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Title: Network Forensic Analyzer.


Abstract not provided.

Publication Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
Report Number(s):
DOE Contract Number:
Resource Type:
Resource Relation:
Conference: Proposed for presentation at the Intern Symposium.
Country of Publication:
United States

Citation Formats

Goes, Christopher Edward. Network Forensic Analyzer.. United States: N. p., 2016. Web.
Goes, Christopher Edward. Network Forensic Analyzer.. United States.
Goes, Christopher Edward. 2016. "Network Forensic Analyzer.". United States. doi:.
title = {Network Forensic Analyzer.},
author = {Goes, Christopher Edward},
abstractNote = {Abstract not provided.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = 2016,
month = 7

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  • The ITP/INPLANS CCS Network Topology Analyzer is a Bellcore product which performs automated design of cost effective survivable CCS (Common Channel Signaling) networks, with survivability meaning that certain path-connectivity is preserved under limited failures of network elements. The algorithmic core of this product consists of suitable extensions of primal-dual approximation schemes for Steiner network problems. Even though most of the survivability problems arising in CCS networks are not strictly of the form for which the approximation algorithms with proven performance guarantees apply, we implemented modifications of these algorithms with success: In addition to duality-based performance guarantees that indicate, mathematically, discrepancymore » of no more than 20% from optimality for generic Steiner problems and no more than 40% for survivable CCS networks, our software passed all commercial benchmark tests, and our code was deployed with the August 94 release of the product. CCS networks fall in the general category of low bit-rate backbone networks. The main characteristic of survivability problems for these networks is that each edge, once present, can be assumed to carry arbitrarily many paths. For high bit-rate backbone networks, such as the widely used ATM and SONET, this is no longer the case. We discuss versions of network survivability with capacitated edges that appear to model survivability considerations in such networks.« less
  • This paper describes the model and method used to obtain the periodically estimated uncertainties for measurement of the scattering parameters S{sub 11} and S{sub 22} on a Vector Network Analyzer (VNA). A thru-reflect-line (TRL) method is employed as a second tier calibration to obtain uncertainty estimates using an NIST-calibrated standard. An example of tabulated listings of these uncertainty estimates is presented and the uncertainties obtained for a VNA with 7 mm, 3.5 mm, and type N coaxial interfaces used in the laboratory over several years are summarized.
  • This paper presents the measurement performances of a dual six-port network analyzer in the W frequency band (75-110 GHz) using Schottky diodes as power detectors. A {open_quotes}LRL{close_quotes} and an other calibration technique are used to determine the full scattering parameters of the DUT. Finally, a comparison between experimental results, in reflection and transmission, performed with the six-port network analyzer and the other measurement systems available in the W frequency band is presented.
  • An automatically controlled calibration procedure will be presented which is based on a virtual transformation of calibration standards. The basic element is a switching network added to the network analyzer. This network is a part of the analyzer, so it will not be removed after the calibration has been finished. It is not necessary to know the characteristics of the single switching states. Compared with commercially available procedures the expense of the new calibration technique is decreased.
  • For a network analyzer some error corrected impedance or two-port measurements are presented. These ZU and YU self-calibration procedures only need one known and one or two unknown impedances for the calibration process. The good performance of these simple methods is demonstrated by experimental results.