:: English

References (19)

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