High pressure effects on U L 3 x-ray absorption in partial fluorescence yield mode and single crystal x-ray diffraction in the heavy fermion compound UCd 11

Nasreen, Farzana; Antonio, Daniel; VanGennep, Derrick; Booth, Corwin H.; Kothapalli, Karunakar; Bauer, Eric D.; Sarrao, John L.; Lavina, Barbara; Iota-Herbei, Valentin; Sinogeikin, Stanislav; Chow, Paul; Xiao, Yuming; Zhao, Yusheng; Cornelius, Andrew L.

doi:10.1088/0953-8984/28/10/105601

Title: High pressure effects on U L ₃ x-ray absorption in partial fluorescence yield mode and single crystal x-ray diffraction in the heavy fermion compound UCd ₁₁

Journal Article · Mon Feb 15 00:00:00 EST 2016 · Journal of Physics. Condensed Matter

DOI:https://doi.org/10.1088/0953-8984/28/10/105601· OSTI ID:1307470

Nasreen, Farzana ^[1]; Antonio, Daniel ^[1]; VanGennep, Derrick ^[2]; Booth, Corwin H. ^[3]; Kothapalli, Karunakar ^[4]; Bauer, Eric D. ^[5]; Sarrao, John L. ^[5]; Lavina, Barbara ^[1]; Iota-Herbei, Valentin ^[1]; Sinogeikin, Stanislav ^[6]; Chow, Paul ^[6]; Xiao, Yuming ^[6]; Zhao, Yusheng ^[1]; Cornelius, Andrew L. ^[1]

Univ. of Nevada, Las Vegas, NV (United States)
Univ. of Florida, Gainesville, FL (United States)
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Ames Lab., Ames, IA (United States)
Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
Argonne National Lab. (ANL), Argonne, IL (United States). Carnegie Inst. of Washington

© 2016 IOP Publishing Ltd. We report a study of high pressure x-ray absorption (XAS) performed in the partial fluorescence yield mode (PFY) at the U L 3 edge (0-28.2 GPa) and single crystal x-ray diffraction (SXD) (0-20 GPa) on the UCd 11 heavy fermion compound at room temperature. Under compression, the PFY-XAS results show that the white line is shifted by +4.1(3) eV at the highest applied pressure of 28.2 GPa indicating delocalization of the 5f electrons. The increase in full width at half maxima and decrease in relative amplitude of the white line with respect to the edge jump point towards 6d band broadening under high pressure. A bulk modulus of K 0 = 62(1) GPa and its pressure derivative, = 4.9(2) was determined from high pressure SXD results. Both the PFY-XAS and diffraction results do not show any sign of a structural phase transition in the applied pressure range.

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Research Organization:: Univ. of Nevada, Las Vegas, NV (United States); Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States); Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES); USDOE National Nuclear Security Administration (NNSA)

Grant/Contract Number:: SC0005278; AC02-05CH11231; AC52-06NA25396

OSTI ID:: 1307470

Alternate ID(s):: OSTI ID: 1379093; OSTI ID: 1407874

Report Number(s):: DOE-UNLV-05278; LA-UR-16-24577

Journal Information:: Journal of Physics. Condensed Matter, Vol. 28, Issue 10; ISSN 0953-8984

Publisher:: IOP PublishingCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 8 works

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References (40)

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Title: High pressure effects on U L 3 x-ray absorption in partial fluorescence yield mode and single crystal x-ray diffraction in the heavy fermion compound UCd 11

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Title: High pressure effects on U L ₃ x-ray absorption in partial fluorescence yield mode and single crystal x-ray diffraction in the heavy fermion compound UCd ₁₁