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Title: Artifact mitigation of ptychography integrated with on-the-fly scanning probe microscopy

Abstract

In this paper, we report our experiences with conducting ptychography simultaneously with the X-ray fluorescence measurement using the on-the-fly mode for efficient multi-modality imaging. We demonstrate that the periodic artifact inherent to the raster scan pattern can be mitigated using a sufficiently fine scan step size to provide an overlap ratio of >70%. This allows us to obtain transmitted phase contrast images with enhanced spatial resolution from ptychography while maintaining the fluorescence imaging with continuous-motion scans on pixelated grids. Lastly, this capability will greatly improve the competence and throughput of scanning probe X-ray microscopy.

Authors:
ORCiD logo [1];  [1];  [1];  [1]; ORCiD logo [1];  [2];  [1]
  1. Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source II (NSLS-II)
  2. Brookhaven National Lab. (BNL), Upton, NY (United States). Condensed Matter Physics and Materials Department; Research Complex at Harwell, Didcot (United Kingdom); Univ. College London (United Kingdom). London Centre for Nanotechnology
Publication Date:
Research Org.:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1376127
Alternate Identifier(s):
OSTI ID: 1369084
Report Number(s):
BNL-114060-2017-JA
Journal ID: ISSN 0003-6951
Grant/Contract Number:
SC0012704
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 111; Journal Issue: 2; Journal ID: ISSN 0003-6951
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Huang, Xiaojing, Yan, Hanfei, Ge, Mingyuan, Öztürk, Hande, Nazaretski, Evgeny, Robinson, Ian K., and Chu, Yong S. Artifact mitigation of ptychography integrated with on-the-fly scanning probe microscopy. United States: N. p., 2017. Web. doi:10.1063/1.4993744.
Huang, Xiaojing, Yan, Hanfei, Ge, Mingyuan, Öztürk, Hande, Nazaretski, Evgeny, Robinson, Ian K., & Chu, Yong S. Artifact mitigation of ptychography integrated with on-the-fly scanning probe microscopy. United States. doi:10.1063/1.4993744.
Huang, Xiaojing, Yan, Hanfei, Ge, Mingyuan, Öztürk, Hande, Nazaretski, Evgeny, Robinson, Ian K., and Chu, Yong S. Tue . "Artifact mitigation of ptychography integrated with on-the-fly scanning probe microscopy". United States. doi:10.1063/1.4993744. https://www.osti.gov/servlets/purl/1376127.
@article{osti_1376127,
title = {Artifact mitigation of ptychography integrated with on-the-fly scanning probe microscopy},
author = {Huang, Xiaojing and Yan, Hanfei and Ge, Mingyuan and Öztürk, Hande and Nazaretski, Evgeny and Robinson, Ian K. and Chu, Yong S.},
abstractNote = {In this paper, we report our experiences with conducting ptychography simultaneously with the X-ray fluorescence measurement using the on-the-fly mode for efficient multi-modality imaging. We demonstrate that the periodic artifact inherent to the raster scan pattern can be mitigated using a sufficiently fine scan step size to provide an overlap ratio of >70%. This allows us to obtain transmitted phase contrast images with enhanced spatial resolution from ptychography while maintaining the fluorescence imaging with continuous-motion scans on pixelated grids. Lastly, this capability will greatly improve the competence and throughput of scanning probe X-ray microscopy.},
doi = {10.1063/1.4993744},
journal = {Applied Physics Letters},
number = 2,
volume = 111,
place = {United States},
year = {Tue Jul 11 00:00:00 EDT 2017},
month = {Tue Jul 11 00:00:00 EDT 2017}
}

Journal Article:
Free Publicly Available Full Text
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Cited by: 2 works
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