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Title: Atomic Structure and Chemistry of Self-Assembled Nanopillar Composite Oxides

Authors:
 [1];  [2];  [2];  [3]
  1. Electron Microscopy Laboratory, School of Physics, Peking University, Beijing 100871 China
  2. Department of Physics and Astronomy, Louisiana State University, Baton Rouge LA 70810 USA
  3. Electron Microscopy Laboratory, School of Physics, Peking University, Beijing 100871 China, Collaborative Innovation Center of Quantum Matter, Beijing 100871 China
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1374661
Grant/Contract Number:  
SC0002136
Resource Type:
Journal Article: Publisher's Accepted Manuscript
Journal Name:
Advanced Materials Interfaces
Additional Journal Information:
Journal Name: Advanced Materials Interfaces Journal Volume: 4 Journal Issue: 13; Journal ID: ISSN 2196-7350
Publisher:
Wiley-VCH
Country of Publication:
Germany
Language:
English

Citation Formats

Ma, Xiumei, Liao, Zhaoliang, Li, Lin, and Gao, Peng. Atomic Structure and Chemistry of Self-Assembled Nanopillar Composite Oxides. Germany: N. p., 2017. Web. doi:10.1002/admi.201700225.
Ma, Xiumei, Liao, Zhaoliang, Li, Lin, & Gao, Peng. Atomic Structure and Chemistry of Self-Assembled Nanopillar Composite Oxides. Germany. doi:10.1002/admi.201700225.
Ma, Xiumei, Liao, Zhaoliang, Li, Lin, and Gao, Peng. Wed . "Atomic Structure and Chemistry of Self-Assembled Nanopillar Composite Oxides". Germany. doi:10.1002/admi.201700225.
@article{osti_1374661,
title = {Atomic Structure and Chemistry of Self-Assembled Nanopillar Composite Oxides},
author = {Ma, Xiumei and Liao, Zhaoliang and Li, Lin and Gao, Peng},
abstractNote = {},
doi = {10.1002/admi.201700225},
journal = {Advanced Materials Interfaces},
number = 13,
volume = 4,
place = {Germany},
year = {Wed May 10 00:00:00 EDT 2017},
month = {Wed May 10 00:00:00 EDT 2017}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record at 10.1002/admi.201700225

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Works referenced in this record:

Quantitative measurement of displacement and strain fields from HREM micrographs
journal, August 1998