skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Lifetime of high-order thickness resonances of thin silicon membranes

Authors:
; ; ; ;
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1366321
Resource Type:
Journal Article: Publisher's Accepted Manuscript
Journal Name:
Ultrasonics
Additional Journal Information:
Journal Name: Ultrasonics Journal Volume: 56 Journal Issue: C; Journal ID: ISSN 0041-624X
Publisher:
Elsevier
Country of Publication:
United Kingdom
Language:
English

Citation Formats

Maznev, A. A., Hofmann, F., Cuffe, J., Eliason, J. K., and Nelson, K. A. Lifetime of high-order thickness resonances of thin silicon membranes. United Kingdom: N. p., 2015. Web. doi:10.1016/j.ultras.2014.02.016.
Maznev, A. A., Hofmann, F., Cuffe, J., Eliason, J. K., & Nelson, K. A. Lifetime of high-order thickness resonances of thin silicon membranes. United Kingdom. doi:10.1016/j.ultras.2014.02.016.
Maznev, A. A., Hofmann, F., Cuffe, J., Eliason, J. K., and Nelson, K. A. Sun . "Lifetime of high-order thickness resonances of thin silicon membranes". United Kingdom. doi:10.1016/j.ultras.2014.02.016.
@article{osti_1366321,
title = {Lifetime of high-order thickness resonances of thin silicon membranes},
author = {Maznev, A. A. and Hofmann, F. and Cuffe, J. and Eliason, J. K. and Nelson, K. A.},
abstractNote = {},
doi = {10.1016/j.ultras.2014.02.016},
journal = {Ultrasonics},
number = C,
volume = 56,
place = {United Kingdom},
year = {Sun Feb 01 00:00:00 EST 2015},
month = {Sun Feb 01 00:00:00 EST 2015}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record at 10.1016/j.ultras.2014.02.016

Citation Metrics:
Cited by: 9 works
Citation information provided by
Web of Science

Save / Share: