Leveraging accelerated testing of LED drivers to model the reliability of two-stage and multi-channel drivers

Conference · Tue May 30 00:00:00 EDT 2017

OSTI ID:1358545

Davis, Lynn; Perkins, Curtis; Smith, Aaron; Clark, Terry; Mills, Karmann

The next wave of LED lighting technology is likely to be tunable white lighting (TWL) devices which can adjust the colour of the emitted light between warm white (~ 2700 K) and cool white (~ 6500 K). This type of lighting system uses LED assemblies of two or more colours each controlled by separate driver channels that independently adjust the current levels to achieve the desired lighting colour. Drivers used in TWL devices are inherently more complex than those found in simple SSL devices, due to the number of electrical components in the driver required to achieve this level of control. The reliability of such lighting systems can only be studied using accelerated stress tests (AST) that accelerate the aging process to time frames that can be accommodated in laboratory testing. This paper describes AST methods and findings developed from AST data that provide insights into the lifetime of the main components of one-channel and multi-channel LED devices. The use of AST protocols to confirm product reliability is necessary to ensure that the technology can meet the performance and lifetime requirements of the intended application.

• Research Organization: RTI International
• Sponsoring Organization: USDOE
• DOE Contract Number: EE0007081
• OSTI ID: 1358545
• Resource Relation: Conference: The Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITHERM 2017), Orlando, Florida, USA May 30 - June 2, 2017
• Country of Publication: United States
• Language: English