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Title: Double-shot MeV electron diffraction and microscopy

Abstract

Here in this paper, we study by numerical simulations a time-resolved MeV electron scattering mode where two consecutive electron pulses are used to capture the evolution of a material sample on 10 ps time scales. The two electron pulses are generated by illuminating a photocathode in a radiofrequency photogun by two short laser pulses with adjustable delay. A streak camera/deflecting cavity is used after the sample to project the two electron bunches on two well separated regions of the detector screen. By using sufficiently short pulses, the 2D spatial information from each snapshot can be preserved. This “double-shot” technique enables the efficient capture of irreversible dynamics in both diffraction and imaging modes. Finally, in this work, we demonstrate both modes in start-to-end simulations of the UCLA Pegasus MeV microscope column.

Authors:
 [1];  [1];  [1]
  1. Univ. of California, Los Angeles, CA (United States). Dept. of Physics and Astronomy
Publication Date:
Research Org.:
Radiabeam Technologies, LLC, Santa Monica, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC); National Science Foundation (NSF)
OSTI Identifier:
1374551
Grant/Contract Number:  
SC0013115; DMR 1548924
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
Structural Dynamics
Additional Journal Information:
Journal Volume: 4; Journal Issue: 4; Journal ID: ISSN 2329-7778
Publisher:
American Crystallographic Association/AIP
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; Image sensors; Electron scattering; Electron beams; Time resolved imaging; Spatial resolution

Citation Formats

Musumeci, P., Cesar, D., and Maxson, J. Double-shot MeV electron diffraction and microscopy. United States: N. p., 2017. Web. doi:10.1063/1.4983390.
Musumeci, P., Cesar, D., & Maxson, J. Double-shot MeV electron diffraction and microscopy. United States. doi:10.1063/1.4983390.
Musumeci, P., Cesar, D., and Maxson, J. Fri . "Double-shot MeV electron diffraction and microscopy". United States. doi:10.1063/1.4983390. https://www.osti.gov/servlets/purl/1374551.
@article{osti_1374551,
title = {Double-shot MeV electron diffraction and microscopy},
author = {Musumeci, P. and Cesar, D. and Maxson, J.},
abstractNote = {Here in this paper, we study by numerical simulations a time-resolved MeV electron scattering mode where two consecutive electron pulses are used to capture the evolution of a material sample on 10 ps time scales. The two electron pulses are generated by illuminating a photocathode in a radiofrequency photogun by two short laser pulses with adjustable delay. A streak camera/deflecting cavity is used after the sample to project the two electron bunches on two well separated regions of the detector screen. By using sufficiently short pulses, the 2D spatial information from each snapshot can be preserved. This “double-shot” technique enables the efficient capture of irreversible dynamics in both diffraction and imaging modes. Finally, in this work, we demonstrate both modes in start-to-end simulations of the UCLA Pegasus MeV microscope column.},
doi = {10.1063/1.4983390},
journal = {Structural Dynamics},
number = 4,
volume = 4,
place = {United States},
year = {Fri May 19 00:00:00 EDT 2017},
month = {Fri May 19 00:00:00 EDT 2017}
}

Journal Article:
Free Publicly Available Full Text
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