Modular HPC I/O characterization with Darshan

Conference · Sun Nov 13 00:00:00 EST 2016

DOI:https://doi.org/10.1109/ESPT.2016.006· OSTI ID:1366455

Snyder, Shane; Carns, Philip; Harms, Kevin; Ross, Robert; Lockwood, Glenn K.; Wright, Nicholas J.

Contemporary high-performance computing (HPC) applications encompass a broad range of distinct I/O strategies and are often executed on a number of different compute platforms in their lifetime. These large-scale HPC platforms employ increasingly complex I/O subsystems to provide a suitable level of I/O performance to applications. Tuning I/O workloads for such a system is nontrivial, and the results generally are not portable to other HPC systems. I/O profiling tools can help to address this challenge, but most existing tools only instrument specific components within the I/O subsystem that provide a limited perspective on I/O performance. The increasing diversity of scientific applications and computing platforms calls for greater flexibililty and scope in I/O characterization.

• Research Organization: Argonne National Lab. (ANL), Argonne, IL (United States)
• Sponsoring Organization: USDOE Office of Science - Office of Advanced Scientific Computing Research; USDOE Office of Science - National Energy Research Scientific Computing Center (NERSC)
• DOE Contract Number: AC02-06CH11357
• OSTI ID: 1366455
• Resource Relation: Conference: 5th Workshop on Extreme-scale Programming Tools, 11/13/16 - 11/14/16, Salt Lake City, UT, US
• Country of Publication: United States
• Language: English