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Title: Development of a modular test system for the silicon sensor R&D of the ATLAS Upgrade

Abstract

High Voltage CMOS sensors are a promising technology for tracking detectors in collider experiments. Extensive R&D studies are being carried out by the ATLAS Collaboration for a possible use of HV-CMOS in the High Luminosity LHC upgrade of the Inner Tracker detector. CaRIBOu (Control and Readout Itk BOard) is a modular test system developed to test Silicon based detectors. It currently includes five custom designed boards, a Xilinx ZC706 development board, FELIX (Front-End LInk eXchange) PCIe card and a host computer. A software program has been developed in Python to control the CaRIBOu hardware. CaRIBOu has been used in the testbeam of the HV-CMOS sensor AMS180v4 at CERN. Preliminary results have shown that the test system is very versatile. In conclusion, further development is ongoing to adapt to different sensors, and to make it available to various lab test stands.

Authors:
 [1];  [2];  [3];  [3];  [2];  [2];  [3];  [4];  [5];  [2];  [3];  [3];  [6]
  1. Univ. of Science and Technology of China, Hefei (China). State Key Lab. of Particle Detection and Electronics; Brookhaven National Lab. (BNL), Upton, NY (United States). Dept. of Physics
  2. Univ. of Geneva (Switzerland). Dept. of Nuclear and Particle Physics
  3. Brookhaven National Lab. (BNL), Upton, NY (United States). Dept. of Physics
  4. Karlsruhe Inst. of Technology (KIT) (Germany)
  5. Univ. of Geneva (Switzerland). Dept. of Nuclear and Particle Physics; European Organization for Nuclear Research (CERN), Geneva (Switzerland)
  6. Univ. of Science and Technology of China, Hefei (China). State Key Lab. of Particle Detection and Electronics
Publication Date:
Research Org.:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Org.:
USDOE Office of Science (SC), High Energy Physics (HEP) (SC-25)
OSTI Identifier:
1361249
Report Number(s):
BNL-113872-2017-JA
Journal ID: ISSN 1748-0221; R&D Project: PO 024; KA2501032
Grant/Contract Number:
SC0012704
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
Journal of Instrumentation
Additional Journal Information:
Journal Volume: 12; Journal Issue: 01; Journal ID: ISSN 1748-0221
Publisher:
Institute of Physics (IOP)
Country of Publication:
United States
Language:
English
Subject:
72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS; 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; 43 PARTICLE ACCELERATORS; HV-CMOS pixel detector; Beam Test; ATLAS ITk Upgrade

Citation Formats

Liu, H., Benoit, M., Chen, H., Chen, K., Bello, F. A. Di, Iacobucci, G., Lanni, F., Peric, I., Ristic, B., Pinto, M. Vicente Barreto, Wu, W., Xu, L., and Jin, G. Development of a modular test system for the silicon sensor R&D of the ATLAS Upgrade. United States: N. p., 2017. Web. doi:10.1088/1748-0221/12/01/P01008.
Liu, H., Benoit, M., Chen, H., Chen, K., Bello, F. A. Di, Iacobucci, G., Lanni, F., Peric, I., Ristic, B., Pinto, M. Vicente Barreto, Wu, W., Xu, L., & Jin, G. Development of a modular test system for the silicon sensor R&D of the ATLAS Upgrade. United States. doi:10.1088/1748-0221/12/01/P01008.
Liu, H., Benoit, M., Chen, H., Chen, K., Bello, F. A. Di, Iacobucci, G., Lanni, F., Peric, I., Ristic, B., Pinto, M. Vicente Barreto, Wu, W., Xu, L., and Jin, G. Wed . "Development of a modular test system for the silicon sensor R&D of the ATLAS Upgrade". United States. doi:10.1088/1748-0221/12/01/P01008. https://www.osti.gov/servlets/purl/1361249.
@article{osti_1361249,
title = {Development of a modular test system for the silicon sensor R&D of the ATLAS Upgrade},
author = {Liu, H. and Benoit, M. and Chen, H. and Chen, K. and Bello, F. A. Di and Iacobucci, G. and Lanni, F. and Peric, I. and Ristic, B. and Pinto, M. Vicente Barreto and Wu, W. and Xu, L. and Jin, G.},
abstractNote = {High Voltage CMOS sensors are a promising technology for tracking detectors in collider experiments. Extensive R&D studies are being carried out by the ATLAS Collaboration for a possible use of HV-CMOS in the High Luminosity LHC upgrade of the Inner Tracker detector. CaRIBOu (Control and Readout Itk BOard) is a modular test system developed to test Silicon based detectors. It currently includes five custom designed boards, a Xilinx ZC706 development board, FELIX (Front-End LInk eXchange) PCIe card and a host computer. A software program has been developed in Python to control the CaRIBOu hardware. CaRIBOu has been used in the testbeam of the HV-CMOS sensor AMS180v4 at CERN. Preliminary results have shown that the test system is very versatile. In conclusion, further development is ongoing to adapt to different sensors, and to make it available to various lab test stands.},
doi = {10.1088/1748-0221/12/01/P01008},
journal = {Journal of Instrumentation},
number = 01,
volume = 12,
place = {United States},
year = {Wed Jan 11 00:00:00 EST 2017},
month = {Wed Jan 11 00:00:00 EST 2017}
}

