Submicrometre-resolution polychromatic three-dimensional X-ray microscopy

Larson, B. C.; Levine, L. E.

doi:10.1107/S0021889812043737

Title: Submicrometre-resolution polychromatic three-dimensional X-ray microscopy

Journal Article · Fri Dec 21 00:00:00 EST 2012 · Journal of Applied Crystallography

DOI:https://doi.org/10.1107/S0021889812043737· OSTI ID:1381804

Larson, B. C.; Levine, L. E.

The ability to study the structure, microstructure and evolution of materials with increasing spatial resolution is fundamental to achieving a full understanding of the underlying science of materials. Polychromatic three-dimensional X-ray microscopy (3DXM) is a recently developed nondestructive diffraction technique that enables crystallographic phase identification, determination of local crystal orientations, grain morphologies, grain interface types and orientations, and in favorable cases direct determination of the deviatoric elastic strain tensor with submicrometre spatial resolution in all three dimensions. With the added capability of an energy-scanning incident beam monochromator, the determination of absolute lattice parameters is enabled, allowing specification of the complete elastic strain tensor with three-dimensional spatial resolution. The methods associated with 3DXM are described and key applications of 3DXM are discussed, including studies of deformation in single-crystal and polycrystalline metals and semiconductors, indentation deformation, thermal grain growth in polycrystalline aluminium, the metal–insulator transition in nanoplatelet VO₂, interface strengths in metal–matrix composites, high-pressure science, Sn whisker growth, and electromigration processes. Finally, the outlook for future developments associated with this technique is described.

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Research Organization:: Energy Frontier Research Centers (EFRC) (United States). Center for Defect Physics in Structural Materials (CDP)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

DOE Contract Number:: AC05-00OR22725

OSTI ID:: 1381804

Journal Information:: Journal of Applied Crystallography, Vol. 46, Issue 1; Related Information: CDP partners with Oak Ridge National Laboratory (lead); Ames Laboratory; University of California, Berkeley; Carnegie Mellon University; University of Georgia; University of Illinois, Urbana-Champaign; Ohio State University; University of Tennessee; ISSN 0021-8898

Publisher:: International Union of Crystallography

Country of Publication:: United States

Language:: English

References (49)

