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Title: Bellerophon Environment for Analysis of Materials (BEAM)

Abstract

Improvements in scientific instrumentation allow imaging at mesoscopic to atomic length scales, many spectroscopic modes, and now--with the rise of multimodal acquisition systems and the associated processing capability--the era of multidimensional, informationally dense data sets has arrived. Technical issues in these combinatorial scientific fields are exacerbated by computational challenges best summarized as a necessity for drastic improvement in the capability to transfer, store, and analyze large volumes of data. The Bellerophon Environment for Analysis of Materials (BEAM) platform provides material scientists the capability to directly leverage the integrated computational and analytical power of High Performance Computing (HPC) to perform scalable data analysis and simulation and manage uploaded data files via an intuitive, cross-platform client user interface. This framework delivers authenticated, "push-button" execution of complex user workflows that deploy data analysis algorithms and computational simulations utilizing compute-and-data cloud infrastructures and HPC environments like Titan at the Oak Ridge Leadershp Computing Facility (OLCF).

Authors:
; ;  [1];  [2]
  1. ORISE
  2. University of Knoxville
Publication Date:
Research Org.:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Org.:
USDOE
Contributing Org.:
Eric J. Lingerfelt, Eirik Endeve, Yawei Hui, and Christopher R. Smith
OSTI Identifier:
1357245
Report Number(s):
BEAM; 005283WKSTN00
DOE Contract Number:
AC05-00OR22725
Resource Type:
Software
Software Revision:
00
Software Package Number:
005283
Software CPU:
WKSTN
Open Source:
Yes
Source Code Available:
Yes
Country of Publication:
United States

Citation Formats

Lingerfelt, Eric J, Endeve, Eirik, Hui, Yawei, and Smith, Christopher R. Bellerophon Environment for Analysis of Materials (BEAM). Computer software. https://www.osti.gov//servlets/purl/1357245. Vers. 00. USDOE. 8 Jan. 2017. Web.
Lingerfelt, Eric J, Endeve, Eirik, Hui, Yawei, & Smith, Christopher R. (2017, January 8). Bellerophon Environment for Analysis of Materials (BEAM) (Version 00) [Computer software]. https://www.osti.gov//servlets/purl/1357245.
Lingerfelt, Eric J, Endeve, Eirik, Hui, Yawei, and Smith, Christopher R. Bellerophon Environment for Analysis of Materials (BEAM). Computer software. Version 00. January 8, 2017. https://www.osti.gov//servlets/purl/1357245.
@misc{osti_1357245,
title = {Bellerophon Environment for Analysis of Materials (BEAM), Version 00},
author = {Lingerfelt, Eric J and Endeve, Eirik and Hui, Yawei and Smith, Christopher R},
abstractNote = {Improvements in scientific instrumentation allow imaging at mesoscopic to atomic length scales, many spectroscopic modes, and now--with the rise of multimodal acquisition systems and the associated processing capability--the era of multidimensional, informationally dense data sets has arrived. Technical issues in these combinatorial scientific fields are exacerbated by computational challenges best summarized as a necessity for drastic improvement in the capability to transfer, store, and analyze large volumes of data. The Bellerophon Environment for Analysis of Materials (BEAM) platform provides material scientists the capability to directly leverage the integrated computational and analytical power of High Performance Computing (HPC) to perform scalable data analysis and simulation and manage uploaded data files via an intuitive, cross-platform client user interface. This framework delivers authenticated, "push-button" execution of complex user workflows that deploy data analysis algorithms and computational simulations utilizing compute-and-data cloud infrastructures and HPC environments like Titan at the Oak Ridge Leadershp Computing Facility (OLCF).},
url = {https://www.osti.gov//servlets/purl/1357245},
doi = {},
year = {Sun Jan 08 00:00:00 EST 2017},
month = {Sun Jan 08 00:00:00 EST 2017},
note =
}

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