skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Mapping strain modulated electronic structure perturbations in mixed phase bismuth ferrite thin films

Abstract

A combination of atom column-by-column scanning transmission electron microscopy and density functional theory shows how epitaxial strain alters the local electronic structure in mixed phase bismuth ferrite thin films.

Authors:
 [1];  [2];  [3];  [3];  [4];  [4];  [5];  [1];  [1]
  1. School of Materials Science and Engineering; University of New South Wales; Sydney, Australia
  2. Material Science and Technology Division; Los Alamos National Laboratory; Los Alamos, USA; Materials and Characterization; National Renewable Energy Laboratory
  3. SuperSTEM Laboratory; STFC Daresbury Campus; Daresbury, UK
  4. Department of Materials Science and Engineering; National Chiao Tung University; Hsinchu 30010, Taiwan
  5. Fundamental and Computational Sciences Directorate; Pacific Northwest National Laboratory; Richland, USA
Publication Date:
Research Org.:
Energy Frontier Research Centers (EFRC) (United States). Center for Materials at Irradiation and Mechanical Extremes (CMIME)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1369960
DOE Contract Number:
2008LANL1026
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Materials Chemistry. C; Journal Volume: 3; Journal Issue: 8; Related Information: CMIME partners with Los Alamos National Laboratory (lead); Carnegie Mellon University; University of Illinois, Urbana Champaign; Massachusetts Institute of Technology; University of Nebraska
Country of Publication:
United States
Language:
English

Citation Formats

Krishnan, P. S. Sankara Rama, Aguiar, Jeffery A., Ramasse, Q. M., Kepaptsoglou, D. M., Liang, W. -I., Chu, Y. -H., Browning, N. D., Munroe, P., and Nagarajan, V. Mapping strain modulated electronic structure perturbations in mixed phase bismuth ferrite thin films. United States: N. p., 2015. Web. doi:10.1039/c4tc02064b.
Krishnan, P. S. Sankara Rama, Aguiar, Jeffery A., Ramasse, Q. M., Kepaptsoglou, D. M., Liang, W. -I., Chu, Y. -H., Browning, N. D., Munroe, P., & Nagarajan, V. Mapping strain modulated electronic structure perturbations in mixed phase bismuth ferrite thin films. United States. doi:10.1039/c4tc02064b.
Krishnan, P. S. Sankara Rama, Aguiar, Jeffery A., Ramasse, Q. M., Kepaptsoglou, D. M., Liang, W. -I., Chu, Y. -H., Browning, N. D., Munroe, P., and Nagarajan, V. Thu . "Mapping strain modulated electronic structure perturbations in mixed phase bismuth ferrite thin films". United States. doi:10.1039/c4tc02064b.
@article{osti_1369960,
title = {Mapping strain modulated electronic structure perturbations in mixed phase bismuth ferrite thin films},
author = {Krishnan, P. S. Sankara Rama and Aguiar, Jeffery A. and Ramasse, Q. M. and Kepaptsoglou, D. M. and Liang, W. -I. and Chu, Y. -H. and Browning, N. D. and Munroe, P. and Nagarajan, V.},
abstractNote = {A combination of atom column-by-column scanning transmission electron microscopy and density functional theory shows how epitaxial strain alters the local electronic structure in mixed phase bismuth ferrite thin films.},
doi = {10.1039/c4tc02064b},
journal = {Journal of Materials Chemistry. C},
number = 8,
volume = 3,
place = {United States},
year = {Thu Jan 01 00:00:00 EST 2015},
month = {Thu Jan 01 00:00:00 EST 2015}
}