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Title: Quantitative analysis of total reflection X-ray fluorescence from finely layered structures using XeRay

Abstract

Total reflection x-ray fluorescence (TXRF) is a widely applicable experimental technique for studying chemical element distributions across finely layered structures at extremely high sensitivity. To promote and facilitate scientific discovery using TXRF, we developed a MATLAB-based software package with a graphical user interface, named XeRay, for quick, accurate, and intuitive data analysis. XeRay lets the user model any layered system, each layer with its independent chemical composition and thickness, and enables fine-tuned data fitting. The accuracy of XeRay has been tested in the analysis of TXRF data from both air/liquid interface and liquid/liquid interfacial studies and has been compared to literature results. In an air/liquid interface study, Ca2+ sequestration was measured at a Langmuir monolayer of 1-stearoyl-2-oleoyl-sn-glycero-3-phosphatidic acid (SOPA) on a buffer solution of 1 mM CaCl2 at pH 7.5. Data analysis with XeRay reveals that each 1 nm2 of interfacial area contains 2.38 ± 0.06 Ca2+ ions, which corresponds to a 1:1 ratio between SOPA headgroups and Ca2+ ions, consistent with several earlier reports. For the liquid/liquid interface study of Sr2+ enrichment at the dodecane/surfactant/water interface, analysis using XeRay gives a surface enrichment of Sr2+ at 68+6-568-5+6 Å2 per ion, consistent with the result published for the same dataset.

Authors:
 [1];  [2];  [1];  [1];  [3]; ORCiD logo [1];  [1];  [4]; ORCiD logo [5];  [6]
  1. James Franck Institute, The University of Chicago, Chicago, Illinois 60637, USA; Department of Chemistry, The University of Chicago, Chicago, Illinois 60637, USA
  2. Program in the Biophysical Sciences, Institute for Biophysical Dynamics, The University of Chicago, Chicago, Illinois 60637, USA
  3. The College, The University of Chicago, Chicago, Illinois 60637, USA
  4. James Franck Institute, The University of Chicago, Chicago, Illinois 60637, USA; Center for Advanced Radiation Sources, The University of Chicago, Chicago, Illinois 60637, USA
  5. Center for Advanced Radiation Sources, The University of Chicago, Chicago, Illinois 60637, USA
  6. James Franck Institute, The University of Chicago, Chicago, Illinois 60637, USA; Department of Chemistry, The University of Chicago, Chicago, Illinois 60637, USA; Center for Advanced Radiation Sources, The University of Chicago, Chicago, Illinois 60637, USA
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
Sponsoring Org.:
NSFUNIVERSITY
OSTI Identifier:
1377924
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 88; Journal Issue: 3
Country of Publication:
United States
Language:
ENGLISH
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY

Citation Formats

Gong, Zhiliang, Kerr, Daniel, Hwang, Hyeondo Luke, Henderson, J. Michael, Suwatthee, Tiffany, Slaw, Benjamin R., Cao, Kathleen D., Lin, Binhua, Bu, Wei, and Lee, Ka Yee C.. Quantitative analysis of total reflection X-ray fluorescence from finely layered structures using XeRay. United States: N. p., 2017. Web. doi:10.1063/1.4978654.
Gong, Zhiliang, Kerr, Daniel, Hwang, Hyeondo Luke, Henderson, J. Michael, Suwatthee, Tiffany, Slaw, Benjamin R., Cao, Kathleen D., Lin, Binhua, Bu, Wei, & Lee, Ka Yee C.. Quantitative analysis of total reflection X-ray fluorescence from finely layered structures using XeRay. United States. doi:10.1063/1.4978654.
Gong, Zhiliang, Kerr, Daniel, Hwang, Hyeondo Luke, Henderson, J. Michael, Suwatthee, Tiffany, Slaw, Benjamin R., Cao, Kathleen D., Lin, Binhua, Bu, Wei, and Lee, Ka Yee C.. Wed . "Quantitative analysis of total reflection X-ray fluorescence from finely layered structures using XeRay". United States. doi:10.1063/1.4978654.
@article{osti_1377924,
title = {Quantitative analysis of total reflection X-ray fluorescence from finely layered structures using XeRay},
author = {Gong, Zhiliang and Kerr, Daniel and Hwang, Hyeondo Luke and Henderson, J. Michael and Suwatthee, Tiffany and Slaw, Benjamin R. and Cao, Kathleen D. and Lin, Binhua and Bu, Wei and Lee, Ka Yee C.},
abstractNote = {Total reflection x-ray fluorescence (TXRF) is a widely applicable experimental technique for studying chemical element distributions across finely layered structures at extremely high sensitivity. To promote and facilitate scientific discovery using TXRF, we developed a MATLAB-based software package with a graphical user interface, named XeRay, for quick, accurate, and intuitive data analysis. XeRay lets the user model any layered system, each layer with its independent chemical composition and thickness, and enables fine-tuned data fitting. The accuracy of XeRay has been tested in the analysis of TXRF data from both air/liquid interface and liquid/liquid interfacial studies and has been compared to literature results. In an air/liquid interface study, Ca2+ sequestration was measured at a Langmuir monolayer of 1-stearoyl-2-oleoyl-sn-glycero-3-phosphatidic acid (SOPA) on a buffer solution of 1 mM CaCl2 at pH 7.5. Data analysis with XeRay reveals that each 1 nm2 of interfacial area contains 2.38 ± 0.06 Ca2+ ions, which corresponds to a 1:1 ratio between SOPA headgroups and Ca2+ ions, consistent with several earlier reports. For the liquid/liquid interface study of Sr2+ enrichment at the dodecane/surfactant/water interface, analysis using XeRay gives a surface enrichment of Sr2+ at 68+6-568-5+6 Å2 per ion, consistent with the result published for the same dataset.},
doi = {10.1063/1.4978654},
journal = {Review of Scientific Instruments},
number = 3,
volume = 88,
place = {United States},
year = {Wed Mar 01 00:00:00 EST 2017},
month = {Wed Mar 01 00:00:00 EST 2017}
}