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Title: Quantitative microstructural imaging by scanning Laue x-ray micro- and nanodiffraction

Abstract

We present that local crystal structure, crystal orientation, and crystal deformation can all be probed by Laue diffraction using a submicron x-ray beam. This technique, employed at a synchrotron facility, is particularly suitable for fast mapping the mechanical and microstructural properties of inhomogeneous multiphase polycrystalline samples, as well as imperfect epitaxial films or crystals. As synchrotron Laue x-ray microdiffraction enters its 20th year of existence and new synchrotron nanoprobe facilities are being built and commissioned around the world, we take the opportunity to overview current capabilities as well as the latest technical developments. Fast data collection provided by state-of-the-art area detectors and fully automated pattern indexing algorithms optimized for speed make it possible to map large portions of a sample with fine step size and obtain quantitative images of its microstructure in near real time. Lastly, we extrapolate how the technique is anticipated to evolve in the near future and its potential emerging applications at a free-electron laser facility.

Authors:
 [1];  [2];  [3];  [4];  [5]
  1. Hong Kong University of Science and Technology (China). Department of Mechanical and Aerospace Engineering
  2. ETH Zurich (Switzerland). Department of Materials
  3. Univ. of Central Florida, Orlando, FL (United States). Department of Materials Science and Engineering and Advanced Materials Processing and Analysis Center
  4. National Synchrotron Radiation Research Center (Taiwan). Scientific Research Division
  5. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Advanced Light Source (ALS)
Publication Date:
Research Org.:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1379389
Grant/Contract Number:  
AC02-05CH11231
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
MRS Bulletin
Additional Journal Information:
Journal Volume: 41; Journal Issue: 06; Journal ID: ISSN 0883-7694
Publisher:
Materials Research Society
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; x-ray diffraction; crystallographic structure; phase transformation

Citation Formats

Chen, Xian, Dejoie, Catherine, Jiang, Tengfei, Ku, Ching-Shun, and Tamura, Nobumichi. Quantitative microstructural imaging by scanning Laue x-ray micro- and nanodiffraction. United States: N. p., 2016. Web. doi:10.1557/mrs.2016.97.
Chen, Xian, Dejoie, Catherine, Jiang, Tengfei, Ku, Ching-Shun, & Tamura, Nobumichi. Quantitative microstructural imaging by scanning Laue x-ray micro- and nanodiffraction. United States. doi:10.1557/mrs.2016.97.
Chen, Xian, Dejoie, Catherine, Jiang, Tengfei, Ku, Ching-Shun, and Tamura, Nobumichi. Wed . "Quantitative microstructural imaging by scanning Laue x-ray micro- and nanodiffraction". United States. doi:10.1557/mrs.2016.97. https://www.osti.gov/servlets/purl/1379389.
@article{osti_1379389,
title = {Quantitative microstructural imaging by scanning Laue x-ray micro- and nanodiffraction},
author = {Chen, Xian and Dejoie, Catherine and Jiang, Tengfei and Ku, Ching-Shun and Tamura, Nobumichi},
abstractNote = {We present that local crystal structure, crystal orientation, and crystal deformation can all be probed by Laue diffraction using a submicron x-ray beam. This technique, employed at a synchrotron facility, is particularly suitable for fast mapping the mechanical and microstructural properties of inhomogeneous multiphase polycrystalline samples, as well as imperfect epitaxial films or crystals. As synchrotron Laue x-ray microdiffraction enters its 20th year of existence and new synchrotron nanoprobe facilities are being built and commissioned around the world, we take the opportunity to overview current capabilities as well as the latest technical developments. Fast data collection provided by state-of-the-art area detectors and fully automated pattern indexing algorithms optimized for speed make it possible to map large portions of a sample with fine step size and obtain quantitative images of its microstructure in near real time. Lastly, we extrapolate how the technique is anticipated to evolve in the near future and its potential emerging applications at a free-electron laser facility.},
doi = {10.1557/mrs.2016.97},
journal = {MRS Bulletin},
issn = {0883-7694},
number = 06,
volume = 41,
place = {United States},
year = {2016},
month = {6}
}

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Cited by: 8 works
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    Works referencing / citing this record:

    Quantifying yield behaviour in metals by X-ray nanotomography
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    Quantifying yield behaviour in metals by X-ray nanotomography
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