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Title: X-ray diffraction microscopy of lithiated silicon microstructures

Authors:
; ; ; ; ;
Publication Date:
Research Org.:
Energy Frontier Research Centers (EFRC) (United States). Center for Electrical Energy Storage (CEES)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1382014
DOE Contract Number:  
AC02-06CH11357
Resource Type:
Journal Article
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 102; Journal Issue: 13; Related Information: CEES partners with Argonne National Laboratory (lead); University of Illinois, Urbana-Champaign; Northwest University; Journal ID: ISSN 0003-6951
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
energy storage (including batteries and capacitors), charge transport, materials and chemistry by design, synthesis (novel materials)

Citation Formats

Fister, Tim T., Goldman, Jason L., Long, Brandon R., Nuzzo, Ralph G., Gewirth, Andrew A., and Fenter, Paul A. X-ray diffraction microscopy of lithiated silicon microstructures. United States: N. p., 2013. Web. doi:10.1063/1.4798554.
Fister, Tim T., Goldman, Jason L., Long, Brandon R., Nuzzo, Ralph G., Gewirth, Andrew A., & Fenter, Paul A. X-ray diffraction microscopy of lithiated silicon microstructures. United States. doi:10.1063/1.4798554.
Fister, Tim T., Goldman, Jason L., Long, Brandon R., Nuzzo, Ralph G., Gewirth, Andrew A., and Fenter, Paul A. Mon . "X-ray diffraction microscopy of lithiated silicon microstructures". United States. doi:10.1063/1.4798554.
@article{osti_1382014,
title = {X-ray diffraction microscopy of lithiated silicon microstructures},
author = {Fister, Tim T. and Goldman, Jason L. and Long, Brandon R. and Nuzzo, Ralph G. and Gewirth, Andrew A. and Fenter, Paul A.},
abstractNote = {},
doi = {10.1063/1.4798554},
journal = {Applied Physics Letters},
issn = {0003-6951},
number = 13,
volume = 102,
place = {United States},
year = {2013},
month = {4}
}

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