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Title: Submicrometre-resolution polychromatic three-dimensional X-ray microscopy

Abstract

The ability to study the structure, microstructure and evolution of materials with increasing spatial resolution is fundamental to achieving a full understanding of the underlying science of materials. Polychromatic three-dimensional X-ray microscopy (3DXM) is a recently developed nondestructive diffraction technique that enables crystallographic phase identification, determination of local crystal orientations, grain morphologies, grain interface types and orientations, and in favorable cases direct determination of the deviatoric elastic strain tensor with submicrometre spatial resolution in all three dimensions. With the added capability of an energy-scanning incident beam monochromator, the determination of absolute lattice parameters is enabled, allowing specification of the complete elastic strain tensor with three-dimensional spatial resolution. The methods associated with 3DXM are described and key applications of 3DXM are discussed, including studies of deformation in single-crystal and polycrystalline metals and semiconductors, indentation deformation, thermal grain growth in polycrystalline aluminium, the metal–insulator transition in nanoplatelet VO 2, interface strengths in metal–matrix composites, high-pressure science, Sn whisker growth, and electromigration processes. Finally, the outlook for future developments associated with this technique is described.

Authors:
;
Publication Date:
Research Org.:
Energy Frontier Research Centers (EFRC) (United States). Center for Defect Physics in Structural Materials (CDP)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1381804
DOE Contract Number:  
AC05-00OR22725
Resource Type:
Journal Article
Journal Name:
Journal of Applied Crystallography
Additional Journal Information:
Journal Volume: 46; Journal Issue: 1; Related Information: CDP partners with Oak Ridge National Laboratory (lead); Ames Laboratory; University of California, Berkeley; Carnegie Mellon University; University of Georgia; University of Illinois, Urbana-Champaign; Ohio State University; University of Tennessee; Journal ID: ISSN 0021-8898
Publisher:
International Union of Crystallography
Country of Publication:
United States
Language:
English
Subject:
nuclear (including radiation effects), defects, mechanical behavior, spin dynamics, materials and chemistry by design

Citation Formats

Larson, B. C., and Levine, L. E. Submicrometre-resolution polychromatic three-dimensional X-ray microscopy. United States: N. p., 2012. Web. doi:10.1107/S0021889812043737.
Larson, B. C., & Levine, L. E. Submicrometre-resolution polychromatic three-dimensional X-ray microscopy. United States. doi:10.1107/S0021889812043737.
Larson, B. C., and Levine, L. E. Fri . "Submicrometre-resolution polychromatic three-dimensional X-ray microscopy". United States. doi:10.1107/S0021889812043737.
@article{osti_1381804,
title = {Submicrometre-resolution polychromatic three-dimensional X-ray microscopy},
author = {Larson, B. C. and Levine, L. E.},
abstractNote = {The ability to study the structure, microstructure and evolution of materials with increasing spatial resolution is fundamental to achieving a full understanding of the underlying science of materials. Polychromatic three-dimensional X-ray microscopy (3DXM) is a recently developed nondestructive diffraction technique that enables crystallographic phase identification, determination of local crystal orientations, grain morphologies, grain interface types and orientations, and in favorable cases direct determination of the deviatoric elastic strain tensor with submicrometre spatial resolution in all three dimensions. With the added capability of an energy-scanning incident beam monochromator, the determination of absolute lattice parameters is enabled, allowing specification of the complete elastic strain tensor with three-dimensional spatial resolution. The methods associated with 3DXM are described and key applications of 3DXM are discussed, including studies of deformation in single-crystal and polycrystalline metals and semiconductors, indentation deformation, thermal grain growth in polycrystalline aluminium, the metal–insulator transition in nanoplatelet VO2, interface strengths in metal–matrix composites, high-pressure science, Sn whisker growth, and electromigration processes. Finally, the outlook for future developments associated with this technique is described.},
doi = {10.1107/S0021889812043737},
journal = {Journal of Applied Crystallography},
issn = {0021-8898},
number = 1,
volume = 46,
place = {United States},
year = {2012},
month = {12}
}

Works referenced in this record:

Disordered long-range internal stresses in deformed copper and the mechanisms underlying plastic deformation
journal, August 2011


Plastic deformation in Al (Cu) interconnects stressed by electromigration and studied by synchrotron polychromatic x-ray microdiffraction
journal, July 2008

  • Chen, Kai; Tamura, N.; Valek, B. C.
  • Journal of Applied Physics, Vol. 104, Issue 1
  • DOI: 10.1063/1.2952073

Effects of pre-strain on the compressive stress–strain response of Mo-alloy single-crystal micropillars
journal, October 2008


Nanoscale gold pillars strengthened through dislocation starvation
journal, June 2006


Some geometrical relations in dislocated crystals
journal, March 1953


Local, submicron, strain gradients as the cause of Sn whisker growth
journal, June 2009

