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Title: High power RF window deposition apparatus, method, and device

Patent ·
OSTI ID:1368189

A process for forming a coating for an RF window which has improved secondary electron emission and reduced multipactor for high power RF waveguides is formed from a substrate with low loss tangent and desirable mechanical characteristics. The substrate has an RPAO deposition layer applied which oxygenates the surface of the substrate to remove carbon impurities, thereafter has an RPAN deposition layer applied to nitrogen activate the surface of the substrate, after which a TiN deposition layer is applied using Titanium tert-butoxide. The TiN deposition layer is capped with a final RPAN deposition layer of nitridation to reduce the bound oxygen in the TiN deposition layer. The resulting RF window has greatly improved titanium layer adhesion, reduced multipactor, and is able to withstand greater RF power levels than provided by the prior art.

Research Organization:
Calabazas Creek Research, Inc. San Mateo, CA (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
SC0004571
Assignee:
Calabazas Creek Research, Inc.
Patent Number(s):
9,698,454
Application Number:
13/937,216
OSTI ID:
1368189
Resource Relation:
Patent File Date: 2013 Jul 09
Country of Publication:
United States
Language:
English

References (6)

Low-pressure chemical vapor deposition process for depositing high-density, highly-conformal, titanium nitride films of low bulk resistivity patent September 1993
Nucleation enhancement for chemical vapor deposition of diamond patent March 1995
Enhanced RF window for waveguide used with particle accelerator patent March 2006
Apparatuses and Methods for Atomic Layer Deposition patent-application January 2010
Optical Article Coated with an Antireflection Coating Comprising a Sublayer Partially Formed under Ion Assistance and Manufacturing Process patent-application July 2010
Novel Gap Fill Integration patent-application June 2011

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