A compact dispersive refocusing Rowland circle X-ray emission spectrometer for laboratory, synchrotron, and XFEL applications

Holden, William M.; Hoidn, Oliver R.; Ditter, Alexander S.; Seidler, Gerald T.; Kas, Joshua; Stein, Jennifer L.; Cossairt, Brandi M.; Kozimor, Stosh Anthony; Guo, Jinghua; Ye, Yifan; Marcus, Matthew A.; Fakra, Sirine

doi:10.1063/1.4994739

Title: A compact dispersive refocusing Rowland circle X-ray emission spectrometer for laboratory, synchrotron, and XFEL applications

Journal Article · Thu Jul 27 00:00:00 EDT 2017 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4994739· OSTI ID:1379900

Holden, William M. ^[1]; Hoidn, Oliver R. ^[1]; Ditter, Alexander S. ^[1]; Seidler, Gerald T. ^[1]; Kas, Joshua ^[1];

^[2]; Cossairt, Brandi M. ^[2]; Kozimor, Stosh Anthony ^[3];

^[4]; Ye, Yifan ^[4]; Marcus, Matthew A. ^[4]; Fakra, Sirine ^[4]

Univ. of Washington, Seattle, WA (United States). Dept. of Physics
Univ. of Washington, Seattle, WA (United States). Dept. of Chemistry
Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Advanced Light Source (ALS)

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Research Organization:: Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States); Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES); USDOE Office of Science (SC). Basic Energy Sciences (BES) (SC-22)

Grant/Contract Number:: AC02-05CH11231; AC52-06NA25396; CHE-1552164; SC0016251; SC0008580

OSTI ID:: 1379900

Alternate ID(s):: OSTI ID: 1372944; OSTI ID: 1407890

Report Number(s):: LA-UR-17-23495; ark:/13030/qt2792v2dk

Journal Information:: Review of Scientific Instruments, Vol. 88, Issue 7; ISSN 0034-6748

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 34 works

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Photon event evaluation for conventional pixelated detectors in energy-dispersive X-ray applications Baumann, Jonas; Gnewkow, Richard; Staeck, Steffen Journal of Analytical Atomic Spectrometry, Vol. 33, Issue 12 https://doi.org/10.1039/c8ja00212f	journal	January 2018
A von Hamos spectrometer for in situ sulfur speciation by non-resonant sulfur Kα emission spectroscopy Kuzmenko, Dzulija; Vogelsang, Urs; Hitz, Stephan Journal of Analytical Atomic Spectrometry, Vol. 34, Issue 10 https://doi.org/10.1039/c9ja00195f	journal	January 2019
A laboratory spectrometer for high throughput X-ray emission spectroscopy in catalysis research Malzer, Wolfgang; Grötzsch, Daniel; Gnewkow, Richard Review of Scientific Instruments, Vol. 89, Issue 11 https://doi.org/10.1063/1.5035171	journal	November 2018
A color x-ray camera for 2–6 keV using a mass produced back illuminated complementary metal oxide semiconductor sensor Holden, William M.; Hoidn, Oliver R.; Seidler, Gerald T. Review of Scientific Instruments, Vol. 89, Issue 9 https://doi.org/10.1063/1.5047934	journal	September 2018
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46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
X-rays
Synchrotrons
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Metalloids
Semiconductors
Inorganic and Physical Chemistry
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Rowland Circle
X-ray Emission Spectroscopy

Title: A compact dispersive refocusing Rowland circle X-ray emission spectrometer for laboratory, synchrotron, and XFEL applications

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