Journal Article:
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  • Radiation-tolerant, high speed, high density and low power commercial off-the-shelf (COTS) analog-to-digital converters (ADCs) are planned to be used in the upgrade to the Liquid Argon (LAr) calorimeter front end (FE) trigger readout electronics. Total ionization dose (TID) and single event effect (SEE) are two important radiation effects which need to be characterized on COTS ADCs. In our initial TID test, Texas Instruments (TI) ADS5272 was identified to be the top performer after screening a total 17 COTS ADCs from different manufacturers with dynamic range and sampling rate meeting the requirements of the FE electronics. Another interesting feature of ADS5272more » is its 6.5 clock cycles latency, which is the shortest among the 17 candidates. Based on the TID performance, we have designed a SEE evaluation system for ADS5272, which allows us to further assess its radiation tolerance. In this paper, we present a detailed design of ADS5272 SEE evaluation system and show the effectiveness of this system while evaluating ADS5272 SEE characteristics in multiple irradiation tests. According to TID and SEE test results, ADS5272 was chosen to be implemented in the full-size LAr Trigger Digitizer Board (LTDB) demonstrator, which will be installed on ATLAS calorimeter during the 2014 Long Shutdown 1 (LS1).« less
  • Results on beam tests of 3D silicon pixel sensors aimed at the ATLAS Insertable-B-Layer and High Luminosity LHC (HL-LHC) upgrades are presented. Measurements include charge collection, tracking efficiency and charge sharing between pixel cells, as a function of track incident angle, and were performed with and without a 1.6 T magnetic field oriented as the ATLAS Inner Detector solenoid field. Sensors were bump bonded to the front-end chip currently used in the ATLAS pixel detector. Full 3D sensors, with electrodes penetrating through the entire wafer thickness and active edge, and double-sided 3D sensors with partially overlapping bias and read-out electrodesmore » were tested and showed comparable performance. Full and partial 3D pixel detectors have been tested, with and without a 1.6T magnetic field, in high energy pion beams at the CERN SPS North Area in 2009. Sensors characteristics have been measured as a function of the beam incident angle and compared to a regular planar pixel device. Overall full and partial 3D devices have similar behavior. Magnetic field has no sizeable effect on 3D performances. Due to electrode inefficiency 3D devices exhibit some loss of tracking efficiency for normal incident tracks but recover full efficiency with tilted tracks. As expected due to the electric field configuration 3D sensors have little charge sharing between cells.« less
  • ATLAS LAr calorimeter will undergo its Phase-I upgrade during the long shutdown (LS2) in 2018, and a new LAr Trigger Digitizer Board (LTDB) will be designed and installed. Several commercial-off-the-shelf (COTS) multi-channel high-speed ADCs have been selected as possible backups of the radiation tolerant ADC ASICs for the LTDB. Here, to evaluate the radiation tolerance of these backup commercial ADCs, we developed an ADC radiation tolerance characterization system, which includes the ADC boards, data acquisition (DAQ) board, signal generator, external power supplies and a host computer. The ADC board is custom designed for different ADCs, with ADC drivers and clockmore » distribution circuits integrated on board. The Xilinx ZC706 FPGA development board is used as a DAQ board. The data from the ADC are routed to the FPGA through the FMC (FPGA Mezzanine Card) connector, de-serialized and monitored by the FPGA, and then transmitted to the host computer through the Gigabit Ethernet. A software program has been developed with Python, and all the commands are sent to the DAQ board through Gigabit Ethernet by this program. Two ADC boards have been designed for the ADC, ADS52J90 from Texas Instruments and AD9249 from Analog Devices respectively. TID tests for both ADCs have been performed at BNL, and an SEE test for the ADS52J90 has been performed at Massachusetts General Hospital (MGH). Test results have been analyzed and presented. The test results demonstrate that this test system is very versatile, and works well for the radiation tolerance characterization of commercial multi-channel high-speed ADCs for the upgrade of the ATLAS LAr calorimeter. It is applicable to other collider physics experiments where radiation tolerance is required as well.« less