Sensitivity of the mode locking phenomenon to geometric imperfections during wrinkling of supported thin films
Although geometric imperfections have a detrimental effect on buckling, imperfection sensitivity has not been well studied in the past during design of sinusoidal micro and nano-scale structures via wrinkling of supported thin films. This is likely because one is more interested in predicting the shape/size of the resultant patterns than the buckling bifurcation onset strain during fabrication of such wrinkled structures. Herein, I have demonstrated that even modest geometric imperfections alter the final wrinkled mode shapes via the mode locking phenomenon wherein the imperfection mode grows in exclusion to the natural mode of the system. To study the effect of imperfections on mode locking, I have (i) developed a finite element mesh perturbation scheme to generate arbitrary geometric imperfections in the system and (ii) performed a parametric study via finite element methods to link the amplitude and period of the sinusoidal imperfections to the observed wrinkle mode shape and size. Based on this, a non-dimensional geometric parameter has been identified that characterizes the effect of imperfection on the mode locking phenomenon – the equivalent imperfection size. An upper limit for this equivalent imperfection size has been identified via a combination of analytical and finite element modeling. During compression of supported thin films, the system gets “locked” into the imperfection mode if its equivalent imperfection size is above this critical limit. For the polydimethylsiloxane/glass bilayer with a wrinkle period of 2 µm, this mode lock-in limit corresponds to an imperfection amplitude of 32 nm for an imperfection period of 5 µm and 8 nm for an imperfection period of 0.8 µm. Interestingly, when the non-dimensional critical imperfection size is scaled by the bifurcation onset strain, the scaled critical size depends solely on the ratio of the imperfection to natural periods. Furthermore, the computational data generated here can be generalized beyond the specific natural periods and bilayer systems studied to enable deterministic design of a variety of wrinkled micro and nano-scale structures.
- Research Organization:
- Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
- Sponsoring Organization:
- USDOE
- Grant/Contract Number:
- AC52-07NA27344; LLNL-JRNL-706663
- OSTI ID:
- 1550596
- Alternate ID(s):
- OSTI ID: 1367995; OSTI ID: 1398049
- Report Number(s):
- LLNL-JRNL-706663; S0020768317300203; PII: S0020768317300203
- Journal Information:
- International Journal of Solids and Structures, Journal Name: International Journal of Solids and Structures Vol. 109 Journal Issue: C; ISSN 0020-7683
- Publisher:
- ElsevierCopyright Statement
- Country of Publication:
- United States
- Language:
- English
Web of Science
Direct numerical simulation of buckling instability of thin films on a compliant substrate
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journal | April 2019 |
Surface Instability of Composite Thin Films on Compliant Substrates: Direct Simulation Approach
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journal | September 2019 |
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