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Title: TOF SIMS Characterization of SEI Layer on Battery Electrodes

Authors:
; ; ; ; ;
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1357553
DOE Contract Number:
AC02-06CH11357
Resource Type:
Conference
Resource Relation:
Conference: 21st Int. Conf. on Ion Beam Analysis, 06/23/13 - 06/28/13, Seattle , WA, US
Country of Publication:
United States
Language:
English

Citation Formats

Veryovkin, Igor V., Tripa, Cornel Emil, Zinovev, Alexander V., Baryshev, Sergey V., Li, Yan, and Abraham, Daniel. TOF SIMS Characterization of SEI Layer on Battery Electrodes. United States: N. p., 2014. Web. doi:10.1016/j.nimb.2014.02.098.
Veryovkin, Igor V., Tripa, Cornel Emil, Zinovev, Alexander V., Baryshev, Sergey V., Li, Yan, & Abraham, Daniel. TOF SIMS Characterization of SEI Layer on Battery Electrodes. United States. doi:10.1016/j.nimb.2014.02.098.
Veryovkin, Igor V., Tripa, Cornel Emil, Zinovev, Alexander V., Baryshev, Sergey V., Li, Yan, and Abraham, Daniel. Fri . "TOF SIMS Characterization of SEI Layer on Battery Electrodes". United States. doi:10.1016/j.nimb.2014.02.098.
@article{osti_1357553,
title = {TOF SIMS Characterization of SEI Layer on Battery Electrodes},
author = {Veryovkin, Igor V. and Tripa, Cornel Emil and Zinovev, Alexander V. and Baryshev, Sergey V. and Li, Yan and Abraham, Daniel},
abstractNote = {},
doi = {10.1016/j.nimb.2014.02.098},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Fri Aug 01 00:00:00 EDT 2014},
month = {Fri Aug 01 00:00:00 EDT 2014}
}

Conference:
Other availability
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