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Title: Leveraging accelerated testing of LED drivers to model the reliability of two-stage and multi-channel drivers

Abstract

The next wave of LED lighting technology is likely to be tunable white lighting (TWL) devices which can adjust the colour of the emitted light between warm white (~ 2700 K) and cool white (~ 6500 K). This type of lighting system uses LED assemblies of two or more colours each controlled by separate driver channels that independently adjust the current levels to achieve the desired lighting colour. Drivers used in TWL devices are inherently more complex than those found in simple SSL devices, due to the number of electrical components in the driver required to achieve this level of control. The reliability of such lighting systems can only be studied using accelerated stress tests (AST) that accelerate the aging process to time frames that can be accommodated in laboratory testing. This paper describes AST methods and findings developed from AST data that provide insights into the lifetime of the main components of one-channel and multi-channel LED devices. The use of AST protocols to confirm product reliability is necessary to ensure that the technology can meet the performance and lifetime requirements of the intended application.

Authors:
; ; ; ;
Publication Date:
Research Org.:
RTI International
Sponsoring Org.:
USDOE
OSTI Identifier:
1358545
DOE Contract Number:  
EE0007081
Resource Type:
Conference
Resource Relation:
Conference: The Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITHERM 2017), Orlando, Florida, USA May 30 - June 2, 2017
Country of Publication:
United States
Language:
English

Citation Formats

Davis, Lynn, Perkins, Curtis, Smith, Aaron, Clark, Terry, and Mills, Karmann. Leveraging accelerated testing of LED drivers to model the reliability of two-stage and multi-channel drivers. United States: N. p., 2017. Web.
Davis, Lynn, Perkins, Curtis, Smith, Aaron, Clark, Terry, & Mills, Karmann. Leveraging accelerated testing of LED drivers to model the reliability of two-stage and multi-channel drivers. United States.
Davis, Lynn, Perkins, Curtis, Smith, Aaron, Clark, Terry, and Mills, Karmann. Tue . "Leveraging accelerated testing of LED drivers to model the reliability of two-stage and multi-channel drivers". United States. doi:. https://www.osti.gov/servlets/purl/1358545.
@article{osti_1358545,
title = {Leveraging accelerated testing of LED drivers to model the reliability of two-stage and multi-channel drivers},
author = {Davis, Lynn and Perkins, Curtis and Smith, Aaron and Clark, Terry and Mills, Karmann},
abstractNote = {The next wave of LED lighting technology is likely to be tunable white lighting (TWL) devices which can adjust the colour of the emitted light between warm white (~ 2700 K) and cool white (~ 6500 K). This type of lighting system uses LED assemblies of two or more colours each controlled by separate driver channels that independently adjust the current levels to achieve the desired lighting colour. Drivers used in TWL devices are inherently more complex than those found in simple SSL devices, due to the number of electrical components in the driver required to achieve this level of control. The reliability of such lighting systems can only be studied using accelerated stress tests (AST) that accelerate the aging process to time frames that can be accommodated in laboratory testing. This paper describes AST methods and findings developed from AST data that provide insights into the lifetime of the main components of one-channel and multi-channel LED devices. The use of AST protocols to confirm product reliability is necessary to ensure that the technology can meet the performance and lifetime requirements of the intended application.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue May 30 00:00:00 EDT 2017},
month = {Tue May 30 00:00:00 EDT 2017}
}

Conference:
Other availability
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