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Title: Aberration-Corrected STEM Imaging Through Off-Site Remote Operation

Abstract

Recent advances in aberration-corrected electron microscopy have allowed researchers to image materials at sub- ngstr m resolution. Many of these modern instruments are designed to be operated from separate 'control' rooms, removing the effect of the operator on the instrument s physical environment. This capability also allows operation from suitable workstations, over internet connections, from literally anywhere in the world [1]. Researchers at the University of Texas at Austin (UTA) have collaborated with Oak Ridge National Laboratory (ORNL) and JEOL Ltd. to routinely conduct research sessions in which high-resolution images and X-ray microanalytical data are acquired during after-hours research sessions, utilizing the JEOL 2200FS aberration-corrected STEM/TEM at ORNL from their lab in Austin. Details of the remote operation are presented here.

Authors:
 [1];  [2];  [2];  [3];  [4];  [1]
  1. University of Texas at Austin
  2. ORNL
  3. JEOL USA
  4. University of South Carolina, Columbia
Publication Date:
Research Org.:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). High Temperature Materials Lab. (HTML)
Sponsoring Org.:
USDOE Office of Energy Efficiency and Renewable Energy (EERE)
OSTI Identifier:
1362183
DOE Contract Number:  
AC05-00OR22725
Resource Type:
Conference
Resource Relation:
Journal Volume: 16; Journal Issue: S2; Conference: Microscopy & Microanalysis 2010, Portland, OR, USA, 20100801, 20100805
Country of Publication:
United States
Language:
English
Subject:
Remote microscopy; aberration-corrected; STEM; Off-site; Ultra-VNC

Citation Formats

Jarvis, Karalee, Allard Jr, Lawrence Frederick, Jerome, Timothy Y, Isabell, Thomas, Blom, Dr. Douglas, and Ferreira, Prof Paulo. Aberration-Corrected STEM Imaging Through Off-Site Remote Operation. United States: N. p., 2010. Web. doi:10.1017/S1431927610061878.
Jarvis, Karalee, Allard Jr, Lawrence Frederick, Jerome, Timothy Y, Isabell, Thomas, Blom, Dr. Douglas, & Ferreira, Prof Paulo. Aberration-Corrected STEM Imaging Through Off-Site Remote Operation. United States. doi:10.1017/S1431927610061878.
Jarvis, Karalee, Allard Jr, Lawrence Frederick, Jerome, Timothy Y, Isabell, Thomas, Blom, Dr. Douglas, and Ferreira, Prof Paulo. Fri . "Aberration-Corrected STEM Imaging Through Off-Site Remote Operation". United States. doi:10.1017/S1431927610061878.
@article{osti_1362183,
title = {Aberration-Corrected STEM Imaging Through Off-Site Remote Operation},
author = {Jarvis, Karalee and Allard Jr, Lawrence Frederick and Jerome, Timothy Y and Isabell, Thomas and Blom, Dr. Douglas and Ferreira, Prof Paulo},
abstractNote = {Recent advances in aberration-corrected electron microscopy have allowed researchers to image materials at sub- ngstr m resolution. Many of these modern instruments are designed to be operated from separate 'control' rooms, removing the effect of the operator on the instrument s physical environment. This capability also allows operation from suitable workstations, over internet connections, from literally anywhere in the world [1]. Researchers at the University of Texas at Austin (UTA) have collaborated with Oak Ridge National Laboratory (ORNL) and JEOL Ltd. to routinely conduct research sessions in which high-resolution images and X-ray microanalytical data are acquired during after-hours research sessions, utilizing the JEOL 2200FS aberration-corrected STEM/TEM at ORNL from their lab in Austin. Details of the remote operation are presented here.},
doi = {10.1017/S1431927610061878},
journal = {},
issn = {1431--9276},
number = S2,
volume = 16,
place = {United States},
year = {2010},
month = {1}
}

Conference:
Other availability
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