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Title: Determining and Controlling the Magnesium Composition in CdTe/CdMgTe Heterostructures

Abstract

The relationships between Mg composition, band gap, and lattice characteristics are investigated for Cd 1-xMg xTe barrier layers using a combination of cathodoluminescence, energy dispersive x-ray spectroscopy, variable angle spectral ellipsometry, and atom probe tomography. The use of a simplified, yet accurate, variable angle spectral ellipsometry analysis is shown to be appropriate for fast determination of composition in thin Cd 1-xMg xTe layers. The validity of using high-resolution x-ray diffraction for CdTe/Cd 1-xMg xTe double heterostructures is discussed. Furthermore, the stability of CdTe/Cd 1-xMg xTe heterostructures are investigated with respect to thermal processing.

Authors:
 [1];  [1];  [1];  [1];  [1];  [1];  [1];  [2];  [2];  [2];  [3];  [4];  [1]
  1. Texas State Univ., San Marcos, TX (United States)
  2. Colorado School of Mines, Golden, CO (United States)
  3. EAG Laboratories (Evans Analytical Group), Sunnyvale, CA (United States)
  4. National Renewable Energy Lab. (NREL), Golden, CO (United States)
Publication Date:
Research Org.:
National Renewable Energy Lab. (NREL), Golden, CO (United States)
Sponsoring Org.:
USDOE Office of Energy Efficiency and Renewable Energy (EERE)
OSTI Identifier:
1374127
Report Number(s):
NREL/JA-5K00-68890
Journal ID: ISSN 0361-5235
Grant/Contract Number:  
AC36-08GO28308
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
Journal of Electronic Materials
Additional Journal Information:
Journal Volume: 46; Journal Issue: 9; Journal ID: ISSN 0361-5235
Publisher:
Springer
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; II-VI semiconductor materials; semiconductor epitaxial layers; Mg composition; band gap; elastic constants; diffusivity

Citation Formats

LeBlanc, E. G., Edirisooriya, M., Ogedengbe, O. S., Noriega, O. C., Jayathilaka, P. A. R. D., Rab, S., Swartz, C. H., Diercks, D. R., Burton, G. L., Gorman, B. P., Wang, A., Barnes, T. M., and Myers, T. H.. Determining and Controlling the Magnesium Composition in CdTe/CdMgTe Heterostructures. United States: N. p., 2017. Web. doi:10.1007/s11664-017-5589-3.
LeBlanc, E. G., Edirisooriya, M., Ogedengbe, O. S., Noriega, O. C., Jayathilaka, P. A. R. D., Rab, S., Swartz, C. H., Diercks, D. R., Burton, G. L., Gorman, B. P., Wang, A., Barnes, T. M., & Myers, T. H.. Determining and Controlling the Magnesium Composition in CdTe/CdMgTe Heterostructures. United States. doi:10.1007/s11664-017-5589-3.
LeBlanc, E. G., Edirisooriya, M., Ogedengbe, O. S., Noriega, O. C., Jayathilaka, P. A. R. D., Rab, S., Swartz, C. H., Diercks, D. R., Burton, G. L., Gorman, B. P., Wang, A., Barnes, T. M., and Myers, T. H.. Mon . "Determining and Controlling the Magnesium Composition in CdTe/CdMgTe Heterostructures". United States. doi:10.1007/s11664-017-5589-3. https://www.osti.gov/servlets/purl/1374127.
@article{osti_1374127,
title = {Determining and Controlling the Magnesium Composition in CdTe/CdMgTe Heterostructures},
author = {LeBlanc, E. G. and Edirisooriya, M. and Ogedengbe, O. S. and Noriega, O. C. and Jayathilaka, P. A. R. D. and Rab, S. and Swartz, C. H. and Diercks, D. R. and Burton, G. L. and Gorman, B. P. and Wang, A. and Barnes, T. M. and Myers, T. H.},
abstractNote = {The relationships between Mg composition, band gap, and lattice characteristics are investigated for Cd1-xMgxTe barrier layers using a combination of cathodoluminescence, energy dispersive x-ray spectroscopy, variable angle spectral ellipsometry, and atom probe tomography. The use of a simplified, yet accurate, variable angle spectral ellipsometry analysis is shown to be appropriate for fast determination of composition in thin Cd1-xMgxTe layers. The validity of using high-resolution x-ray diffraction for CdTe/Cd1-xMgxTe double heterostructures is discussed. Furthermore, the stability of CdTe/Cd1-xMgxTe heterostructures are investigated with respect to thermal processing.},
doi = {10.1007/s11664-017-5589-3},
journal = {Journal of Electronic Materials},
number = 9,
volume = 46,
place = {United States},
year = {Mon Jun 05 00:00:00 EDT 2017},
month = {Mon Jun 05 00:00:00 EDT 2017}
}

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