Disordered long-range internal stresses in deformed copper and the mechanisms underlying plastic deformation Levine, Lyle E.; Geantil, Peter; Larson, Bennett C. Acta Materialia, Vol. 59, Issue 14 https://doi.org/10.1016/j.actamat.2011.05.056	journal	August 2011
Plastic deformation in Al (Cu) interconnects stressed by electromigration and studied by synchrotron polychromatic x-ray microdiffraction Chen, Kai; Tamura, N.; Valek, B. C. Journal of Applied Physics, Vol. 104, Issue 1 https://doi.org/10.1063/1.2952073	journal	July 2008
Three-Dimensional X-Ray Diffraction Microscopy Using High-Energy X-Rays Poulsen, Henning F.; Jensen, Dorte Juul; Vaughan, Gavin B. M. MRS Bulletin, Vol. 29, Issue 3 https://doi.org/10.1557/mrs2004.54	journal	March 2004
Long range internal stresses in single-phase crystalline materials Kassner, M. E.; Geantil, P.; Levine, L. E. International Journal of Plasticity, Vol. 45 https://doi.org/10.1016/j.ijplas.2012.10.003	journal	June 2013
Indentation size effect in metallic materials: Correcting for the size of the plastic zone Durst, Karsten; Backes, Björn; Göken, Mathias Scripta Materialia, Vol. 52, Issue 11 https://doi.org/10.1016/j.scriptamat.2005.02.009	journal	June 2005
Effects of pre-strain on the compressive stress–strain response of Mo-alloy single-crystal micropillars Bei, H.; Shim, S.; Pharr, G. M. Acta Materialia, Vol. 56, Issue 17 https://doi.org/10.1016/j.actamat.2008.05.030	journal	October 2008
Nanoscale gold pillars strengthened through dislocation starvation Greer, Julia R.; Nix, William D. Physical Review B, Vol. 73, Issue 24 https://doi.org/10.1103/PhysRevB.73.245410	journal	June 2006
Study of residual elastic- and plastic-deformation in uniaxial tensile strained nickel-based Alloy 600 samples by polychromatic X-ray microdiffraction (PXM) and neutron diffraction methods Chao, Jing; Mark, Alison; Fuller, Marina L. Suominen Materials Science and Engineering: A, Vol. 524, Issue 1-2 https://doi.org/10.1016/j.msea.2009.05.033	journal	October 2009
A search for evidence of strain gradient hardening in Au submicron pillars under uniaxial compression using synchrotron X-ray microdiffraction Budiman, A. S.; Han, S. M.; Greer, J. R. Acta Materialia, Vol. 56, Issue 3 https://doi.org/10.1016/j.actamat.2007.10.031	journal	February 2008
Indentation size effects in single crystal copper as revealed by synchrotron x-ray microdiffraction Feng, G.; Budiman, A. S.; Nix, W. D. Journal of Applied Physics, Vol. 104, Issue 4 https://doi.org/10.1063/1.2966297	journal	August 2008
Some geometrical relations in dislocated crystals Nye, J. F. Acta Metallurgica, Vol. 1, Issue 2 https://doi.org/10.1016/0001-6160(53)90054-6	journal	March 1953
Local, submicron, strain gradients as the cause of Sn whisker growth Sobiech, M.; Wohlschlögel, M.; Welzel, U. Applied Physics Letters, Vol. 94, Issue 22 https://doi.org/10.1063/1.3147864	journal	June 2009
An Overview of Accomplishments and Challenges in Recrystallization and Grain Growth Rollett, Anthony D.; Brahme, Abhijit P.; Roberts, C. G. Materials Science Forum, Vol. 558-559 https://doi.org/10.4028/www.scientific.net/MSF.558-559.33	journal	October 2007
Polychromatic X-ray micro- and nanodiffraction for spatially-resolved structural studies Budai, J. D.; Liu, W.; Tischler, J. Z. Thin Solid Films, Vol. 516, Issue 22 https://doi.org/10.1016/j.tsf.2008.04.045	journal	September 2008
Survey of computed grain boundary properties in face-centered cubic metals—II: Grain boundary mobility Olmsted, David L.; Holm, Elizabeth A.; Foiles, Stephen M. Acta Materialia, Vol. 57, Issue 13 https://doi.org/10.1016/j.actamat.2009.04.015	journal	August 2009
Spatially resolved Poisson strain and anticlastic curvature measurements in Si under large deflection bending Yang, Wenge; Larson, B. C.; Ice, G. E. Applied Physics Letters, Vol. 82, Issue 22 https://doi.org/10.1063/1.1579857	journal	June 2003
