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Title: Inexpensive Method of Qualifying Piezoresistive Thin-Film Pressure Gauges

Authors:
 [1]; ORCiD logo [1];  [1];  [1];  [1]
  1. Los Alamos National Laboratory
Publication Date:
Research Org.:
Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1378911
Report Number(s):
LA-UR-17-27852
DOE Contract Number:  
AC52-06NA25396
Resource Type:
Conference
Resource Relation:
Conference: APS Sock Compression of Condensed Matter ; 2017-07-09 - 2017-07-09 ; St. Louis, Missouri, United States
Country of Publication:
United States
Language:
English

Citation Formats

Armstrong, Christopher Lee, Rae, Philip John, Tasker, Douglas George, Heatwole, Eric Mann, and Broilo, Robert M. Inexpensive Method of Qualifying Piezoresistive Thin-Film Pressure Gauges. United States: N. p., 2017. Web.
Armstrong, Christopher Lee, Rae, Philip John, Tasker, Douglas George, Heatwole, Eric Mann, & Broilo, Robert M. Inexpensive Method of Qualifying Piezoresistive Thin-Film Pressure Gauges. United States.
Armstrong, Christopher Lee, Rae, Philip John, Tasker, Douglas George, Heatwole, Eric Mann, and Broilo, Robert M. Thu . "Inexpensive Method of Qualifying Piezoresistive Thin-Film Pressure Gauges". United States. https://www.osti.gov/servlets/purl/1378911.
@article{osti_1378911,
title = {Inexpensive Method of Qualifying Piezoresistive Thin-Film Pressure Gauges},
author = {Armstrong, Christopher Lee and Rae, Philip John and Tasker, Douglas George and Heatwole, Eric Mann and Broilo, Robert M.},
abstractNote = {},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2017},
month = {8}
}

Conference:
Other availability
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