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Title: Development of Thick Electroplated Bismuth Absorbers for Large Collection Area Hard X-ray Transition Edge Sensors

Authors:
; ; ; ; ; ; ;
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science - Office of Basic Energy Sciences - Scientific User Facilities Division
OSTI Identifier:
1373701
DOE Contract Number:
AC02-06CH11357
Resource Type:
Conference
Resource Relation:
Conference: 2016 Applied Superconductivity Conference, 09/04/16 - 09/09/16, Denver, CO, US
Country of Publication:
United States
Language:
English

Citation Formats

Gades, Lisa, Cecil, Thomas W., Divan, Ralu, Schmidt, Daniel R, Ullom, Joel N., Madden, Timothy J., Yan, Daikang, and Miceli, Antonino. Development of Thick Electroplated Bismuth Absorbers for Large Collection Area Hard X-ray Transition Edge Sensors. United States: N. p., 2016. Web. doi:10.1109/TASC.2017.2662007.
Gades, Lisa, Cecil, Thomas W., Divan, Ralu, Schmidt, Daniel R, Ullom, Joel N., Madden, Timothy J., Yan, Daikang, & Miceli, Antonino. Development of Thick Electroplated Bismuth Absorbers for Large Collection Area Hard X-ray Transition Edge Sensors. United States. doi:10.1109/TASC.2017.2662007.
Gades, Lisa, Cecil, Thomas W., Divan, Ralu, Schmidt, Daniel R, Ullom, Joel N., Madden, Timothy J., Yan, Daikang, and Miceli, Antonino. Sun . "Development of Thick Electroplated Bismuth Absorbers for Large Collection Area Hard X-ray Transition Edge Sensors". United States. doi:10.1109/TASC.2017.2662007. https://www.osti.gov/servlets/purl/1373701.
@article{osti_1373701,
title = {Development of Thick Electroplated Bismuth Absorbers for Large Collection Area Hard X-ray Transition Edge Sensors},
author = {Gades, Lisa and Cecil, Thomas W. and Divan, Ralu and Schmidt, Daniel R and Ullom, Joel N. and Madden, Timothy J. and Yan, Daikang and Miceli, Antonino},
abstractNote = {},
doi = {10.1109/TASC.2017.2662007},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Sun Sep 04 00:00:00 EDT 2016},
month = {Sun Sep 04 00:00:00 EDT 2016}
}

Conference:
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