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Title: Luminescence imaging systems and methods for evaluating photovoltaic devices

Patent ·
OSTI ID:1354783

The present disclosure relates to optical methods and systems for detecting defects in photovoltaic (PV) devices such as PV cells, PV panels, PV modules, and PV arrays.

Research Organization:
National Renewable Energy Laboratory (NREL), Golden, CO (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC36-08G028308
Assignee:
Alliance for Sustainable Energy, LLC
Patent Number(s):
9,641,125
Application Number:
15/002,628
OSTI ID:
1354783
Resource Relation:
Patent File Date: 2016 Jan 21
Country of Publication:
United States
Language:
English

References (9)

Measuring Method And Device For Characterizing A Semiconductor Component patent-application January 2011
Quantitative Series Resistance Imaging Of Photovoltaic Cells patent-application February 2014
Separation of Doping Density and Minority Carrier Lifetime in Photoluminescence Measurements on Semiconductor Materials patent-application March 2016
Investigation of silicon heterojunction solar cells by photoluminescence under DC-bias journal January 2013
Non-contact Determination of Local Efficiency of mc-Si Solar Cells Using Quantitative Lock-In Thermographic and Carrierographic (Photoluminescence) Imaging journal November 2014
2D network simulation and luminescence characterization of Cu(In,Ga)Se2 thin film modules: 2D network simulation and luminescence characterization
  • Ott, Thomas; Runai, Francillina Robert; Schwäble, Fabian
  • Progress in Photovoltaics: Research and Applications, Vol. 20, Issue 5, p. 600-605 https://doi.org/10.1002/pip.2171
journal March 2012
Luminescence radiation spectroscopy of silicon solar cells conference September 2013
Contactless Qualitative Series Resistance Imaging on Solar Cells journal April 2012
Non-destructive techniques for quality control of PV modules: Infrared thermography, electro- and photoluminescence imaging conference November 2013

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