  • Sobiech, M.; Wohlschlögel, M.; Welzel, U.
  • Applied Physics Letters, Vol. 94, Issue 22
  • DOI: 10.1063/1.3147864

Polychromatic X-ray micro- and nanodiffraction for spatially-resolved structural studies
journal, September 2008


Survey of computed grain boundary properties in face-centered cubic metals—II: Grain boundary mobility
journal, August 2009


Spatially resolved Poisson strain and anticlastic curvature measurements in Si under large deflection bending
journal, June 2003

  • Yang, Wenge; Larson, B. C.; Ice, G. E.
  • Applied Physics Letters, Vol. 82, Issue 22
  • DOI: 10.1063/1.1579857

Experimental Characterization and Crystal Plasticity Modeling of Heterogeneous Deformation in Polycrystalline α-Ti
journal, June 2010

  • Wang, L.; Barabash, R. I.; Yang, Y.
  • Metallurgical and Materials Transactions A, Vol. 42, Issue 3
  • DOI: 10.1007/s11661-010-0249-8

X-ray microbeam measurements of individual dislocation cell elastic strains in deformed single-crystal copper
journal, July 2006

  • Levine, Lyle E.; Larson, Bennett C.; Yang, Wenge
  • Nature Materials, Vol. 5, Issue 8
  • DOI: 10.1038/nmat1698

White microbeam diffraction from distorted crystals
journal, August 2001

  • Barabash, R.; Ice, G. E.; Larson, B. C.
  • Applied Physics Letters, Vol. 79, Issue 6
  • DOI: 10.1063/1.1389321

Local Plasticity of Al Thin Films as Revealed by X-Ray Microdiffraction
journal, March 2003


Smaller is stronger: The effect of strain hardening
journal, December 2009


Extended Mapping and Exploration of the Vanadium Dioxide Stress-Temperature Phase Diagram
journal, July 2010


Assessment of deviatoric lattice strain uncertainty for polychromatic X-ray microdiffraction experiments
journal, January 2012

  • Poshadel, Andrew; Dawson, Paul; Johnson, George
  • Journal of Synchrotron Radiation, Vol. 19, Issue 2
  • DOI: 10.1107/S0909049511050400

Driving force for Sn whisker growth in the system Cu–Sn
journal, July 2008

  • Sobiech, M.; Welzel, U.; Mittemeijer, E. J.
  • Applied Physics Letters, Vol. 93, Issue 1
  • DOI: 10.1063/1.2953973

Dislocation dynamics and work hardening of fractal dislocation cell structures
journal, November 1999


X-ray microdiffraction study of growth modes and crystallographic tilts in oxide films on metal substrates
journal, June 2003

  • Budai, John D.; Yang, Wenge; Tamura, Nobumichi
  • Nature Materials, Vol. 2, Issue 7
  • DOI: 10.1038/nmat916

Distortions and stabilization of simple-cubic calcium at high pressure and low temperature
journal, May 2010

  • Mao, W. L.; Wang, L.; Ding, Y.
  • Proceedings of the National Academy of Sciences, Vol. 107, Issue 22
  • DOI: 10.1073/pnas.1005279107

Three-dimensional X-ray structural microscopy with submicrometre resolution
journal, February 2002

  • Larson, B. C.; Yang, Wenge; Ice, G. E.
  • Nature, Vol. 415, p. 887-890
  • DOI: 10.1038/415887a

Crystal plasticity in Cu damascene interconnect lines undergoing electromigration as revealed by synchrotron x-ray microdiffraction
journal, June 2006

  • Budiman, A. S.; Nix, W. D.; Tamura, N.
  • Applied Physics Letters, Vol. 88, Issue 23
  • DOI: 10.1063/1.2210451

X-ray line-broadening study of the dislocation cell structure in deformed [001]-orientated copper single crystals
journal, March 1984


Interface strength in NiAl–Mo composites from 3-D X-ray microdiffraction
journal, May 2011


Automated indexing for texture and strain measurement with broad-bandpass x-ray microbeams
journal, November 1999

  • Chung, Jin-Seok; Ice, Gene E.
  • Journal of Applied Physics, Vol. 86, Issue 9
  • DOI: 10.1063/1.371507

Nanoprobe measurements of materials at megabar pressures
journal, March 2010

  • Wang, L.; Ding, Y.; Yang, W.
  • Proceedings of the National Academy of Sciences, Vol. 107, Issue 14
  • DOI: 10.1073/pnas.1001141107

The Race to X-ray Microbeam and Nanobeam Science
journal, December 2011


Validating classical line profile analyses using microbeam diffraction from individual dislocation cell walls and cell interiors
journal, March 2012

  • Levine, Lyle E.; Geantil, Peter; Larson, Bennett C.
  • Journal of Applied Crystallography, Vol. 45, Issue 2
  • DOI: 10.1107/S0021889812001616

Sample Dimensions Influence Strength and Crystal Plasticity
journal, August 2004