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Title: Detection and characterization of nanoparticles in suspension at low concentrations using the X-ray total scattering pair distribution function technique

Abstract

Total scattering experiments are used with pair distribution function analysis to study nanoscale structure and morphology in highly disordered samples. We investigate sensitivity for the case of organic nanoparticles in dilute solution.

Authors:
 [1];  [2];  [3];  [4]
  1. Department of Applied Physics and Applied Mathematics; Columbia University; New York, USA
  2. GlaxoSmithKline Medicines Research Centre; Hertfordshire, UK
  3. ESRF – The European Synchrotron; 38043 Grenoble Cedex 9, France
  4. Department of Applied Physics and Applied Mathematics; Columbia University; New York, USA; Condensed Matter Physics and Materials Science Department; Brookhaven National Laboratory
Publication Date:
Research Org.:
Energy Frontier Research Centers (EFRC) (United States). Re-Defining Photovoltaic Efficiency Through Molecule Scale Control (RPEMSC)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1370367
DOE Contract Number:  
SC0001085
Resource Type:
Journal Article
Journal Name:
Nanoscale
Additional Journal Information:
Journal Volume: 7; Journal Issue: 12; Related Information: RPEMSC partners with Columbia University (lead); Brookhaven National Laboratory; Purdue University; Journal ID: ISSN 2040-3364
Publisher:
Royal Society of Chemistry
Country of Publication:
United States
Language:
English

Citation Formats

Terban, Maxwell W., Johnson, Matthew, Di Michiel, Marco, and Billinge, Simon J. L. Detection and characterization of nanoparticles in suspension at low concentrations using the X-ray total scattering pair distribution function technique. United States: N. p., 2015. Web. doi:10.1039/c4nr06486k.
Terban, Maxwell W., Johnson, Matthew, Di Michiel, Marco, & Billinge, Simon J. L. Detection and characterization of nanoparticles in suspension at low concentrations using the X-ray total scattering pair distribution function technique. United States. doi:10.1039/c4nr06486k.
Terban, Maxwell W., Johnson, Matthew, Di Michiel, Marco, and Billinge, Simon J. L. Thu . "Detection and characterization of nanoparticles in suspension at low concentrations using the X-ray total scattering pair distribution function technique". United States. doi:10.1039/c4nr06486k.
@article{osti_1370367,
title = {Detection and characterization of nanoparticles in suspension at low concentrations using the X-ray total scattering pair distribution function technique},
author = {Terban, Maxwell W. and Johnson, Matthew and Di Michiel, Marco and Billinge, Simon J. L.},
abstractNote = {Total scattering experiments are used with pair distribution function analysis to study nanoscale structure and morphology in highly disordered samples. We investigate sensitivity for the case of organic nanoparticles in dilute solution.},
doi = {10.1039/c4nr06486k},
journal = {Nanoscale},
issn = {2040-3364},
number = 12,
volume = 7,
place = {United States},
year = {2015},
month = {1}
}

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Relationship between the atomic pair distribution function and small-angle scattering: implications for modeling of nanoparticles
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Rapid-acquisition pair distribution function (RA-PDF) analysis
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Two-dimensional detector software: From real detector to idealised image or two-theta scan
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