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Title: Double-shot MeV electron diffraction and microscopy

Journal Article · · Structural Dynamics
DOI:https://doi.org/10.1063/1.4983390· OSTI ID:1374551
 [1];  [1];  [1]
  1. Univ. of California, Los Angeles, CA (United States). Dept. of Physics and Astronomy

Here in this paper, we study by numerical simulations a time-resolved MeV electron scattering mode where two consecutive electron pulses are used to capture the evolution of a material sample on 10 ps time scales. The two electron pulses are generated by illuminating a photocathode in a radiofrequency photogun by two short laser pulses with adjustable delay. A streak camera/deflecting cavity is used after the sample to project the two electron bunches on two well separated regions of the detector screen. By using sufficiently short pulses, the 2D spatial information from each snapshot can be preserved. This “double-shot” technique enables the efficient capture of irreversible dynamics in both diffraction and imaging modes. Finally, in this work, we demonstrate both modes in start-to-end simulations of the UCLA Pegasus MeV microscope column.

Research Organization:
Radiabeam Technologies, LLC, Santa Monica, CA (United States)
Sponsoring Organization:
USDOE Office of Science (SC); National Science Foundation (NSF)
Grant/Contract Number:
SC0013115; DMR 1548924
OSTI ID:
1374551
Journal Information:
Structural Dynamics, Vol. 4, Issue 4; ISSN 2329-7778
Publisher:
American Crystallographic Association/AIPCopyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 3 works
Citation information provided by
Web of Science

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Cited By (2)

Femtosecond phase-transition in hard x-ray excited bismuth text January 2019
Femtosecond phase-transition in hard x-ray excited bismuth journal January 2019

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