Evolution of crack-tip transformation zones in superelastic Nitinol subjected to in situ fatigue: A fracture mechanics and synchrotron X-ray microdiffraction analysis Robertson, S. W.; Mehta, A.; Pelton, A. R. Acta Materialia, Vol. 55, Issue 18 https://doi.org/10.1016/j.actamat.2007.07.028	journal	October 2007
Experimental Characterization and Crystal Plasticity Modeling of Heterogeneous Deformation in Polycrystalline α-Ti Wang, L.; Barabash, R. I.; Yang, Y. Metallurgical and Materials Transactions A, Vol. 42, Issue 3 https://doi.org/10.1007/s11661-010-0249-8	journal	June 2010
Dislocation Density Tensor Characterization of Deformation Using 3D X-Ray Microscopy Larson, B. C.; Tischler, J. Z.; El-Azab, Anter Journal of Engineering Materials and Technology, Vol. 130, Issue 2 https://doi.org/10.1115/1.2884336	journal	April 2008
X-ray microbeam measurements of individual dislocation cell elastic strains in deformed single-crystal copper Levine, Lyle E.; Larson, Bennett C.; Yang, Wenge Nature Materials, Vol. 5, Issue 8 https://doi.org/10.1038/nmat1698	journal	July 2006
Electromechanical Actuation and Current-Induced Metastable States in Suspended Single-Crystalline VO ₂ Nanoplatelets Tselev, Alexander; Budai, John D.; Strelcov, Evgheni Nano Letters, Vol. 11, Issue 8 https://doi.org/10.1021/nl200493k	journal	August 2011
White microbeam diffraction from distorted crystals Barabash, R.; Ice, G. E.; Larson, B. C. Applied Physics Letters, Vol. 79, Issue 6 https://doi.org/10.1063/1.1389321	journal	August 2001
Three-Dimensional X-Ray Diffraction Microscopy Poulsen, Henning Springer Tracts in Modern Physics https://doi.org/10.1007/b97884	book	January 2004
Local Plasticity of Al Thin Films as Revealed by X-Ray Microdiffraction Spolenak, R.; Brown, W. L.; Tamura, N. Physical Review Letters, Vol. 90, Issue 9 https://doi.org/10.1103/PhysRevLett.90.096102	journal	March 2003
Smaller is stronger: The effect of strain hardening Maaß, R.; Van Petegem, S.; Ma, Duancheng Acta Materialia, Vol. 57, Issue 20 https://doi.org/10.1016/j.actamat.2009.08.024	journal	December 2009
Extended Mapping and Exploration of the Vanadium Dioxide Stress-Temperature Phase Diagram Cao, J.; Gu, Y.; Fan, W. Nano Letters, Vol. 10, Issue 7 https://doi.org/10.1021/nl101457k	journal	July 2010
Assessment of deviatoric lattice strain uncertainty for polychromatic X-ray microdiffraction experiments Poshadel, Andrew; Dawson, Paul; Johnson, George Journal of Synchrotron Radiation, Vol. 19, Issue 2 https://doi.org/10.1107/S0909049511050400	journal	January 2012
Driving force for Sn whisker growth in the system Cu–Sn Sobiech, M.; Welzel, U.; Mittemeijer, E. J. Applied Physics Letters, Vol. 93, Issue 1 https://doi.org/10.1063/1.2953973	journal	July 2008
Differential-aperture X-ray structural microscopy: a submicron-resolution three-dimensional probe of local microstructure and strain Yang, Wenge; Larson, B. C.; Tischler, J. Z. Micron, Vol. 35, Issue 6 https://doi.org/10.1016/j.micron.2004.02.004	journal	August 2004
Evidence for high stress in quartz from the impact site of Vredefort, South Africa [Evidence for high stress in quartz from the impact site of Vredefort, South Africa] Chen, Kai; Kunz, Martin; Tamura, Nobumichi European Journal of Mineralogy, Vol. 23, Issue 2 https://doi.org/10.1127/0935-1221/2011/0023-2082	journal	May 2011
The Bauschinger effect and the stresses in a strained single crystal Hu, Xiaoyu; Wei, Chao; Margolin, Harold Scripta Metallurgica et Materialia, Vol. 27, Issue 7 https://doi.org/10.1016/0956-716X(92)90407-6	journal	October 1992
Dislocation wall and cell structures and long-range internal stresses in deformed metal crystals Mughrabi, H. Acta Metallurgica, Vol. 31, Issue 9 https://doi.org/10.1016/0001-6160(83)90007-X	journal	September 1983
