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Title: Domain behavior in functional materials studied using Lorentz microscopy

Authors:
; ; ; ; ; ; ; ;
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science - Office of Basic Energy Sciences - Materials Sciences and Engineering Division
OSTI Identifier:
1356843
DOE Contract Number:
AC02-06CH11357
Resource Type:
Conference
Resource Relation:
Journal Volume: 22; Journal Issue: S3; Conference: 2016 Microscopy and Microanalysis Meeting, 07/24/16 - 07/28/16, Columbus, OH, US
Country of Publication:
United States
Language:
English

Citation Formats

Phatak, C., Zhang, S., Jiang, W., te Velthuis, S. G. E., Hoffmann, A., Mitchell, J. F., Zheng, H., Norman, M. R., and Petford-Long, A. Domain behavior in functional materials studied using Lorentz microscopy. United States: N. p., 2016. Web. doi:10.1017/S1431927616009247.
Phatak, C., Zhang, S., Jiang, W., te Velthuis, S. G. E., Hoffmann, A., Mitchell, J. F., Zheng, H., Norman, M. R., & Petford-Long, A. Domain behavior in functional materials studied using Lorentz microscopy. United States. doi:10.1017/S1431927616009247.
Phatak, C., Zhang, S., Jiang, W., te Velthuis, S. G. E., Hoffmann, A., Mitchell, J. F., Zheng, H., Norman, M. R., and Petford-Long, A. 2016. "Domain behavior in functional materials studied using Lorentz microscopy". United States. doi:10.1017/S1431927616009247. https://www.osti.gov/servlets/purl/1356843.
@article{osti_1356843,
title = {Domain behavior in functional materials studied using Lorentz microscopy},
author = {Phatak, C. and Zhang, S. and Jiang, W. and te Velthuis, S. G. E. and Hoffmann, A. and Mitchell, J. F. and Zheng, H. and Norman, M. R. and Petford-Long, A.},
abstractNote = {},
doi = {10.1017/S1431927616009247},
journal = {},
number = S3,
volume = 22,
place = {United States},
year = 2016,
month = 7
}

Conference:
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  • Domains written thermomagnetically under recording conditions in rare-earth transition-metal thin films are studied with Lorentz microscopy. New technique in which the magneto-optical layer is deposited on specially prepared silicon wafer disks, provided with Si/sub 3/N/sub 4/ windows is described. This technique allows direct observation of the written domain patterns in the electron microscope. It is demonstrated that the nucleation process plays a crucial role when writing in TbFeCo. Different compositions, having different temperature dependencies of the magnetic properties, lead to remarkably different domain-formation behaviour. With the detailed insight into the shape and structure of domains obtained by Lorentz microscopy, carriermore » and noise levels obtained from recording experiments can be understood. This is demonstrated with data on GdTbFe. It is shown that magnetic-field modulation, apart from the advantage of direct overwrite, offers the possibility of very high density recording.« less
  • Controlling domain wall chirality is increasingly seen in non-centrosymmetric materials. Mapping chiral magnetic domains requires knowledge about all the vector components of the magnetization, which poses a problem for conventional Lorentz transmission electron microscopy (LTEM) that is only sensitive to magnetic fields perpendicular to the electron beams direction of travel. The standard approach in LTEM for determining the third component of the magnetization is to tilt the sample to some angle and record a second image. Furthermore, this presents a problem for any domain structures that are stabilized by an applied external magnetic field (e.g. skyrmions), because the standard LTEMmore » setup does not allow independent control of the angle of an applied magnetic field, and sample tilt angle. Here we show that applying a modified transport of intensity equation analysis to LTEM images collected during an applied field sweep, we can determine the domain wall chirality of labyrinth domains in a perpendicularly magnetized material, avoiding the need to tilt the sample.« less
  • Controlling domain wall chirality is increasingly seen in non-centrosymmetric materials. Mapping chiral magnetic domains requires knowledge about all the vector components of the magnetization, which poses a problem for conventional Lorentz transmission electron microscopy (LTEM) that is only sensitive to magnetic fields perpendicular to the electron beams direction of travel. The standard approach in LTEM for determining the third component of the magnetization is to tilt the sample to some angle and record a second image. Furthermore, this presents a problem for any domain structures that are stabilized by an applied external magnetic field (e.g. skyrmions), because the standard LTEMmore » setup does not allow independent control of the angle of an applied magnetic field, and sample tilt angle. Here we show that applying a modified transport of intensity equation analysis to LTEM images collected during an applied field sweep, we can determine the domain wall chirality of labyrinth domains in a perpendicularly magnetized material, avoiding the need to tilt the sample.« less