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Title: Spin Seebeck devices using local on-chip heating

Abstract

A micro-patterned spin Seebeck device is fabricated using an on-chip heater. Current is driven through a Au heater layer electrically isolated from a bilayer consisting of Fe3O4 (insulating ferrimagnet) and a spin detector layer. It is shown that through this method it is possible to measure the longitudinal spin Seebeck effect (SSE) for small area magnetic devices, equivalent to traditional macroscopic SSE experiments. Using a lock-in detection technique, it is possible to more sensitively characterize both the SSE and the anomalous Nernst effect (ANE), as well as the inverse spin Hall effect in various spin detector materials. By using the spin detector layer as a thermometer, we can obtain a value for the temperature gradient across the device. These results are well matched to values obtained through electromagnetic/thermal modeling of the device structure and with large area spin Seebeck measurements.

Authors:
; ; ; ;
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science - Office of Basic Energy Sciences - Materials Sciences and Engineering Division
OSTI Identifier:
1356981
DOE Contract Number:  
AC02-06CH11357
Resource Type:
Journal Article
Journal Name:
Journal of Applied Physics
Additional Journal Information:
Journal Volume: 117; Journal Issue: 17; Journal ID: ISSN 0021-8979
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English

Citation Formats

Wu, Stephen M., Fradin, Frank Y., Hoffman, Jason, Hoffmann, Axel, and Bhattacharya, Anand. Spin Seebeck devices using local on-chip heating. United States: N. p., 2015. Web. doi:10.1063/1.4916188.
Wu, Stephen M., Fradin, Frank Y., Hoffman, Jason, Hoffmann, Axel, & Bhattacharya, Anand. Spin Seebeck devices using local on-chip heating. United States. doi:10.1063/1.4916188.
Wu, Stephen M., Fradin, Frank Y., Hoffman, Jason, Hoffmann, Axel, and Bhattacharya, Anand. Thu . "Spin Seebeck devices using local on-chip heating". United States. doi:10.1063/1.4916188.
@article{osti_1356981,
title = {Spin Seebeck devices using local on-chip heating},
author = {Wu, Stephen M. and Fradin, Frank Y. and Hoffman, Jason and Hoffmann, Axel and Bhattacharya, Anand},
abstractNote = {A micro-patterned spin Seebeck device is fabricated using an on-chip heater. Current is driven through a Au heater layer electrically isolated from a bilayer consisting of Fe3O4 (insulating ferrimagnet) and a spin detector layer. It is shown that through this method it is possible to measure the longitudinal spin Seebeck effect (SSE) for small area magnetic devices, equivalent to traditional macroscopic SSE experiments. Using a lock-in detection technique, it is possible to more sensitively characterize both the SSE and the anomalous Nernst effect (ANE), as well as the inverse spin Hall effect in various spin detector materials. By using the spin detector layer as a thermometer, we can obtain a value for the temperature gradient across the device. These results are well matched to values obtained through electromagnetic/thermal modeling of the device structure and with large area spin Seebeck measurements.},
doi = {10.1063/1.4916188},
journal = {Journal of Applied Physics},
issn = {0021-8979},
number = 17,
volume = 117,
place = {United States},
year = {2015},
month = {5}
}