Curved diamond-crystal spectrographs for x-ray free-electron laser noninvasive diagnostics
- Technological Institute for Superhard and Novel Carbon Materials, Troitsk (Russian Federation)
- Argonne National Lab. (ANL), Argonne, IL (United States)
Here, we report on the manufacturing and X-ray tests of bent diamond-crystal X-ray spectrographs, designed for noninvasive diagnostics of the X-ray free-electron laser (XFEL) spectra in the spectral range from 5 to 15 keV. The key component is a curved, 20-µm thin, single crystalline diamond triangular plate in the (110) orientation. The radius of curvature can be varied between R = 0.6 m and R = 0.1 m in a controlled fashion, ensuring imaging in a spectral window of up to 60 eV for ' 8 keV X-rays. All of the components of the bending mechanism (about 10 parts) are manufactured from diamond, thus ensuring safe operations in intense XFEL beams. The spectrograph is transparent to 88% for 5-keV photons, and to 98% for 15-keV photons. Therefore, it can be used for noninvasive diagnostics of the X-ray spectra during XFEL operations.
- Research Organization:
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC), Basic Energy Sciences (BES); Russian Federation, Ministry of Education and Science
- Grant/Contract Number:
- AC02-06CH11357
- OSTI ID:
- 1373590
- Alternate ID(s):
- OSTI ID: 1364181
- Journal Information:
- Review of Scientific Instruments, Vol. 87, Issue 12; ISSN 0034-6748
- Publisher:
- American Institute of Physics (AIP)Copyright Statement
- Country of Publication:
- United States
- Language:
- English
Web of Science
Diffraction properties of a strongly bent diamond crystal used as a dispersive spectrometer for XFEL pulses
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journal | June 2019 |
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