Determining the resolution of scanning microwave impedance microscopy using atomic-precision buried donor structures

Scrymgeour, D. A.; Baca, A.; Fishgrab, K.; Simonson, R. J.; Marshall, M.; Bussmann, E.; Nakakura, C. Y.; Anderson, M.; Misra, S.

doi:10.1016/j.apsusc.2017.06.261

Title: Determining the resolution of scanning microwave impedance microscopy using atomic-precision buried donor structures

Journal Article · Tue Jul 04 00:00:00 EDT 2017 · Applied Surface Science

DOI:https://doi.org/10.1016/j.apsusc.2017.06.261· OSTI ID:1372363

Scrymgeour, D. A. ^[1]; Baca, A. ^[1]; Fishgrab, K. ^[1]; Simonson, R. J. ^[1]; Marshall, M. ^[1]; Bussmann, E. ^[1]; Nakakura, C. Y. ^[1]; Anderson, M. ^[1]; Misra, S. ^[1]

Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)

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Research Organization:: Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)

Sponsoring Organization:: Work for Others (WFO); USDOE National Nuclear Security Administration (NNSA)

Grant/Contract Number:: AC04-94AL85000; NA0003525

OSTI ID:: 1372363

Alternate ID(s):: OSTI ID: 1372362; OSTI ID: 1389596; OSTI ID: 1550431

Report Number(s):: SAND-2017-6240J; SAND-2017-5855J; SAND-2017-3618J; PII: S0169433217319165

Journal Information:: Applied Surface Science, Vol. 423, Issue C; ISSN 0169-4332

Publisher:: ElsevierCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 10 works

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Scanning Microwave Impedance Microscopy (sMIM) in Electronic and Quantum Materials Rubin, Kurt A.; Yang, Yongliang; Amster, Oskar Electrical Atomic Force Microscopy for Nanoelectronics https://doi.org/10.1007/978-3-030-15612-1_12	book	August 2019

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