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Title: Defining Threshold Values of Encapsulant and Backsheet Adhesion for PV Module Reliability: Preprint

Abstract

The width-tapered cantilever beam method is used to quantify the debond energy (adhesion) of encapsulant and backsheet structures of 27 modules collected from the field. The collected population of modules contains both those that have remained in-tact and those with instances of either or both encapsulant and backsheet delamination. From this survey, initial threshold values (an adhesion value above which a module should remain intact throughout its lifetime) for encapsulant and backsheet interfaces are proposed. For encapsulants this value is about 60 J/m2 and for backsheets about 20 J/m2. It is expected that these values will continue to be refined and evolve as the width-tapered cantilever beam method becomes adopted by the PV industry, and that they may aid in the future improvement of accelerated lifetime tests and the development of new, low-cost materials.

Authors:
 [1];  [1];  [1];  [2];  [2]
  1. National Renewable Energy Laboratory (NREL), Golden, CO (United States)
  2. Stanford University
Publication Date:
Research Org.:
National Renewable Energy Lab. (NREL), Golden, CO (United States)
Sponsoring Org.:
USDOE Office of Energy Efficiency and Renewable Energy (EERE), Solar Energy Technologies Office (EE-4S)
OSTI Identifier:
1378265
Report Number(s):
NREL/CP-5J00-67767
Journal ID: ISSN 2156--3381
DOE Contract Number:  
AC36-08GO28308
Resource Type:
Conference
Resource Relation:
Journal Volume: 7; Journal Issue: 6; Conference: Presented at the 2017 IEEE 44th Photovoltaic Specialists Conference (PVSC), 25-30 June 2017, Washington, DC
Country of Publication:
United States
Language:
English
Subject:
14 SOLAR ENERGY; PV module reliability; encapsulant; backsheet; adhesion

Citation Formats

Bosco, Nicholas S, Kurtz, Sarah, Eafanti, Joshua, Tracy, Jared, and Dauskardt, Reinhold. Defining Threshold Values of Encapsulant and Backsheet Adhesion for PV Module Reliability: Preprint. United States: N. p., 2017. Web. doi:10.1109/JPHOTOV.2017.2746682.
Bosco, Nicholas S, Kurtz, Sarah, Eafanti, Joshua, Tracy, Jared, & Dauskardt, Reinhold. Defining Threshold Values of Encapsulant and Backsheet Adhesion for PV Module Reliability: Preprint. United States. doi:10.1109/JPHOTOV.2017.2746682.
Bosco, Nicholas S, Kurtz, Sarah, Eafanti, Joshua, Tracy, Jared, and Dauskardt, Reinhold. Mon . "Defining Threshold Values of Encapsulant and Backsheet Adhesion for PV Module Reliability: Preprint". United States. doi:10.1109/JPHOTOV.2017.2746682. https://www.osti.gov/servlets/purl/1378265.
@article{osti_1378265,
title = {Defining Threshold Values of Encapsulant and Backsheet Adhesion for PV Module Reliability: Preprint},
author = {Bosco, Nicholas S and Kurtz, Sarah and Eafanti, Joshua and Tracy, Jared and Dauskardt, Reinhold},
abstractNote = {The width-tapered cantilever beam method is used to quantify the debond energy (adhesion) of encapsulant and backsheet structures of 27 modules collected from the field. The collected population of modules contains both those that have remained in-tact and those with instances of either or both encapsulant and backsheet delamination. From this survey, initial threshold values (an adhesion value above which a module should remain intact throughout its lifetime) for encapsulant and backsheet interfaces are proposed. For encapsulants this value is about 60 J/m2 and for backsheets about 20 J/m2. It is expected that these values will continue to be refined and evolve as the width-tapered cantilever beam method becomes adopted by the PV industry, and that they may aid in the future improvement of accelerated lifetime tests and the development of new, low-cost materials.},
doi = {10.1109/JPHOTOV.2017.2746682},
journal = {},
number = 6,
volume = 7,
place = {United States},
year = {Mon Aug 28 00:00:00 EDT 2017},
month = {Mon Aug 28 00:00:00 EDT 2017}
}

Conference:
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