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Title: High-Fidelity Two-Qubit Quantum Gates in a Scalable Ion Trap.

Abstract

Abstract not provided.

Authors:
; ; ; ; ; ; ; ;
Publication Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
IARPA
OSTI Identifier:
1376809
Report Number(s):
SAND2016-8059C
646730
DOE Contract Number:  
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Conference: Proposed for presentation at the European Conference on Trapped Ions (ECTI).
Country of Publication:
United States
Language:
English

Citation Formats

Maunz, Peter Lukas Wilhelm, Lobser, Daniel, Blume-Kohout, Robin J, Fortier, Kevin Michael, Mizrahi, Jonathan, Nielsen, Erik, Rudinger, Kenneth Michael, Stick, Daniel Lynn, and Blain, Matthew G. High-Fidelity Two-Qubit Quantum Gates in a Scalable Ion Trap.. United States: N. p., 2016. Web.
Maunz, Peter Lukas Wilhelm, Lobser, Daniel, Blume-Kohout, Robin J, Fortier, Kevin Michael, Mizrahi, Jonathan, Nielsen, Erik, Rudinger, Kenneth Michael, Stick, Daniel Lynn, & Blain, Matthew G. High-Fidelity Two-Qubit Quantum Gates in a Scalable Ion Trap.. United States.
Maunz, Peter Lukas Wilhelm, Lobser, Daniel, Blume-Kohout, Robin J, Fortier, Kevin Michael, Mizrahi, Jonathan, Nielsen, Erik, Rudinger, Kenneth Michael, Stick, Daniel Lynn, and Blain, Matthew G. Mon . "High-Fidelity Two-Qubit Quantum Gates in a Scalable Ion Trap.". United States. doi:. https://www.osti.gov/servlets/purl/1376809.
@article{osti_1376809,
title = {High-Fidelity Two-Qubit Quantum Gates in a Scalable Ion Trap.},
author = {Maunz, Peter Lukas Wilhelm and Lobser, Daniel and Blume-Kohout, Robin J and Fortier, Kevin Michael and Mizrahi, Jonathan and Nielsen, Erik and Rudinger, Kenneth Michael and Stick, Daniel Lynn and Blain, Matthew G.},
abstractNote = {Abstract not provided.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Mon Aug 01 00:00:00 EDT 2016},
month = {Mon Aug 01 00:00:00 EDT 2016}
}

Conference:
Other availability
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