skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Toroidal silicon polarization analyzer for resonant inelastic x-ray scattering

Abstract

Resonant Inelastic X-ray Scattering (RIXS) is a powerful probe for studying electronic excitations in materials. Standard high energy RIXS measurements do not measure the polarization of the scattered x-rays, which is unfortunate since it carries information about the nature and symmetry of the excitations involved in the scattering process. Moreover we report the fabrication of thin Si-based polarization analyzers with a double-concave toroidal surface, useful for L-edge RIXS studies in heavier atoms such as the 5-d transition metals.

Authors:
 [1];  [2];  [2];  [2];  [3];  [4]
  1. Western Michigan Univ., Kalamazoo MI (United States); Chinese Academy of Sciences (CAS), Chongqing (China)
  2. Argonne National Lab. (ANL), Argonne, IL (United States)
  3. Western Michigan Univ., Kalamazoo MI (United States); South Univ. of Science and Technology of China, Shenzhen (China)
  4. Western Michigan Univ., Kalamazoo MI (United States)
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22), Materials Sciences and Engineering Division; USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22). Scientific User Facilities Division
OSTI Identifier:
1362111
Grant/Contract Number:
AC02-06CH11357
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 87; Journal Issue: 8; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY

Citation Formats

Gao, Xuan, Casa, Diego, Kim, Jungho, Gog, Thomas, Li, Chengyang, and Burns, Clement. Toroidal silicon polarization analyzer for resonant inelastic x-ray scattering. United States: N. p., 2016. Web. doi:10.1063/1.4959566.
Gao, Xuan, Casa, Diego, Kim, Jungho, Gog, Thomas, Li, Chengyang, & Burns, Clement. Toroidal silicon polarization analyzer for resonant inelastic x-ray scattering. United States. doi:10.1063/1.4959566.
Gao, Xuan, Casa, Diego, Kim, Jungho, Gog, Thomas, Li, Chengyang, and Burns, Clement. Mon . "Toroidal silicon polarization analyzer for resonant inelastic x-ray scattering". United States. doi:10.1063/1.4959566. https://www.osti.gov/servlets/purl/1362111.
@article{osti_1362111,
title = {Toroidal silicon polarization analyzer for resonant inelastic x-ray scattering},
author = {Gao, Xuan and Casa, Diego and Kim, Jungho and Gog, Thomas and Li, Chengyang and Burns, Clement},
abstractNote = {Resonant Inelastic X-ray Scattering (RIXS) is a powerful probe for studying electronic excitations in materials. Standard high energy RIXS measurements do not measure the polarization of the scattered x-rays, which is unfortunate since it carries information about the nature and symmetry of the excitations involved in the scattering process. Moreover we report the fabrication of thin Si-based polarization analyzers with a double-concave toroidal surface, useful for L-edge RIXS studies in heavier atoms such as the 5-d transition metals.},
doi = {10.1063/1.4959566},
journal = {Review of Scientific Instruments},
number = 8,
volume = 87,
place = {United States},
year = {Mon Aug 15 00:00:00 EDT 2016},
month = {Mon Aug 15 00:00:00 EDT 2016}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record

Citation Metrics:
Cited by: 1work
Citation information provided by
Web of Science

Save / Share:
  • Resonant Inelastic X-ray Scattering (RIXS) is a powerful probe for studying electronic excitations in materials. Standard high energy RIXS measurements do not measure the polarization of the scattered x-rays, which is unfortunate since it carries information about the nature and symmetry of the excitations involved in the scattering process. Here we report the fabrication of thin Si-based polarization analyzers with a double-concave toroidal surface, useful for L-edge RIXS studies in heavier atoms such as the 5-d transition metals.
  • Resonant inelastic x-ray scattering (RIXS) is a powerful technique for studying electronic excitations in correlated electron systems. Current RIXS spectrometers measure the changes in energy and momentum of the photons scattered by the sample. A powerful extension of the RIXS technique is the measurement of the polarization state of the scattered photons which contains information about the symmetry of the excitations. This long-desired addition has been elusive because of significant technical challenges. This paper reports the development of a new diffraction-based polarization analyzer which discriminates between linear polarization components of the scattered photons. The double concave surface of the polarizationmore » analyzer was designed as a good compromise between energy resolution and throughput. Such a device was fabricated using highly oriented pyrolytic graphite for measurements at the Cu K-edge incident energy. Preliminary measurements on a CuGeO{sub 3} sample are presented.« less
  • Advances in resonant inelastic X-ray scattering (RIXS) have come in lockstep with improvements in energy resolution. Currently, the best energy resolution at the IrL 3-edge stands at ~25 meV, which is achieved using a diced Si(844) spherical crystal analyzer. However, spherical analyzers are limited by their intrinsic reflection width. A novel analyzer system using multiple flat crystals provides a promising way to overcome this limitation. For the present design, an energy resolution at or below 10 meV was selected. Recognizing that the angular acceptance of flat crystals is severely limited, a collimating element is essential to achieve the necessary solid-anglemore » acceptance. For this purpose, a laterally graded, parabolic, multilayer Montel mirror was designed for use at the IrL 3-absorption edge. It provides an acceptance larger than 10 mrad, collimating the reflected X-ray beam to smaller than 100 µrad, in both vertical and horizontal directions. The performance of this mirror was studied at beamline 27-ID at the Advanced Photon Source. X-rays from a diamond (111) monochromator illuminated a scattering source of diameter 5 µm, generating an incident beam on the mirror with a well determined divergence of 40 mrad. A flat Si(111) crystal after the mirror served as the divergence analyzer. From X-ray measurements, ray-tracing simulations and optical metrology results, it was established that the Montel mirror satisfied the specifications of angular acceptance and collimation quality necessary for a high-resolution RIXS multi-crystal analyzer system.« less
  • A novel design of a high-resolution spectrometer is proposed for emission spectroscopy and resonant inelastic hard x-ray scattering applications. The spectrometer is based on a Rowland circle geometry with a diced analyzer crystal and a position-sensitive detector. The individual flat crystallites of the diced analyzer introduce a well-defined linear position-energy relationship within the analyzer focus. This effect can be exploited to measure emission spectra with an unprecedented resolution. For demonstration, a spectrometer was constructed using a diced Si(553) analyzer working at the Cu K edge with an intrinsic resolution of 60 meV. With the proposed design, spectrometers operating at themore » K edges of 3d transition metals can have intrinsic resolutions below 100 meV even with analyzer crystals not working in Bragg-backscattering conditions.« less