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Title: Domain behavior in functional materials studied using Lorentz microscopy

Authors:
; ; ; ; ; ; ; ;
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science - Office of Basic Energy Sciences - Materials Sciences and Engineering Division
OSTI Identifier:
1356843
DOE Contract Number:
AC02-06CH11357
Resource Type:
Conference
Resource Relation:
Journal Volume: 22; Journal Issue: S3; Conference: 2016 Microscopy and Microanalysis Meeting, 07/24/16 - 07/28/16, Columbus, OH, US
Country of Publication:
United States
Language:
English

Citation Formats

Phatak, C., Zhang, S., Jiang, W., te Velthuis, S. G. E., Hoffmann, A., Mitchell, J. F., Zheng, H., Norman, M. R., and Petford-Long, A. Domain behavior in functional materials studied using Lorentz microscopy. United States: N. p., 2016. Web. doi:10.1017/S1431927616009247.
Phatak, C., Zhang, S., Jiang, W., te Velthuis, S. G. E., Hoffmann, A., Mitchell, J. F., Zheng, H., Norman, M. R., & Petford-Long, A. Domain behavior in functional materials studied using Lorentz microscopy. United States. doi:10.1017/S1431927616009247.
Phatak, C., Zhang, S., Jiang, W., te Velthuis, S. G. E., Hoffmann, A., Mitchell, J. F., Zheng, H., Norman, M. R., and Petford-Long, A. Sun . "Domain behavior in functional materials studied using Lorentz microscopy". United States. doi:10.1017/S1431927616009247. https://www.osti.gov/servlets/purl/1356843.
@article{osti_1356843,
title = {Domain behavior in functional materials studied using Lorentz microscopy},
author = {Phatak, C. and Zhang, S. and Jiang, W. and te Velthuis, S. G. E. and Hoffmann, A. and Mitchell, J. F. and Zheng, H. and Norman, M. R. and Petford-Long, A.},
abstractNote = {},
doi = {10.1017/S1431927616009247},
journal = {},
number = S3,
volume = 22,
place = {United States},
year = {Sun Jul 24 00:00:00 EDT 2016},
month = {Sun Jul 24 00:00:00 EDT 2016}
}

Conference:
Other availability
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