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Title: Note: Setup for chemical atmospheric control during in situ grazing incidence X-ray scattering of printed thin films

Abstract

In order to tailor the assembling of polymers and organic molecules, a deeper understanding of the kinetics involved in thin film production is necessary. While post-production characterization only provides insight on the final film structure, more sophisticated experimental setups are needed to probe the structure formation processes in situ during deposition. The drying kinetics of a deposited organic thin film strongly influences the assembling process on the nanometer scale. Lastly, this work presents an experimental setup that enables fine control of the atmosphere composition surrounding the sample during slot die coating, while simultaneously probing the film formation kinetics using in situ grazing incidence X-ray scattering and spectroscopy.

Authors:
ORCiD logo [1];  [2];  [3];  [3];  [3];  [2];  [3]; ORCiD logo [4]
  1. Technische Univ. Munchen, Garching (Germany). Munich School of Engineering, Herzig Group
  2. Technische Univ. Munchen, Garching (Germany). Physik Dept., Lehrstuhl fur Funktionelle Materialien
  3. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Advanced Light Source (ALS)
  4. Technische Univ. Munchen, Garching (Germany). Munich School of Engineering, Herzig Group; Univ. of Bayreuth (Germany). Experimentalphysik II
Publication Date:
Research Org.:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1379872
Alternate Identifier(s):
OSTI ID: 1366555
Grant/Contract Number:
AC02-05CH11231
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 88; Journal Issue: 6; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; Thin film structure; Solvents; Metallic thin films; Copper; Thin film flows

Citation Formats

Pröller, Stephan, Moseguí González, Daniel, Zhu, Chenhuii, Schaible, Eric, Wang, Cheng, Müller-Buschbaum, Peter, Hexemer, Alexander, and Herzig, Eva M. Note: Setup for chemical atmospheric control during in situ grazing incidence X-ray scattering of printed thin films. United States: N. p., 2017. Web. doi:10.1063/1.4984130.
Pröller, Stephan, Moseguí González, Daniel, Zhu, Chenhuii, Schaible, Eric, Wang, Cheng, Müller-Buschbaum, Peter, Hexemer, Alexander, & Herzig, Eva M. Note: Setup for chemical atmospheric control during in situ grazing incidence X-ray scattering of printed thin films. United States. doi:10.1063/1.4984130.
Pröller, Stephan, Moseguí González, Daniel, Zhu, Chenhuii, Schaible, Eric, Wang, Cheng, Müller-Buschbaum, Peter, Hexemer, Alexander, and Herzig, Eva M. Thu . "Note: Setup for chemical atmospheric control during in situ grazing incidence X-ray scattering of printed thin films". United States. doi:10.1063/1.4984130. https://www.osti.gov/servlets/purl/1379872.
@article{osti_1379872,
title = {Note: Setup for chemical atmospheric control during in situ grazing incidence X-ray scattering of printed thin films},
author = {Pröller, Stephan and Moseguí González, Daniel and Zhu, Chenhuii and Schaible, Eric and Wang, Cheng and Müller-Buschbaum, Peter and Hexemer, Alexander and Herzig, Eva M.},
abstractNote = {In order to tailor the assembling of polymers and organic molecules, a deeper understanding of the kinetics involved in thin film production is necessary. While post-production characterization only provides insight on the final film structure, more sophisticated experimental setups are needed to probe the structure formation processes in situ during deposition. The drying kinetics of a deposited organic thin film strongly influences the assembling process on the nanometer scale. Lastly, this work presents an experimental setup that enables fine control of the atmosphere composition surrounding the sample during slot die coating, while simultaneously probing the film formation kinetics using in situ grazing incidence X-ray scattering and spectroscopy.},
doi = {10.1063/1.4984130},
journal = {Review of Scientific Instruments},
number = 6,
volume = 88,
place = {United States},
year = {Thu Jun 01 00:00:00 EDT 2017},
month = {Thu Jun 01 00:00:00 EDT 2017}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record

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