Measurement of Heavy Ion Irradiation Induced In-Plane Strain in Patterned Face-Centered-Cubic Metal Films: An in Situ Study
Abstract
Nanocrystalline Ag, Cu, and Ni thin films and their coarse grained counterparts are patterned in this paper using focused ion beam and then irradiated by Kr ions within an electron microscope at room temperature. Irradiation induced in-plane strain of the films is measured by tracking the location of nanosized holes. The magnitude of the strain in all specimens is linearly dose-dependent and the strain rates of nanocrystalline metals are significantly greater as compared to that of the coarse grained metals. Finally, real-time microscopic observation suggests that substantial grain boundary migration and grain rotation are responsible for the significant in-plane strain.
- Authors:
-
- China Univ. of Petroleum, Beijing (China). State Key Lab. of Heavy Oil Processing. Dept. of Materials Science and Engineering
- Texas A & M Univ., College Station, TX (United States). Dept. of Materials Science and Engineering; Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
- Texas A & M Univ., College Station, TX (United States). Dept. of Materials Science and Engineering
- Purdue Univ., West Lafayette, IN (United States). School of Materials Engineering. Dept. of Electrical Engineering
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Purdue Univ., West Lafayette, IN (United States). School of Materials Engineering
- Publication Date:
- Research Org.:
- China Univ. of Petroleum, Beijing (China); Purdue Univ., West Lafayette, IN (United States); Argonne National Lab. (ANL), Argonne, IL (United States)
- Sponsoring Org.:
- USDOE Office of Nuclear Energy (NE); National Science Foundation (NSF); Office of Naval Research (ONR) (United States); National Science Foundation of China (NSFC) (China); Start-up Program of China Univ. of Petroleum-Beijing (China)
- Contributing Org.:
- Los Alamos National Lab. (LANL), Los Alamos, NM (United States); Texas A & M Univ., College Station, TX (United States)
- OSTI Identifier:
- 1357133
- Report Number(s):
- LA-UR-17-20801
Journal ID: ISSN 1530-6984
- Grant/Contract Number:
- AC52-06NA25396; DMR-1643915; N00014-16-1-2778; 51501225; 2462014YJRC019; 2462015YQ0602
- Resource Type:
- Journal Article: Accepted Manuscript
- Journal Name:
- Nano Letters
- Additional Journal Information:
- Journal Volume: 16; Journal Issue: 12; Journal ID: ISSN 1530-6984
- Publisher:
- American Chemical Society
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; grain activities; In situ irradiation; in-plane strain; patterned films
Citation Formats
Yu, K. Y., Chen, Y., Li, J., Liu, Y., Wang, H., Kirk, M. A., Li, M., and Zhang, X. Measurement of Heavy Ion Irradiation Induced In-Plane Strain in Patterned Face-Centered-Cubic Metal Films: An in Situ Study. United States: N. p., 2016.
Web. doi:10.1021/acs.nanolett.6b03195.
Yu, K. Y., Chen, Y., Li, J., Liu, Y., Wang, H., Kirk, M. A., Li, M., & Zhang, X. Measurement of Heavy Ion Irradiation Induced In-Plane Strain in Patterned Face-Centered-Cubic Metal Films: An in Situ Study. United States. https://doi.org/10.1021/acs.nanolett.6b03195
Yu, K. Y., Chen, Y., Li, J., Liu, Y., Wang, H., Kirk, M. A., Li, M., and Zhang, X. Mon .
"Measurement of Heavy Ion Irradiation Induced In-Plane Strain in Patterned Face-Centered-Cubic Metal Films: An in Situ Study". United States. https://doi.org/10.1021/acs.nanolett.6b03195. https://www.osti.gov/servlets/purl/1357133.
@article{osti_1357133,
title = {Measurement of Heavy Ion Irradiation Induced In-Plane Strain in Patterned Face-Centered-Cubic Metal Films: An in Situ Study},
author = {Yu, K. Y. and Chen, Y. and Li, J. and Liu, Y. and Wang, H. and Kirk, M. A. and Li, M. and Zhang, X.},
abstractNote = {Nanocrystalline Ag, Cu, and Ni thin films and their coarse grained counterparts are patterned in this paper using focused ion beam and then irradiated by Kr ions within an electron microscope at room temperature. Irradiation induced in-plane strain of the films is measured by tracking the location of nanosized holes. The magnitude of the strain in all specimens is linearly dose-dependent and the strain rates of nanocrystalline metals are significantly greater as compared to that of the coarse grained metals. Finally, real-time microscopic observation suggests that substantial grain boundary migration and grain rotation are responsible for the significant in-plane strain.},
doi = {10.1021/acs.nanolett.6b03195},
url = {https://www.osti.gov/biblio/1357133},
journal = {Nano Letters},
issn = {1530-6984},
number = 12,
volume = 16,
place = {United States},
year = {2016},
month = {11}
}
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- Yu, K. Y.; Fan, C.; Chen, Y.
- JOM, Vol. 72, Issue 1
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