Texture Manipulation and Its Impact on Electrical Properties of Zinc Phosphide Thin Films

Journal Article · Fri Mar 13 00:00:00 EDT 2015 · Journal of Electronic Materials

DOI:https://doi.org/10.1007/s11664-015-3699-3· OSTI ID:1377794

Cimaroli, Alex; Paquin, Brooke; Paduel, Naba; Moutinho, Helio; Al-Jassim, Mowafak M.; Yan, Yanfa

Both randomly oriented and highly (220) textured thin films of zinc phosphide (Zn3P2) were grown by the close-space sublimation method. The effect of deposition parameters, such as pressure and substrate temperature, on the texture evolution has been established. It was found that the deposition temperature plays a dominant role in determining the preferred orientation whereas the ambient pressure (below 10 Torr) does not greatly affect the film texture. We further found that the microstrain changes from tensile at lower deposition temperatures to compressive at higher deposition temperatures. The preferred orientation also had a strong impact on the electrical resistivity of the films. The results provide guidance on the selection of substrate and deposition parameters to grow Zn3P2 thin films with desirable properties.

• Research Organization: National Renewable Energy Laboratory (NREL), Golden, CO (United States)
• Sponsoring Organization: USDOE Office of Energy Efficiency and Renewable Energy (EERE)
• DOE Contract Number: AC36-08GO28308
• OSTI ID: 1377794
• Report Number(s): NREL/JA-5K00-70010
• Journal Information: Journal of Electronic Materials, Vol. 44, Issue 8; ISSN 0361-5235
• Publisher: Springer
• Country of Publication: United States
• Language: English

Related Subjects

14 SOLAR ENERGY
Zn3P2
close-space submission
texture
preferred orientation