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Title: Continuous motion scan ptychography: characterization for increased speed in coherent x-ray imaging

Abstract

Ptychography is a coherent diffraction imaging (CDI) method for extended objects in which diffraction patterns are acquired sequentially from overlapping coherent illumination spots. The object's complex transmission function can be reconstructed from those diffraction patterns at a spatial resolution limited only by the scattering strength of the object and the detector geometry. Most experiments to date have positioned the illumination spots on the sample using a move-settle-measure sequence in which the move and settle steps can take longer to complete than the measure step. We describe here the use of a continuous "fly-scan" mode for ptychographic data collection in which the sample is moved continuously, so that the experiment resembles one of integrating the diffraction patterns from multiple probe positions. This allows one to use multiple probe mode reconstruction methods to obtain an image of the object and also of the illumination function. We show in simulations, and in x-ray imaging experiments, some of the characteristics of fly-scan ptychography, including a factor of 25 reduction in the data acquisition time. This approach will become increasingly important as brighter x-ray sources are developed, such as diffraction limited storage rings.

Authors:
; ; ; ; ; ; ; ;
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES); National Institutes of Health (NIH) - National Institute of General Medical Sciences; National Institutes of Health (NIH)
OSTI Identifier:
1367895
DOE Contract Number:  
AC02-06CH11357
Resource Type:
Journal Article
Journal Name:
Optics Express
Additional Journal Information:
Journal Volume: 23; Journal Issue: 5; Journal ID: ISSN 1094-4087
Publisher:
Optical Society of America (OSA)
Country of Publication:
United States
Language:
English
Subject:
Image Reconstruction Techniques; Phase Retrieval; Scanning Microscopy; X-Ray Microscopy

Citation Formats

Deng, Junjing, Nashed, Youssef S. G., Chen, Si, Phillips, Nicholas W., Peterka, Tom, Ross, Rob, Vogt, Stefan, Jacobsen, Chris, and Vine, David J. Continuous motion scan ptychography: characterization for increased speed in coherent x-ray imaging. United States: N. p., 2015. Web. doi:10.1364/OE.23.005438.
Deng, Junjing, Nashed, Youssef S. G., Chen, Si, Phillips, Nicholas W., Peterka, Tom, Ross, Rob, Vogt, Stefan, Jacobsen, Chris, & Vine, David J. Continuous motion scan ptychography: characterization for increased speed in coherent x-ray imaging. United States. https://doi.org/10.1364/OE.23.005438
Deng, Junjing, Nashed, Youssef S. G., Chen, Si, Phillips, Nicholas W., Peterka, Tom, Ross, Rob, Vogt, Stefan, Jacobsen, Chris, and Vine, David J. Thu . "Continuous motion scan ptychography: characterization for increased speed in coherent x-ray imaging". United States. https://doi.org/10.1364/OE.23.005438.
@article{osti_1367895,
title = {Continuous motion scan ptychography: characterization for increased speed in coherent x-ray imaging},
author = {Deng, Junjing and Nashed, Youssef S. G. and Chen, Si and Phillips, Nicholas W. and Peterka, Tom and Ross, Rob and Vogt, Stefan and Jacobsen, Chris and Vine, David J.},
abstractNote = {Ptychography is a coherent diffraction imaging (CDI) method for extended objects in which diffraction patterns are acquired sequentially from overlapping coherent illumination spots. The object's complex transmission function can be reconstructed from those diffraction patterns at a spatial resolution limited only by the scattering strength of the object and the detector geometry. Most experiments to date have positioned the illumination spots on the sample using a move-settle-measure sequence in which the move and settle steps can take longer to complete than the measure step. We describe here the use of a continuous "fly-scan" mode for ptychographic data collection in which the sample is moved continuously, so that the experiment resembles one of integrating the diffraction patterns from multiple probe positions. This allows one to use multiple probe mode reconstruction methods to obtain an image of the object and also of the illumination function. We show in simulations, and in x-ray imaging experiments, some of the characteristics of fly-scan ptychography, including a factor of 25 reduction in the data acquisition time. This approach will become increasingly important as brighter x-ray sources are developed, such as diffraction limited storage rings.},
doi = {10.1364/OE.23.005438},
url = {https://www.osti.gov/biblio/1367895}, journal = {Optics Express},
issn = {1094-4087},
number = 5,
volume = 23,
place = {United States},
year = {2015},
month = {1}
}

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    Works referencing / citing this record:

    Perspective: Towards single shot time-resolved microscopy using short wavelength table-top light sources
    journal, January 2019


    X-ray ptychography
    journal, December 2017


    Coupled ptychography and tomography algorithm improves reconstruction of experimental data
    journal, January 2019


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    journal, December 2017


    Coupled ptychography and tomography algorithm improves reconstruction of experimental data
    journal, January 2019


    Perspective: Towards single shot time-resolved microscopy using short wavelength table-top light sources
    text, January 2019


    Perspective: Towards single shot time-resolved microscopy using short wavelength table-top light sources
    journal, January 2019


    Coupled ptychography and tomography algorithm improves reconstruction of experimental data
    text, January 2019


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    journal, March 2017


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    journal, January 2019


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    journal, April 2018


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    journal, June 2018


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    journal, February 2019


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    journal, January 2018


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