Dislocation dynamics and work hardening of fractal dislocation cell structures Hähner, Peter; Zaiser, Michael Materials Science and Engineering: A, Vol. 272, Issue 2 https://doi.org/10.1016/S0921-5093(99)00527-4	journal	November 1999
Statistical mechanics treatment of the evolution of dislocation distributions in single crystals El-Azab, A. Physical Review B, Vol. 61, Issue 18 https://doi.org/10.1103/PhysRevB.61.11956	journal	May 2000
Theory of Strain Percolation in Metals Thomson, Robb; Levine, L. E. Physical Review Letters, Vol. 81, Issue 18 https://doi.org/10.1103/PhysRevLett.81.3884	journal	November 1998
X-ray microdiffraction study of growth modes and crystallographic tilts in oxide films on metal substrates Budai, John D.; Yang, Wenge; Tamura, Nobumichi Nature Materials, Vol. 2, Issue 7 https://doi.org/10.1038/nmat916	journal	June 2003
Distortions and stabilization of simple-cubic calcium at high pressure and low temperature Mao, W. L.; Wang, L.; Ding, Y. Proceedings of the National Academy of Sciences, Vol. 107, Issue 22 https://doi.org/10.1073/pnas.1005279107	journal	May 2010
Three-dimensional X-ray structural microscopy with submicrometre resolution Larson, B. C.; Yang, Wenge; Ice, G. E. Nature, Vol. 415, p. 887-890 https://doi.org/10.1038/415887a	journal	February 2002
Fabrication of nested elliptical KB mirrors using profile coating for synchrotron radiation X-ray focusing Liu, Chian; Ice, G. E.; Liu, W. Applied Surface Science, Vol. 258, Issue 6 https://doi.org/10.1016/j.apsusc.2011.02.079	journal	January 2012
Crystal plasticity in Cu damascene interconnect lines undergoing electromigration as revealed by synchrotron x-ray microdiffraction Budiman, A. S.; Nix, W. D.; Tamura, N. Applied Physics Letters, Vol. 88, Issue 23 https://doi.org/10.1063/1.2210451	journal	June 2006
X-ray line-broadening study of the dislocation cell structure in deformed [001]-orientated copper single crystals Ungar, T.; Mughrabi, H.; Rönnpagel, D. Acta Metallurgica, Vol. 32, Issue 3 https://doi.org/10.1016/0001-6160(84)90106-8	journal	March 1984
Interface strength in NiAl–Mo composites from 3-D X-ray microdiffraction Barabash, R. I.; Bei, H.; Gao, Y. F. Scripta Materialia, Vol. 64, Issue 9 https://doi.org/10.1016/j.scriptamat.2011.01.028	journal	May 2011
Automated indexing for texture and strain measurement with broad-bandpass x-ray microbeams Chung, Jin-Seok; Ice, Gene E. Journal of Applied Physics, Vol. 86, Issue 9 https://doi.org/10.1063/1.371507	journal	November 1999
Nanoprobe measurements of materials at megabar pressures Wang, L.; Ding, Y.; Yang, W. Proceedings of the National Academy of Sciences, Vol. 107, Issue 14 https://doi.org/10.1073/pnas.1001141107	journal	March 2010
Long-range internal stresses and asymmetric X-ray line-broadening in tensile-deformed [001]-orientated copper single crystals Mughrabi, H.; Ungár, T.; Kienle, W. Philosophical Magazine A, Vol. 53, Issue 6 https://doi.org/10.1080/01418618608245293	journal	June 1986
Correlating whisker growth and grain structure on Sn-Cu samples by real-time scanning electron microscopy and backscattering diffraction characterization Pei, Fei; Jadhav, Nitin; Chason, Eric Applied Physics Letters, Vol. 100, Issue 22 https://doi.org/10.1063/1.4721661	journal	May 2012
The Race to X-ray Microbeam and Nanobeam Science Ice, G. E.; Budai, J. D.; Pang, J. W. L. Science, Vol. 334, Issue 6060 https://doi.org/10.1126/science.1202366	journal	December 2011
Validating classical line profile analyses using microbeam diffraction from individual dislocation cell walls and cell interiors Levine, Lyle E.; Geantil, Peter; Larson, Bennett C. Journal of Applied Crystallography, Vol. 45, Issue 2 https://doi.org/10.1107/S0021889812001616	journal	March 2012
Sample Dimensions Influence Strength and Crystal Plasticity Uchic, M. D. Science, Vol. 305, Issue 5686 https://doi.org/10.1126/science.1098993	journal	August 2004

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